Since I see 12 students enrolled in F8542 Experimentální metody a speciální

praktikum A 2, please, confirm who really will need to do the measurement and,

therefore, will come on Tuesday. It's clear that Pekař, Procházka, Studnička,

Tesař don't need a new measurement because they measured it the last school

year. Shall I really expect 8 students coming?


thermal SiO2

-        reflectance in UV/VIS


fit of R by own program expecting normal incidence and k=0


organosilicon plasma polymer

-        reflectance in UV/VIS

-        transmittance in IR


fit of R by own program expecting normal incidence and

a) k=0 or

b) exponential form of k, i.e. k=c*exp(-d*lambda)

Comparison of results a) and b)

c) assignment of peaks in IR range


diamond like carbon (DLC)

-        reflectance in UV/VIS

-        ellipsometry

-        transmittance in IR


a) fit of R by own program expecting normal incidence and exponential form of k, i.e.
k=c*exp(-d*lambda)

b) calculation of complex dielectric function from ellipsomteric measurement assuming semiinfinite
sample

c) fit of R and ellips together by program newAD using dispersion formula based on parametrization
od density of states

d) assignment of peaks in IR range



TiC films prepared by magnetron sputtering

-        ellipsometry


calculation of complex dielectric function from ellipsomteric measurement assuming semiinfinite
sample