Prof. Marie-Christine Record

(University Paul-Cezanne, Aix-Marseille III):


Reactive phase formation in thin films.




The diffusion couples of interest will be chosen among metal/metal or metal/silicon systems to
reveal the quality of thin films formation in the systems Al-Cu, Pt-Si, Mo-Si and W-Si.

Samples for the study were prepared by sputtering technique and analysed by in situ X-ray
diffraction analysis, DSC measurement and electrical resistivity measurement to answer questions
concerning to composition of phases, their structure and microstructure and kinetics of their
formation.



Termín a místo konání:


Čtvrtek, 15.4.2010, 16.30 hod.

Aula MU, Vinařská ul.