ALD Precursors, Precursor Design, Chemistry and Mechanisms D. J. H. Emslie ALD/ALE Tutorial, Denver, Colorado July 15, 2017 Emslie Group in June 2017, McMaster Univ., Hamilton, ON, Canada • ALD versus CVD from Chemistry and Film-Deposition Perspectives • Overview – H2O, H2S, NH3, O2/O3, H2, H2/NH3 etc. • Precursor design – stability, volatility, m.p., reactivity, evaluation • Unique Examples of Element ALD: • Introduction to Cu ALD • Cu ALD using ZnEt2 as the co-reactant (inc. solution studies) • Early Transition Metal ALD • WF6 + Si2H6 (vs TaF5) • TiCl4 + 1,4-disilyl-substituted 2,5-cyclohexadiene or 1,4-dihydropyrazine co-reagents • ML2 + BH3(NHMe2) [M = Cr, and possibly Mn] • MnR2 + H2 (organometallic precursors) • Summary / Conclusions OUTLINE 2 CVD pulsed- CVD ALD Chemistry Perspective: Thin Film Deposition Perspective: p-CVD and ALD are similar since they utilize a precursor and a co-reactant – this offers more reactivity possibilities Basic CVD is distinct in that it involves just 1 precursor ALD is distinct in that it achieves self-limiting growth and more conformal and uniform deposition CVD and p-CVD are similar in that they do not allow for self-limiting growth or highly conformal and uniform deposition (not to the extent possible with ALD) CVD vs ALD from different perspectives 3 ALD OVERVIEW – ACCESS TO DIFFERENT MATERIALS Co-reactants typically determine the type of thin film deposited (oxide, nitride etc). Precursors are designed to exhibit the desired reactivity with a particular co-reactant. Many Common precursors are halide, alkyl, Cp, amido, alkoxide, aminoalkoxide, acac, b-diketiminate, amidinate complexes. ALD Precursor (containing metal in desired film) Py(HF)x or TiF4 or TaF5 H2O, O2 or O3 H2S H2Se or H2Te (toxic!!) or E(SiMe3)2 (with MClx) NH3, or RNH2H2 or O2 or O3 (noble metals only) Metal Sulfide Metal Selenide Metal Telluride Elemental Metal Metal Nitride Metal Fluoride Metal Oxide 4 WHY NEW ALD PRECURSORS AND REACTIVITIES ? Avoidance of CoReactants which Alter Chemistry of Underlying Substrate New ALD Precursors, Reactivities, Methods Materials Currently Inaccessible by ALD (in general, or on required substrate materials) Higher GPC, or More Desirable Morphology ALD of Higher Purity Films More volatile precursors, or alternative reactivities Larger ALD Temperature Window (ideally with approx. constant GPC) ALD at Lower Temperature More reactive, volatile and thermally robust precursors Less Potential for undesirable reactivity (so long as reaction byproducts are still efficiently removed from the growing film) Avoidance of Metal Film Agglomeration More reactive coreactants may allow use of less thermally robust precursors (with volatility / reactivity advantages – e.g. fluorinated precursors, or more reactive co- reactants) New precursors / reactivity New reactivity (often relying upon new co-reactants) Compatible with a Broader Range of Substrates 5 PRECURSOR DESIGN CONSIDERATIONS Precursor Attributes Additional Comments Comments on Evaluation Volatile Ideally deliverable at low T (low molecular weight, alkyl or silyl > aryl, fluorination, sometimes less symmetrical compounds). Sublimation/Distillation Temp (or measurement of vapor pressure vs temp.). Thermally Stable Long timescale --- Thermally stable for months at delivery temperature. Short timescale – no CVD until high temp. Heating at delivery temp for 24h. TGA (thermogravimetric anal.), ideally at atm. and low pressure. Reactive Reacts with co-reactant at low T (with wide temp. window in which desired reactivity is observed, ideally with fairly constant GPC vs T). Literature and solution reactivity can serve as a guide. In-reactor studies essential. Reacts with co-reactant to form volatile and thermally robust products Reaction by-products must be readily removed from the growing thin film. Expected byproducts can be prepared. Alternatively, do ALD and assess film purity. Low melting point (ideally) Ideally, precursor will be liquid at the delivery temp (much less important for ALD vs CVD). Longer alkyl (e.g. n-Bu, i-Bu) groups can help, but sometimes at the expense of volatility… --- Reactivity allowing ALD of multiple materials ? One precursor for ALD of multiple materials could be beneficial. --- No rapid exothermic decomp. upon heating --- Exercise caution with certain classes of compound. TGA. Scaleable synthesis Synthesis can often be improved if initial ALD performance is promising. --- 6 Thermal ALD of Copper CuII precursors with: • H2 (≥ 150 oC) • ROH (300 oC) • HCO2H, then N2H4 (100-170 oC) • BH3(NHMe2) (130-160 oC) CuI precursors with: • Zn metal (>400 oC; impure films) • H2O, then H2 (375-475 oC). The above methods require the use of anhydrous hydrazine or operate at temperatures ≥ 130 oC, and in the case of very thin films, this can lead to agglomeration. At outset of our work in this area, we asked: Can ZnEt2 be used as a co-reactant for Cu ALD (by introducing Et groups onto Cu, resulting in unstable Cu alkyl species) ? Methods for Thermal Cu ALD: Emslie, D. J. H.; Chadha P.; J. S. Price, Metal ALD and pulsed-CVD: Fundamental reactions and links with solution chemistry, Coord. Chem. Rev., 2013, 257, 3282-3296. Knisley, T. J.; Kalutarage, L. C.; Winter, C. H., Precursors and chemistry for the ALD of metallic first row transition metal films, Coord. Chem. Rev., 2013, 257, 3222-3231. Kalutarage, L. C.; Clendenning, S. B.; Winter, C. H., LowTemperature Atomic Layer Deposition of Copper Films Using Borane Dimethylamine as the Reducing Co-reagent, Chem. Mater. 2014, 26, 3731−3738. 7 PROPOSED REACTION SCHEME Stepwise reduction: Copper(I) Copper(II) Copper Metal The key to each reduction step = Formation of highly unstable alkyl copper complexes 8 Temp 5 eq. 25 °C Very pale yellow soln 50 °C Pale pink soln 75 °C Cu mirror with reddish pink soln 100 °C Cu mirror with colorless soln 120 °C Cu mirror with colorless soln Screening Reactions – A Typical Reaction Various simple Copper(II) coordination complexes An organo-main group co-reactant with the potential to generate copper alkyl species Order of Reactivity from Solution Screening: ZnEt2 > AlMe3 >> BEt3 9 Temp 5 eq. 25 °C Very pale yellow soln 50 °C Pale pink soln 75 °C Cu mirror with reddish pink soln 100 °C Cu mirror with colorless soln 120 °C Cu mirror with colorless soln Screening Reactions – A Typical Reaction Various simple Copper(II) coordination complexes An organo-main group co-reactant with the potential to generate copper alkyl species Order of Reactivity from Solution Screening: ZnEt2 > AlMe3 >> BEt3 No deposition N Cu N N N Et Et + BEt3 10 Pulsed-CVD of Cu Metal using [Cu(PyrImEt)2] with ZnEt2 at 130 oC N Cu N N N Et Et + ZnEt2 Deposition on SiO2 1500 x [6s DEZ / 7s P / 9s CuL2 / 7s P] Appearance: Metallic Cu Cu Film thickness ~ 470Å GPC ~0.31 Å/cycle Rs: 6.5 Ω/sq; ρ~ 31 Ωcm B. Vidjayacoumar, D. J. H. Emslie, S. B. Clendenning and J. M. Blackwell et al. Chem. Mater., 2010, 22, 4844-4853. Not Self Limiting  pulsed-CVD Dr. Scott B. Clendenning, Intel 11 Pulsed-CVD of Cu Metal using [Cu(PyrImEt)2] with ZnEt2 at 130 oC N Cu N N N Et Et + ZnEt2 Deposition on SiO2 1500 x [6s DEZ / 7s P / 9s CuL2 / 7s P] Appearance: Metallic Cu Cu Film thickness ~ 470Å GPC ~0.31 Å/cycle Rs: 6.5 Ω/sq; ρ~ 31 Ωcm B. Vidjayacoumar, D. J. H. Emslie, S. B. Clendenning and J. M. Blackwell et al. Chem. Mater., 2010, 22, 4844-4853. Not Self Limiting  pulsed-CVD Dr. Scott B. Clendenning, Intel • Zinc incorporation results from Zn CVD, which is significant at > 100 oC 1000 cycles × [1s pulse ZnEt2 / 3s chamber purge] with Cu substrate  Zn CVD 12 Pulsed-CVD of Cu Metal using [Cu(PyrImEt)2] with ZnEt2 at 130 oC N Cu N N N Et Et + ZnEt2 Deposition on SiO2 1500 x [6s DEZ / 7s P / 9s CuL2 / 7s P] Appearance: Metallic Cu Cu Film thickness ~ 470Å GPC ~0.31 Å/cycle Rs: 6.5 Ω/sq; ρ~ 31 Ωcm B. Vidjayacoumar, D. J. H. Emslie, S. B. Clendenning and J. M. Blackwell et al. Chem. Mater., 2010, 22, 4844-4853. Not Self Limiting  pulsed-CVD Dr. Scott B. Clendenning, Intel • Zinc incorporation results from Zn CVD, which is significant at > 100 oC • Minimum delivery temperature for our copper precursor was 120 oC. • With a more volatile copper precursor, Fischer, Sung et al. demonstrated Cu metal ALD using ZnEt2 at 100 oC (Angew. Chem. Int. Ed. 2009, 48, 4536-4539) 1000 cycles × [1s pulse ZnEt2 / 3s chamber purge] with Cu substrate  Zn CVD 13 Pulsed-CVD of Cu Metal using [Cu(PyrImEt)2] with ZnEt2 at 130 oC N Cu N N N Et Et + ZnEt2 Deposition on SiO2 1500 x [6s DEZ / 7s P / 9s CuL2 / 7s P] Appearance: Metallic Cu Cu Film thickness ~ 470Å GPC ~0.31 Å/cycle Rs: 6.5 Ω/sq; ρ~ 31 Ωcm B. Vidjayacoumar, D. J. H. Emslie, S. B. Clendenning and J. M. Blackwell et al. Chem. Mater., 2010, 22, 4844-4853. Not Self Limiting  pulsed-CVD Dr. Scott B. Clendenning, Intel • Zinc incorporation results from Zn CVD, which is significant at > 100 oC • Minimum delivery temperature for our copper precursor was 120 oC. • With a more volatile copper precursor, Fischer, Sung et al. demonstrated Cu metal ALD using ZnEt2 at 100 oC (Angew. Chem. Int. Ed. 2009, 48, 4536-4539) Reproduced with permission from Angew. Chem. Int. Ed. 2009, 48, 4536-4539. SEM XRD 100-120 oC SEM TEM Cu nanotubes formed by deposition into pores in a polycarbonate membrane Cu on Si/SiO2 14 What Can we learn from NMR Spectroscopy? Prepare NMR samples in the glovebox Record NMR Spectra as Reactions Proceed (increasing temperature incrementally if necessary) Low Pressure / Vacuum NMR tube For compounds without any unpaired electrons: 15 x = 0.3 20 oC, 15 min x = 1.0 20 oC, 15 min x = 5.0 20 oC, 1 hour B. Vidjayacoumar, D. J. H. Emslie, J. M. Blackwell and S. B. Clendenning et al. Chem. Mater., 2010, 22, 4854-4866. NMR Spectrum – CuL2 + x ZnEt2 17 NMR Spectrum – CuL2 + x ZnEt2 x = 0.3 20 oC, 15 min x = 1.0 20 oC, 15 min x = 5.0 20 oC, 1 hour All Stable Intermediates / Byproducts Independently Synthesized. Selected X-ray Crystal Structures: B. Vidjayacoumar, D. J. H. Emslie, J. M. Blackwell and S. B. Clendenning et al. Chem. Mater., 2010, 22, 4854-4866. 18 CuL2 + n ZnEt2  Cu metal + byproducts • Multi step mechanism with several different available pathways • Reaction steps identified by observation and synthesis of intermediates and byproducts • n-Butane is the only gas formed during reduction from CuII to CuI. • Ethylene, ethane and hydrogen (not n-butane) are formed during reduction from CuI to Cu0 (copper metal). B. Vidjayacoumar, D. J. H. Emslie, J. M. Blackwell and S. B. Clendenning et al. Chem. Mater., 2010, 22, 4854-4866. 19 SOLUTION Reaction Pathway Stepwise reduction: Copper(II) Copper(I) Copper Metal via unstable alkyl copper complexes Conclusion: The instability of certain metal alkyl complexes (generated in situ) can be exploited for metal deposition, through the use of main group alkyl complexes (e.g. ZnEt2) as co-reactants B. Vidjayacoumar, D. J. H. Emslie, J. M. Blackwell and S. B. Clendenning et al. Chem. Mater., 2010, 22, 4854-4866. 20 1 18 1 1 H 2.20 2 13 14 15 16 17 2 He 2 3 Li 0.98 4 Be 1.57 5 B 2.04 6 C 2.55 7 N 3.04 8 O 3.44 9 F 3.98 10 Ne 3 11 Na 0.93 12 Mg 1.31 3 4 5 6 7 8 9 10 11 12 13 Al 1.61 14 Si 1.90 15 P 2.19 16 S 2.58 17 Cl 3.16 18 Ar 4 19 K 0.82 20 Ca 1.00 21 Sc 1.36 22 Ti 1.54 23 V 1.63 24 Cr 1.66 25 Mn 1.55 26 Fe 1.83 27 Co 1.88 28 Ni 1.91 29 Cu 1.90 30 Zn 1.65 31 Ga 1.81 32 Ge 2.01 33 As 2.18 34 Se 2.55 35 Br 2.96 36 Kr 3.00 5 37 Rb 0.82 38 Sr 0.95 39 Y 1.22 40 Zr 1.33 41 Nb 1.6 42 Mo 2.16 43 Tc 1.9 44 Ru 2.2 45 Rh 2.28 46 Pd 2.20 47 Ag 1.93 48 Cd 1.69 49 In 1.78 50 Sn 1.96 51 Sb 2.05 52 Te 2.1 53 I 2.66 54 Xe 2.60 6 55 Cs 0.79 56 Ba 0.89 71 Lu 1.27 72 Hf 1.3 73 Ta 1.5 74 W 2.36 75 Re 1.9 76 Os 2.2 77 Ir 2.20 78 Pt 2.28 79 Au 2.54 80 Hg 2.00 81 Tl 2.04 82 Pb 2.33 83 Bi 2.02 84 Po 2.0 85 At 2.2 86 Rn 2.2 7 87 Fr 0.7 88 Ra 0.9 103 Lr -- 104 R (257) 105 D (260) 106 S (263) 107 B (262) 108 H (265) 109 M (266) 110 -- () 111 -- () 112 - () 114 -- () 116 - () 118 - () Ln 57 La 1.10 58 Ce 1.12 59 Pr 1.13 60 Nd 1.14 61 Pm -- 62 Sm 1.17 63 Eu -- 64 Gd 1.20 65 Tb -- 66 Dy 1.22 67 Ho 1.23 68 Er 1.24 69 Tm 1.25 70 Yb -- An 89 Ac 1.1 90 Th 1.3 91 Pa 1.5 92 U 1.38 93 Np 1.36 94 Pu 1.28 95 Am 1.3 96 Cm 1.3 97 Bk 1.3 98 Cf 1.3 99 Es 1.3 100 Fm 1.3 101 Md 1.3 102 No 1.3 Thermal ALD of Transition Metals (or pulsed-CVD) Pauling Electronegativity 2.0 – 2.6 1.7 – 2.0 1.5 – 1.7 1.0 – 1.5 0.8 – 1.0 ALD reported ALD with conditions 21 THE CHALLENGE OF EARLY TRANSITION METAL ALD J.W. Klaus, S.J. Ferro, S.M. George, Atomically controlled growth of tungsten and tungsten nitride using sequential surface reactions, Appl. Surf. Sci., 2000, 162–163 479–491. Kalutarage, L. C.; Martin, P. D.; Heeg, M. J.; Winter, C. H., Volatile and Thermally Stable Mid to Late Transition Metal Complexes Containing α-Imino Alkoxide Ligands, a New Strongly Reducing Coreagent, and Thermal Atomic Layer Deposition of Ni, Co, Fe, and Cr Metal Films, J. Am. Chem. Soc. 2013, 135, 12588. Klesko, J. P.; Thrush, C. M.; Winter, C. H., Thermal Atomic Layer Deposition of Titanium Films Using Titanium Tetrachloride and 2-Methyl-1,4-bis(trimethylsilyl)-2,5-cyclohexadiene or 1,4-Bis(trimethylsilyl)-1,4-dihydropyrazine, Chem. Mater. 2016, 28, 700. GPC 0.06 Å/cycle. Rapid oxidation to TiO2 in air, but some Ti metal remains deeper in the film, according to XPS Analogous reaction with TaF5 generated Ta silicide Lemonds, A.M.; White, J.M.; Ekerdt, J.G., Surface science investigations of atomic layer deposition half-reactions using TaF5 and Si2H6, Surf. Sci., 2003, 538, 191. Mn Ti W Cr • Ru substrate • 180-225 oC • GPC 0.07-0.10 Å/cycle 22 THE CHALLENGE OF EARLY TRANSITION METAL ALD J.W. Klaus, S.J. Ferro, S.M. George, Atomically controlled growth of tungsten and tungsten nitride using sequential surface reactions, Appl. Surf. Sci., 2000, 162–163 479–491. Kalutarage, L. C.; Martin, P. D.; Heeg, M. J.; Winter, C. H., Volatile and Thermally Stable Mid to Late Transition Metal Complexes Containing α-Imino Alkoxide Ligands, a New Strongly Reducing Coreagent, and Thermal Atomic Layer Deposition of Ni, Co, Fe, and Cr Metal Films, J. Am. Chem. Soc. 2013, 135, 12588. Klesko, J. P.; Thrush, C. M.; Winter, C. H., Thermal Atomic Layer Deposition of Titanium Films Using Titanium Tetrachloride and 2-Methyl-1,4-bis(trimethylsilyl)-2,5-cyclohexadiene or 1,4-Bis(trimethylsilyl)-1,4-dihydropyrazine, Chem. Mater. 2016, 28, 700. GPC 0.06 A/cycle. Rapid oxidation to TiO2 in air, but some Ti metal remains deeper in the film, according to XPS Analogous reaction with TaF5 generated Ta silicide Lemonds, A.M.; White, J.M.; Ekerdt, J.G., Surface science investigations of atomic layer deposition half-reactions using TaF5 and Si2H6, Surf. Sci., 2003, 538, 191. Mn Ti W Cr • Ru substrate • 180-225 oC • GPC 0.07-0.10 Å/cycle Disilane strips the fluoride ligands off tungsten. Similar reactivity observed for SiH4 and B2H6, but less clean. 23 • Ru substrate • 180-225 oC • GPC 0.07-0.10 Å/cycle THE CHALLENGE OF EARLY TRANSITION METAL ALD J.W. Klaus, S.J. Ferro, S.M. George, Atomically controlled growth of tungsten and tungsten nitride using sequential surface reactions, Appl. Surf. Sci., 2000, 162–163 479–491. Kalutarage, L. C.; Martin, P. D.; Heeg, M. J.; Winter, C. H., Volatile and Thermally Stable Mid to Late Transition Metal Complexes Containing α-Imino Alkoxide Ligands, a New Strongly Reducing Coreagent, and Thermal Atomic Layer Deposition of Ni, Co, Fe, and Cr Metal Films, J. Am. Chem. Soc. 2013, 135, 12588. Klesko, J. P.; Thrush, C. M.; Winter, C. H., Thermal Atomic Layer Deposition of Titanium Films Using Titanium Tetrachloride and 2-Methyl-1,4-bis(trimethylsilyl)-2,5-cyclohexadiene or 1,4-Bis(trimethylsilyl)-1,4-dihydropyrazine, Chem. Mater. 2016, 28, 700. GPC 0.06 A/cycle. Rapid oxidation to TiO2 in air, but some Ti metal remains deeper in the film, according to XPS Analogous reaction with TaF5 generated Ta silicide Lemonds, A.M.; White, J.M.; Ekerdt, J.G., Surface science investigations of atomic layer deposition half-reactions using TaF5 and Si2H6, Surf. Sci., 2003, 538, 191. Mn Ti W Cr Conceptually, the two precursors serve as a more reactive form of a disilane (Me3Si-SiMe3), which strips chloride ligands from titanium. Requires a volatile metal chloride, which is likely to limit translation of methodology to most other early transition metals. 24 THE CHALLENGE OF EARLY TRANSITION METAL ALD J.W. Klaus, S.J. Ferro, S.M. George, Atomically controlled growth of tungsten and tungsten nitride using sequential surface reactions, Appl. Surf. Sci., 2000, 162–163 479–491. Kalutarage, L. C.; Martin, P. D.; Heeg, M. J.; Winter, C. H., Volatile and Thermally Stable Mid to Late Transition Metal Complexes Containing α-Imino Alkoxide Ligands, a New Strongly Reducing Coreagent, and Thermal Atomic Layer Deposition of Ni, Co, Fe, and Cr Metal Films, J. Am. Chem. Soc. 2013, 135, 12588. Klesko, J. P.; Thrush, C. M.; Winter, C. H., Thermal Atomic Layer Deposition of Titanium Films Using Titanium Tetrachloride and 2-Methyl-1,4-bis(trimethylsilyl)-2,5-cyclohexadiene or 1,4-Bis(trimethylsilyl)-1,4-dihydropyrazine, Chem. Mater. 2016, 28, 700. GPC 0.06 A/cycle. Rapid oxidation to TiO2 in air, but some Ti metal remains deeper in the film, according to XPS Analogous reaction with TaF5 generated Ta silicide Lemonds, A.M.; White, J.M.; Ekerdt, J.G., Surface science investigations of atomic layer deposition half-reactions using TaF5 and Si2H6, Surf. Sci., 2003, 538, 191. Mn Ti W Cr Deposition only observed on a ruthenium substrate after a lengthy surface pre-treatment with BH3(NHMe2). Deposition ceased at a film thickness of ~ 10 nm. For Mn, immediate oxidation of the film upon removal from reactor prevented determination of whether Mn metal or MnO had been deposited. • Ru substrate • 180-225 oC • GPC 0.07-0.10 Å/cycle 25 • Reduction to elemental metal becomes increasingly challenging for more electropositive metals • Electropositive metals have a high tendency to form oxides, nitrides and halides, making many coordination complexes poorly suited for electropositive metal ALD An Alternative Approach: Organometallic Precursors for Electropositive Metal ALD ? How will the necessary thermal stability be achieved without compromising: (a) volatility and (b) reactivity? Can highly reactive organometallic precursors (acyclic hydrocarbyl complexes, rather than cyclopentadienyl complexes) be used for electropositive metal ALD? Metal-organic Complexes More Reactive Less Reactive Organometallic Complexes Contain a metal and organic ligands Contain direct M-C (or M-Si, or M-H) bonds 26 • Reduction to elemental metal becomes increasingly challenging for more electropositive metals • Electropositive metals have a high tendency to form oxides, nitrides and halides, making many coordination complexes poorly suited for electropositive metal ALD How will the necessary thermal stability be achieved without compromising: (a) volatility and (b) reactivity? Can highly reactive organometallic precursors (acyclic hydrocarbyl complexes, rather than cyclopentadienyl complexes) be used for electropositive metal ALD? An Alternative Approach: Organometallic Precursors for Electropositive Metal ALD ? 27 OVERALL STRATEGY FOR MANGANESE DEPOSITION The metal precursor must be: • Thermally robust & volatile • Reactive towards the desired co-reactant --- for this reason, highly reactive metal alkyl and allyl complexes are the focus of this work Precursors: Alkyl or Allyl Complexes - Free from anionic N-donors - Free from halogens or O-donors Highly Reactive 28 OVERALL STRATEGY FOR MANGANESE DEPOSITION Co-Reactants Selected to form Alkyl / Hydride Intermediate which should be particularly prone to reductive elimination Precursors: Alkyl or Allyl Complexes - Free from anionic N-donors - Free from halogens or O-donors Highly Reactive 29 OVERALL STRATEGY FOR MANGANESE DEPOSITION Co-reactants: • Class 1 co-reactants (H2, PhSiH3, R’2BH) form the alkyl / hydride complex directly • Class 2 co-reactants (BEt3, AlEt3, ZnEt2) initially form an unstable ethyl complex Precursors: Alkyl or Allyl Complexes - Free from anionic N-donors - Free from halogens or O-donors Highly Reactive 30 OVERALL STRATEGY FOR MANGANESE DEPOSITION Co-reactants: • Class 1 co-reactants (H2, PhSiH3, R’2BH) form the alkyl / hydride complex directly • Class 2 co-reactants (BEt3, AlEt3, ZnEt2) initially form an unstable ethyl complex Precursors: Alkyl or Allyl Complexes - Free from anionic N-donors - Free from halogens or O-donors Highly Reactive 31 OVERALL STRATEGY FOR MANGANESE DEPOSITION Co-reactants: • Class 1 co-reactants (H2, PhSiH3, R’2BH) form the alkyl / hydride complex directly • Class 2 co-reactants (BEt3, AlEt3, ZnEt2) initially form an unstable ethyl complex Suitable MnR2 precursors required 32 (1) Primary alkyl complexes - fairly straightforward to prepare - presence of a-hydrogen atoms may render complexes less thermally stable (2) Tertiary alkyl complexes [C(SiR3)3 complexes] - a-hydrogen free, and b-hydrogen free - Complexes expected to exhibit high thermal stability (resistance to carbide formation) (3) Bulky allyl complexes - resistant to common decomposition pathways - allyl complexes often have higher thermal stability than alkyl complexes - allyl complexes are much more reactive than cyclopentadienyl complexes Precursor Design - Oxygen-free alkyl and allyl complexes - All complexes will be highly reactive due to the presence of metal-carbon bonds 33 Bulky alkyl group for high thermal stability Lower symmetry for increased volatility ? Allyl group for increased reactivity and improved synthetic accessibility 3 Tertiary ALKYL and ALLYL Complexes High thermal stability due to steric bulk and absence of a-hydrogens Synthetically inaccessible in gram quantities due to extreme steric bulk 1 Decomp. at ~ 70 oC 2 Insufficient thermal stability for use as an ALD precursor 34 MIXED ALKYL (TSI) / ALLYL (allylTMS2) MANGANESE(II) COMPLEXES 35 MIXED ALKYL (TSI) / ALLYL (allylTMS2) MANGANESE(II) COMPLEXES 36 L = X-Li(THF)3; X= 89% Cl, 11% Br L = PEt3 L = dmap L = quinuclidineL = PMe3L = THF X-Ray Crystal Structures of [(allylTMS2)Mn(TSI)L] Complexes Cl Mn Mn Mn Mn Mn Mn Li O P P N N N Mn–O = 2.170(3) Å Mn–P = 2.617(1) Å Mn–N = 2.163(4) Å Mn–N = 2.258(4) and 2.270(4) Å Sublimes 50-70 oC, 10 mTorr No decomposition after 24h at 100 oC 37 ‘MnR2’ dmpe ‘MnR2’ PMe3 dmpedmpm PRIMARY ALKYL MANGANESE(II) COMPLEXES: R = CH2CMe3 [Mn(CH2CMe3)2]4 not quite thermally stable / volatile enough for ALD [Mn(CH2SiMe3)2]x Polymeric (low volatility) J. S. Price, P. Chadha, D. J. H. Emslie, Organometallics, 2016, 35, 168-180. 38 ‘MnR2’ dmpe ‘MnR2’ PMe3 dmpedmpm PRIMARY ALKYL MANGANESE(II) COMPLEXES: R = CH2CMe3 [Mn(CH2CMe3)2]4 not quite thermally stable / volatile enough for ALD [Mn(CH2SiMe3)2]x Polymeric (low volatility) Sublimes 80 oC, 5 mTorr Decomposes over 5-6h at 120 oC Melts and sublimes 60 oC, 5 mTorr Minimal Decomp after 24h at 120 oC J. S. Price, P. Chadha, D. J. H. Emslie, Organometallics, 2016, 35, 168-180. 0.5 Torr 760 Torr weight% 100 80 60 40 20 0 0 50 100 150 200 250 Temp (oC) 39 Solution Reactivity of Primary Alkyl Manganese(II) Complexes with H2 Mn PXRD J. S. Price, P. Chadha, D. J. H. Emslie, Organometallics, 2016, 35, 168-180. ALD using forming gas (5% H2 in N2) • With substrate = 125 oC, a GPC of 0.2 Å / cycle was observed on Ru seed. • The film was nonconductive after airexposure, likely due to complete oxidation… Ru seed Thickness ~ 80 Å (ellipsom), GPC ~ 0.2 Å/cycle 400 x [3s Mn / 5s purge / 2s FG / 15 s purge] 40 Solution Reactivity of Primary Alkyl Manganese(II) Complexes with H2 Mn PXRD ALD using forming gas (5% H2 in N2) • With substrate = 125 oC, a GPC of 0.2 Å / cycle was observed on Ru seed. • The film was nonconductive after airexposure, likely due to complete oxidation… Ru seed Thickness ~ 80 Å (ellipsom), GPC ~ 0.2 Å/cycle 400 x [3s Mn / 5s purge / 2s FG / 15 s purge] MnS ALD using H2S (one precursor for multiple materials) • With substrate = 110 oC, a GPC of 0.3 Å / cycle was observed on Ru seed. • XPS: ~ 1:1 ratio of Mn:S with no P and low C. 5-10% O, presumably due to air exposure… Ru seed Thickness ~ 80 Å (ellipsom), GPC ~ 0.2 Å/cycle 400 x [3s Mn / 5s purge / 2s FG / 15 s purge] Ru seed Thk ~ 390 Å (XSEM) GPC ~ 0.33 Å/cycle 1200x [3s Mn / 8s purge / 3s Mn / 4s purge / 0.4s H2S / 8s purge] 41 ALD Reactor Studies Oven #1 Reactor Heated Bubbler #1 RT bubbler Foreline Argon delivery manifold Substrate heater Sample Stage - Until recently, all ALD studies on our compounds were conducted by collaborators. - We now have a home-built ALD reactor, so further studies on our Mn cpds are on the schedule for this summer... 42 - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors are not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. Summary / Conclusions - High deposition temperature (leading to agglomeration, low film purity, incompatibility with certain substrates, limited selection of precursors with appropriate thermal stability) - Limited ALD temperature window - Very low GPC - Low film purity - Undesirable film morphology - Undesirable substrate selectivity (e.g. no deposition on H-terminated Si) - Undesirable reactivity between the co-reactant and the underlying substrate. 43 - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors are not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors are not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors are not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. - Avoids agglomeration of thin metal films. - Compatible with a broader range of substrates, perhaps including those with polymer patterning. - Leads to more predictable chemistry, potentially generating higher purity films. - Can allow use of less-thermally robust but higher-volatility (and perhaps higher reactivity) precursors and co-reactants. Summary / Conclusions 44 - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. --- The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. --- The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. Summary / Conclusions 45 - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. --- The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. Summary / Conclusions 46 - Many reported ALD processes are far from ideal: - Also, many materials (especially pure elements) simply cannot yet be deposited by thermal ALD. - Consequently, new precursors, co-reactants, reactivities and methods are required. - ALD at lower temperature (may require more reactive precursor/co-reactant combinations and/or more volatile precursors and co-reactants) offers various advantages: - For metal ALD, most new ALD methods leading to ALD of previously inaccessible materials rely upon new co-reactants rather than new metal precursors. - For thermal metal ALD, most precursors not organometallic (some Pt compounds are exceptions). - The Cu chemistry highlights the use of a new type of co-reactant (ZnEt2) for metal ALD. --- The initial focus was not on Cu precursor design. However, limitations in ZnEt2 thermal stability brought the work full circle, where precursor volatility now appears to be the limitation in terms of accessing Cu deposition significantly below 100 oC. --- Solution reactivity studies can provide mechanistic insight. - The Mn chemistry highlights a new approach for electropositive metal ALD: harnessing the high reactivity of manganese alkyl and allyl complexes for Mn metal deposition. - Highly reactive organometallic precursors have the disadvantage of high air-sensitivity. However, they may allow deposition of multiple materials from a single precursor. Summary / Conclusions 47 Questions ? Funding for the Cu and Mn work: through: ACKNOWLEDGEMENTS Bala Preeti Jeffrey Todd Cu Mn Mn Nick Current Majeda Novan Current Current ALD Research in the Group: 48