F6380 X-ray diffraction methods

Faculty of Science
Spring 2005
Extent and Intensity
0/2/0. 2 credit(s). Type of Completion: z (credit).
Teacher(s)
doc. RNDr. Josef Kuběna, CSc. (seminar tutor)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Josef Kuběna, CSc.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The experimental works in X-ray laboratory: 1. Experimental study of the properties double crystal set in (+,+) and (+,-) arrangement. 2. Determinations of the thin layer thicknies from X-ray reflectivity. 3. Determinations of the multilayer period by measurement X-ray reflectivity 4. Diffuse X-ray scattering measurement by position sensitive detector. 5. Study of the properties of X-ray monochromator realised by X-ray mirros.
Language of instruction
Czech
Further Comments
The course is taught once in two years.
The course is taught: every week.
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010.
  • Enrolment Statistics (Spring 2005, recent)
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