PřF:F7850 Topics in electr. microsc. - Course Information

F7850 Selected topics in electron microscopy

Extent and Intensity

2/0/0. 2 credit(s) (plus extra credits for completion). Recommended Type of Completion: z (credit). Other types of completion: zk (examination), k (colloquium).

Teacher(s)

RNDr. Lubomír Tůma (lecturer), Mgr. Filip Münz, PhD. (deputy)
Ing. Tomáš Vystavěl, PhD. (lecturer), doc. RNDr. Petr Mikulík, Ph.D. (deputy)

Guaranteed by

prof. Mgr. Dominik Munzar, Dr.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science

Timetable

Thu 14:00–15:50 Fs1 6/1017

Course Enrolment Limitations

The course is also offered to the students of the fields other than those the course is directly associated with.

fields of study / plans the course is directly associated with

• Condensed Matter Physics (Eng.) (programme PřF, N-FY)
• Condensed Matter Physics (programme PřF, N-FY)
• Plasma Physics (Eng.) (programme PřF, N-FY)
• Plasma Physics (programme PřF, N-FY)
• Physics (programme PřF, N-FY)
• Theoretical Physics and Astrophysics (Eng.) (programme PřF, N-FY)
• Theoretical Physics and Astrophysics (programme PřF, N-FY)
• Theoretical Physics and Astrophysics (programme PřF, N-FY, specialization Astrofyzika)
• Theoretical Physics and Astrophysics (programme PřF, N-FY, specialization Teoretická fyzika)

Course objectives

After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.

Syllabus

• 1. Basics of scanning and transmission electron microscopy
• 2. Applications of electron microscopy
• 3. Electron and ion optics
• 4. Sources of electrons and ions
• 5. Interaction of electrons and ions with solid state matter
• 6. Ssignal detection im electron microscopy
• 7. Vacuum system
• 8. Sample manipulation inside electron microscope
• 9. Sample stages
• 10. Electron microscope as a system
• 11. Contrast of image 1. (SEM)
• 12. Contrast of image 2. (TEM)
• 13. Electron microscope as an analytical lab
• 14. Mopdern trends in electron microscopy
• 15. Practical demonstration

Teaching methods

lectures + hands on lesson

Assessment methods

credits, based on final discussion

Language of instruction

Czech

Further comments (probably available only in Czech)

Study Materials
The course is taught once in two years.
General note: L.

• Enrolment Statistics (Spring 2022, recent)
  
• Permalink: https://is.muni.cz/course/sci/spring2022/F7850