PřF:F8130 Dispersion models 1 - Course Information

F8130 Advanced dispersion models in thin film optics I

Extent and Intensity

2/0/0. 2 credit(s). Type of Completion: z (credit).

Teacher(s)

Mgr. Daniel Franta, Ph.D. (lecturer)

Guaranteed by

Mgr. Daniel Franta, Ph.D.
Department of Plasma Physics and Technology – Physics Section – Faculty of Science
Contact Person: Mgr. Daniel Franta, Ph.D.
Supplier department: Department of Plasma Physics and Technology – Physics Section – Faculty of Science

Prerequisites

It is assumed that student completed basic curse of classical and quantum mechanics. It is appropriate if student completed or just complete the course of condensed matter physics.

Course Enrolment Limitations

The course is offered to students of any study field.

Course objectives

Introduction to modern dispersion models developed on Department of Physical Electronics and used in the software for optical characterization of experimental data acquired in Optical laboratory. The ralation between modern theory of condensed matter and modern optical methods such as ellipsometry and spectrophotometry will be provided. It will be shown that dielectric response can be described not only by classical models.

Learning outcomes

Student should be able to use free newAD2 software for optical characterization of the thin film system.

Syllabus

• 1. Introduction - dielectric response; Kramers-Kronig (KK) relations; suma rule; classical models
• 2. Quantum mechanical description - dielectric response and Fermi golden rule; dipole approximation; Thomas-Reiche-Kuhn (TRK) sum rule
• 3. Basics of dipersion model based on TRK sum rule - splitting of dielectric response to electron and nucleon part versus electronics and phonon parts; real numbers versus effective numbers of particles; quasiparticle description
• 4. Universal dispersion model describing dielectric response of disordered matters
• 5. Dispersion models of crystalline solids
• 6. Broadening procedured utilized in dispersion models of crystalline solids with respect to consevation of sum rule

Literature

recommended literature
• FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Angelo GIGLIA. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. In Gorecki, C; Asundi, AK; Osten, W. Conference on Optical Micro- and Nanometrology VI. 9890th ed. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, 2016, p. "989014-1"-"989014-15", 15 pp. ISBN 978-1-5106-0135-2. Available from: https://dx.doi.org/10.1117/12.2227580. info
• FRANTA, Daniel, David NEČAS and Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia. Applied Optics. 2015, vol. 54, No 31, p. 9108-9112, 12 pp. ISSN 1559-128X. Available from: https://dx.doi.org/10.1364/AO.54.009108. info
• FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Broadening of dielectric response and sum rule conservation. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, November, p. 496-501. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.11.148. URL info
• FRANTA, Daniel, David NEČAS and Lenka ZAJÍČKOVÁ. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models. Thin Solid Films. Oxford: Elsevier Science, 2013, vol. 534, May, p. 432-441. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.01.081. URL info

Teaching methods

Lectures completed by practical examples demonstrated by newAD2 software

Assessment methods

final project - charcterization of thin film using universal dispersion model by newAD2 software

Language of instruction

Czech

Further comments (probably available only in Czech)

Study Materials
The course is taught once in two years.
The course is taught: every week.
General note: L.

Teacher's information

http://physics.muni.cz/~franta/

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