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    2025

    1. Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model
      FRANTA, Daniel, Mihai-George MURESAN, Pavel ONDRAČKA, Beáta HRONCOVÁ and František VIŽĎA. Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model. Optics and Laser Technology. Elsevier Ltd, 2025, vol. 181, February, p. 111916-111933. ISSN 0030-3992. Available from: https://dx.doi.org/10.1016/j.optlastec.2024.111916.
      URL
      English. United Kingdom of Great Britain and Northern Ireland.
      Keywords in English: Optical constants; Terbium gallium garnet; Faraday isolators; Ellipsometry; Spectrophotometry; Density functional theory
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/10/2024 12:54.
      More: https://is.muni.cz/publication/2445447/en

    2024

    1. Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan DVOŘÁK, Vilma BURŠÍKOVÁ and Petr KLAPETEK. Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries. Coatings. MDPI, 2024, vol. 14, No 11, p. 1439-1458. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings14111439.
      URL
      English. Switzerland.
      Keywords in English: ellipsometry; reflectometry; thin films; roughness; optical characterization
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 19/11/2024 12:00.
      More: https://is.muni.cz/publication/2453159/en
    2. Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory
      VOHÁNKA, Jiří, Ivan OHLÍDAL and Petr KLAPETEK. Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory. Optik. Elsevier GmbH, 2024, vol. 317, November 2024, p. 172086-172099. ISSN 0030-4026. Available from: https://dx.doi.org/10.1016/j.ijleo.2024.172086.
      URL
      RIV: Article in a journal. English. Germany.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Roughness; Scalar diffraction theory; Reflectance
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 19/11/2024 11:30.
      More: https://is.muni.cz/publication/2453141/en
    3. Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition
      DVOŘÁK, Jan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition. Heliyon. Elsevier Ltd, 2024, vol. 10, No 5, p. 1-12. ISSN 2405-8440. Available from: https://dx.doi.org/10.1016/j.heliyon.2024.e27246.
      URL
      RIV: Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Dvořák, Jan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Ellipsometry; Reflectometry; Optical characterization; Polymer-like thin films; Plasma polymer; Inhomogeneity
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 11/10/2024 13:56.
      More: https://is.muni.cz/publication/2394537/en
    4. Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model
      FRANTA, Daniel, Beáta HRONCOVÁ, Jan DVOŘÁK, Jiří VOHÁNKA, Pavel FRANTA, Ivan OHLÍDAL, Václav PEKAŘ and David ŠKODA. Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model. Optical Materials. Elsevier, 2024, vol. 157, November, p. 1-14. ISSN 0925-3467. Available from: https://dx.doi.org/10.1016/j.optmat.2024.116133.
      URL
      RIV: Article in a journal. English. Netherlands.
      Franta, Daniel (203 Czech Republic, belonging to the institution) -- Hroncová, Beáta (703 Slovakia, belonging to the institution) -- Dvořák, Jan (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical constants; Ellipsometry; Spectrophotometry; Optical films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/10/2024 12:44.
      More: https://is.muni.cz/publication/2445444/en

    2023

    1. Dispersion models exhibiting natural optical activity: application to tartaric acid solutions
      HRONCOVÁ, Beáta, Daniel FRANTA, Jan DVOŘÁK and David PAVLIŇÁK. Dispersion models exhibiting natural optical activity: application to tartaric acid solutions. Journal of the Optical Society of America B: Optical Physics. Optica Publishing Group, 2023, vol. 40, No 12, p. 3209-3220. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.498720.
      URL
      RIV/00216224:14310/23:00132743 Article in a journal. English. United States of America.
      Hroncová, Beáta (703 Slovakia, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Dvořák, Jan (203 Czech Republic, belonging to the institution)
      Keywords in English: Dispersion models; Optical activity; Spatial dispersion; Tartaric acid; DMSO
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/1/2024 10:47.
      More: https://is.muni.cz/publication/2355417/en
    2. Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems
      FRANTA, Daniel, Jiří VOHÁNKA and Beáta HRONCOVÁ. Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems. Journal of the Optical Society of America B: Optical Physics. Optica Publishing Group, 2023, vol. 40, No 11, p. 2928-2941. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.497572.
      URL
      RIV/00216224:14310/23:00132742 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Hroncová, Beáta (703 Slovakia, belonging to the institution)
      Keywords in English: Dispersion models; Optical activity; Spatial dispersion; Theory of dispersion
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 5/1/2024 10:48.
      More: https://is.muni.cz/publication/2355411/en
    3. FV0343AR – optický prvek s AR pokrytím pro λ = 343 nm, R < 0,2 %, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 pro pulsy 900 fs (FV0343AR – optical element with AR coating for λ = 343nm, R < 0.2%, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 for 900fs pulses)
      BŘEZINA, Jaromír, Václav PEKAŘ, David ŠKODA, Jan VANDA, Mihai-George MURESAN, Priyadarshani NARAYANASAMY, Martin MYDLÁŘ, Ivan OHLÍDAL, Jan DVOŘÁK, Jiří VOHÁNKA, Daniel FRANTA and Pavel FRANTA. FV0343AR – optický prvek s AR pokrytím pro λ = 343 nm, R < 0,2 %, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 pro pulsy 900 fs (FV0343AR – optical element with AR coating for λ = 343nm, R < 0.2%, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 for 900fs pulses). 2023.
      Name (in English): FV0343AR – optical element with AR coating for λ = 343nm, R < 0.2%, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 for 900fs pulses
      Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Keywords in English: e-gun evaporation with plasma assistence; dielectric coating; LIDT - Laser Induced Damage Threshold
      Changed by: Mgr. Jan Dvořák, Ph.D., učo 269541. Changed: 15/4/2024 12:37.
      More: https://is.muni.cz/publication/2394202/en
    4. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory
      ŠULC, Václav, Jiří VOHÁNKA, Ivan OHLÍDAL, Petr KLAPETEK, Miloslav OHLÍDAL, Nupinder Jeet KAUR and František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. Coatings. MDPI, 2023, vol. 13, No 11, p. 1-15. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13111853.
      URL
      RIV/00216224:14310/23:00132741 Article in a journal. English. Switzerland.
      Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: roughness; scalar diffraction theory; angle-resolved scattering
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 21/2/2024 11:03.
      More: https://is.muni.cz/publication/2355407/en
    5. Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model
      FRANTA, Daniel, Jiří VOHÁNKA, Jan DVOŘÁK, Pavel FRANTA, Ivan OHLÍDAL, Petr KLAPETEK, Jaromír BŘEZINA and David ŠKODA. Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model. Coatings. MDPI, 2023, vol. 13, No 2, p. 1-21. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13020218.
      URL
      RIV/00216224:14310/23:00130861 Article in a journal. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Dvořák, Jan (203 Czech Republic, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: gadolinium fluoride; optical constants; dielectric response; ellipsometry; spectrophotometry; refractive index profile; roughness; porosity; heterogeneous data processing
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 21/2/2024 16:12.
      More: https://is.muni.cz/publication/2286924/en
    6. Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates
      DVOŘÁK, Jan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA and Ivan OHLÍDAL. Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates. Coatings. MDPI, 2023, vol. 13, No 5, p. 1-16. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13050873.
      URL
      RIV/00216224:14310/23:00130859 Article in a journal. English. Switzerland.
      Dvořák, Jan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: optical characterization; inhomogeneous thin films; non-absorbing substrates; dual-side measurements; spectroscopic ellipsometry; spectrophotometry; polymer-like thin films; optical properties
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 28/6/2023 13:45.
      More: https://is.muni.cz/publication/2286922/en
    7. Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data
      VOHÁNKA, Jiří, Václav ŠULC, Ivan OHLÍDAL, Miloslav OHLÍDAL and Petr KLAPETEK. Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data. Optik. Elsevier, 2023, vol. 280, June, p. 1-13. ISSN 0030-4026. Available from: https://dx.doi.org/10.1016/j.ijleo.2023.170775.
      URL
      RIV/00216224:14310/23:00131677 Article in a journal. English. Germany.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Roughness; Angle-resolved scattering; Ellipsometry; Power spectral density function; Rayleigh-Rice theory; Scalar diffraction theory
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/2/2024 09:42.
      More: https://is.muni.cz/publication/2310144/en

    2022

    1. Optical characterization of inhomogeneous thin films with randomly rough boundaries
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ, Petr KLAPETEK and Nupinder Jeet KAUR. Optical characterization of inhomogeneous thin films with randomly rough boundaries. Optics Express. Washington, D.C.: Optica Publishing Group, 2022, vol. 30, No 2, p. 2033-2047. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.447146.
      URL
      RIV/00216224:14310/22:00119633 Article in a journal. English. United States of America.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: polymer; thin film; single-crystal substrate; silicon
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 13:34.
      More: https://is.muni.cz/publication/1830997/en
    2. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jan DVOŘÁK, Petr KLAPETEK and Nupinder Jeet KAUR. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies. Optics Express. Optica Publishing Group, 2022, vol. 30, No 21, p. 39068-39085. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.470692.
      URL
      RIV/00216224:14310/22:00127746 Article in a journal. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Dvořák, Jan (203 Czech Republic, belonging to the institution)
      Keywords in English: optical characterization; ellipsometry; spectrophotometry; roughness; Rayleigh–Rice theory; polymer; thin film; single-crystal substrate; silicon
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 22/2/2024 10:04.
      More: https://is.muni.cz/publication/2243981/en
    3. Soubor dělicích vrstev ve specifikaci s parametry prvního děliče Rp = 50 % ± 3 % @248 nm; druhého děliče Rp = <0,4; 0,75> a Rs < 1 % na vlnové délce 248 nm a zvýšenou propustností v oblasti od 630 nm do 670 nm. (Set of beam splitters coating in specification with parameters of the first beam splitter Rp = 50% ± 3% @248 nm; and second beamsplitter Rp = <0.4; 0.75> and Rs < 1 % at a wavelength of 248 nm and increased transmittance in the region from 630 nm to 670)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Jan DVOŘÁK, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Soubor dělicích vrstev ve specifikaci s parametry prvního děliče Rp = 50 % ± 3 % @248 nm; druhého děliče Rp = <0,4; 0,75> a Rs < 1 % na vlnové délce 248 nm a zvýšenou propustností v oblasti od 630 nm do 670 nm. (Set of beam splitters coating in specification with parameters of the first beam splitter Rp = 50% ± 3% @248 nm; and second beamsplitter Rp = <0.4; 0.75> and Rs < 1 % at a wavelength of 248 nm and increased transmittance in the region from 630 nm to 670). 2022.
      Name (in English): Set of beam splitters coating in specification with parameters of the first beam splitter Rp = 50% ± 3% @248 nm; and second beamsplitter Rp = <0.4; 0.75> and Rs < 1 % at a wavelength of 248 nm and increased transmittance in the region from 630 nm to 670

      Keywords in English: DUV Coating, DUV Beam splitter, PARMS technology, Magnetron sputtering
      Changed by: Mgr. Ing. Pavlína Slavíková, učo 243146. Changed: 17/3/2023 07:45.
      More: https://is.muni.cz/publication/2267879/en

    2021

    1. Constitutive equations describing optical activity in theory of dispersion
      FRANTA, Daniel and Jiří VOHÁNKA. Constitutive equations describing optical activity in theory of dispersion. Journal of the Optical Society of America B. Optical Society of America, 2021, vol. 38, No 2, p. 553-561. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.410315.
      URL
      RIV/00216224:14310/21:00121528 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution)
      Keywords in English: Dispersion Theory; Optical Activity; Constitutive equation
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 13:44.
      More: https://is.muni.cz/publication/1765638/en
    2. Higher harmonic frequencies in a capacitively coupled plasma
      DVOŘÁK, Pavel, Radek ŽEMLIČKA, Roman PŘIBYL, Maroš TKÁČIK, Juraj PÁLENIK, Petr VAŠINA, Petr SKOPAL, Zdeněk NAVRÁTIL and Vilma BURŠÍKOVÁ. Higher harmonic frequencies in a capacitively coupled plasma. In 8th Plasma Science & Entrepreneurship Workshop. 2021.
      Name in Czech: Vyšší harmonické frekvence v kapacitně vázaném plazmatu
      Name (in English): Higher harmonic frequencies in a capacitively coupled plasma
      RIV/00216224:14310/21:00119328 Requested lectures. English. Czech Republic.
      Dvořák, Pavel (203 Czech Republic, guarantor, belonging to the institution) -- Žemlička, Radek (203 Czech Republic) -- Přibyl, Roman (203 Czech Republic, belonging to the institution) -- Tkáčik, Maroš (703 Slovakia) -- Pálenik, Juraj (703 Slovakia) -- Vašina, Petr (203 Czech Republic, belonging to the institution) -- Skopal, Petr (203 Czech Republic, belonging to the institution) -- Navrátil, Zdeněk (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: higher harmonic frequencies;plasma;capacitively coupled discharges
      Type of participation: requested lecture
      International impact: yes
      Changed by: doc. Mgr. Pavel Dvořák, Ph.D., učo 16711. Changed: 28/1/2022 13:45.
      More: https://is.muni.cz/publication/1802098/en
    3. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy
      ŠUSTEK, Štěpán, Jiří VOHÁNKA, Ivan OHLÍDAL, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Nupinder Jeet KAUR. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy. Journal of Optics. Bristol: IOP Publishing, 2021, vol. 23, No 10, p. 105602-105615. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8986/ac1f35.
      URL
      RIV/00216224:14310/21:00118706 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Šustek, Štěpán (guarantor) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: angle-resolved scattering; randomly rough surfaces; scalar diffraction theory; Rayleigh-Rice perturbation theory; atomic force microscopy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 14:05.
      More: https://is.muni.cz/publication/1821387/en
    4. On the transition of reaction pathway during microwave plasma gas-phase synthesis of graphene nanosheets: From amorphous to highly crystalline structure
      TOMAN, Jozef, Ondřej JAŠEK, Miroslav ŠNÍRER, David PAVLIŇÁK, Zdeněk NAVRÁTIL, Jana JURMANOVÁ, Stanislav CHUDJÁK, František KRČMA, Vít KUDRLE and Jan MICHALIČKA. On the transition of reaction pathway during microwave plasma gas-phase synthesis of graphene nanosheets: From amorphous to highly crystalline structure. Plasma processes and polymers. Weinheim: Wiley-VCH, 2021, vol. 18, No 8, p. "e2100008", 22 pp. ISSN 1612-8850. Available from: https://dx.doi.org/10.1002/ppap.202100008.
      URL
      RIV/00216224:14310/21:00119049 Article in a journal. English. Germany.
      Toman, Jozef (703 Slovakia, guarantor, belonging to the institution) -- Jašek, Ondřej (203 Czech Republic, belonging to the institution) -- Šnírer, Miroslav (703 Slovakia, belonging to the institution) -- Pavliňák, David (203 Czech Republic, belonging to the institution) -- Navrátil, Zdeněk (203 Czech Republic, belonging to the institution) -- Jurmanová, Jana (203 Czech Republic, belonging to the institution) -- Kudrle, Vít (203 Czech Republic, belonging to the institution)
      Keywords in English: admixture; graphene nanosheets; microwave plasma; nucleation; plasma synthesis
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 13:58.
      More: https://is.muni.cz/publication/1781679/en
    5. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization
      OHLÍDAL, Ivan, Jiří VOHÁNKA and Martin ČERMÁK. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization. Coatings. Basel: MDPI, 2021, vol. 11, No 1, p. 22-52. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings11010022.
      URL
      RIV/00216224:14310/21:00121114 Article in a journal. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution)
      Keywords in English: optical characterization; ellipsometry; reflectometry inhomogeneous films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 9/2/2021 15:05.
      More: https://is.muni.cz/publication/1740136/en
    6. Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45. (High reflection coating on the glass substrate within two specifications R >= 98,5% @ 248 nm for angle of incidence 45, and R >= 98% @ 213 nm for angle of incidence 45.)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Jan DVOŘÁK, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45. (High reflection coating on the glass substrate within two specifications R >= 98,5% @ 248 nm for angle of incidence 45, and R >= 98% @ 213 nm for angle of incidence 45.). 2021.
      Name (in English): High reflection coating on the glass substrate within two specifications R >= 98,5% @ 248 nm for angle of incidence 45, and R >= 98% @ 213 nm for angle of incidence 45.

      Keywords in English: DUV Coating, DUV HR coating, PARMS technology, Magnetron sputtering
      Changed by: Mgr. Ing. Pavlína Slavíková, učo 243146. Changed: 17/3/2023 07:41.
      More: https://is.muni.cz/publication/2267878/en
    7. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model
      FRANTA, Daniel and Mihai-George MURESAN. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model. Optical Materials Express. Optica Publishing Group, 2021, vol. 11, No 12, p. 3930-3945. ISSN 2159-3930. Available from: https://dx.doi.org/10.1364/OME.441088.
      URL
      RIV/00216224:14310/21:00123347 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: Laser systems; Single crystal fibers; YAG; Laser Materials; Optical properties; Crystalline materials; Optical constants
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 13:47.
      More: https://is.muni.cz/publication/1812943/en

    2020

    1. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas
      KELAROVÁ, Štěpánka, Roman PŘIBYL, Vojtěch HOMOLA, Lukáš ZÁBRANSKÝ, Monika STUPAVSKÁ, Martin ČERMÁK and Vilma BURŠÍKOVÁ. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas. Online. In 11th International Conference on Nanomaterials - Research & Application (NANOCON 2019). Ostrava: TANGER Ltd, 2020, p. 657-662. ISBN 978-80-87294-95-6. Available from: https://dx.doi.org/10.37904/nanocon.2019.8643.
      URL
      RIV/00216224:14310/20:00114379 Proceedings paper. English. Czech Republic.
      Kelarová, Štěpánka (203 Czech Republic, guarantor, belonging to the institution) -- Přibyl, Roman (203 Czech Republic, belonging to the institution) -- Homola, Vojtěch (203 Czech Republic, belonging to the institution) -- Zábranský, Lukáš (203 Czech Republic, belonging to the institution) -- Stupavská, Monika (703 Slovakia, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: Plasma polymers; trimethylsilyl acetate; PECVD; FTIR; microindentation; confocal microscopy; ellipsometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 11/8/2021 09:03.
      More: https://is.muni.cz/publication/1686360/en
    2. Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm. (Antireflection coating on the substrate in specification: T>=99,8 % at 248 nm and T>=98,5 % at 213 nm.)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm. (Antireflection coating on the substrate in specification: T>=99,8 % at 248 nm and T>=98,5 % at 213 nm.). 2020.
      Name (in English): Antireflection coating on the substrate in specification: T>=99,8 % at 248 nm and T>=98,5 % at 213 nm.

      Keywords in English: DUV Coating, high transmission, Al2O3, SiO2
      Changed by: Mgr. Ing. Pavlína Slavíková, učo 243146. Changed: 17/3/2023 07:34.
      More: https://is.muni.cz/publication/2267877/en
    3. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge
      KELAROVÁ, Štěpánka, Vojtěch HOMOLA, Monika STUPAVSKÁ, Martin ČERMÁK, Jiří VOHÁNKA, Roman PŘIBYL, Lukáš ZÁBRANSKÝ and Vilma BURŠÍKOVÁ. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge. Progress in Organic Coatings. Lausanne: Elsevier, 2020, vol. 149, December 2020, p. 1-8. ISSN 0300-9440. Available from: https://dx.doi.org/10.1016/j.porgcoat.2020.105927.
      URL
      RIV/00216224:14310/20:00114381 Article in a journal. English. Switzerland.
      Kelarová, Štěpánka (203 Czech Republic, guarantor, belonging to the institution) -- Homola, Vojtěch (203 Czech Republic, belonging to the institution) -- Stupavská, Monika (703 Slovakia, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Přibyl, Roman (203 Czech Republic, belonging to the institution) -- Zábranský, Lukáš (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: Trimethylsilyl acetate; PECVD; FTIR; XPS; Surface free energy; Ellipsometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 3/12/2020 10:46.
      More: https://is.muni.cz/publication/1686381/en
    4. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry
      VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL and Ivan OHLÍDAL. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry. Applied Surface Science. Elsevier Science, 2020, vol. 534, December 2020, p. 1-10. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2020.147625.
      URL
      RIV/00216224:14310/20:00114444 Article in a journal. English. Netherlands.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Šustek, Štěpán (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Šklíbová, Veronika (203 Czech Republic, belonging to the institution) -- Šulc, Václav (203 Czech Republic) -- Homola, Vojtěch (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Thickness non-uniformity; Ellipsometry; Imaging spectroscopic reflectometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 27/2/2024 14:14.
      More: https://is.muni.cz/publication/1692072/en
    5. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials
      VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials. Optics Express. Washington, D.C.: Optical Society of America, 2020, vol. 28, No 4, p. 5492-5506. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.380657.
      Přeměruje na stránku u nakladatele
      RIV/00216224:14310/20:00114443 Article in a journal. English. United States of America.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Homola, Vojtěch (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: optical characterization;thickness non-uniform films;ellipsometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 20/11/2020 13:52.
      More: https://is.muni.cz/publication/1692056/en
    6. Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Václav ŠULC, Štěpán ŠUSTEK and Miloslav OHLÍDAL. Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films. Optics Express. Washington, D.C.: Optical Society of America, 2020, vol. 28, No 24, p. 36796-36811. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.412043.
      Odkaz na stránky nakladatele
      RIV/00216224:14310/20:00114508 Article in a journal. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Šulc, Václav (203 Czech Republic) -- Šustek, Štěpán (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic)
      Keywords in English: Chemical vapor deposition; Mueller matrices; Optical constants;Optical properties;Thin film applications;Thin films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 13/1/2021 16:54.
      More: https://is.muni.cz/publication/1699498/en
    7. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism)
      ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA and Ivan OHLÍDAL. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism). Physica Scripta. Royal Swedish Academy of Sciences, 2020, vol. 95, No 9, p. 095503-95521. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aba77b.
      Zde je odkaz na článek
      Name in Czech: Optické veličiny popisující výcevrstevnatý systém s náhodně drsnými hranicemi a jednoosými anizotropními médii vypočténé za pomocí Rayleigh-Riceovy teorie a Yehova maticového formalizmu
      Name (in English): Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism
      RIV/00216224:14310/20:00116904 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Čermák, Martin (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: uniaxial anisotropy; optical quantities; Rayleigh-Rice theory; multi-layer systems; random boundary roughness
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 9/2/2021 14:47.
      More: https://is.muni.cz/publication/1692016/en
    8. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA and Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express. Washington, D.C.: OPTICAL SOC AMER, 2020, vol. 28, No 1, p. 160-174. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.28.000160.
      odkaz na stránku nakladatele
      RIV/00216224:14310/20:00114013 Article in a journal. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution)
      Keywords in English: Amorphous silicon; Extinction coefficients; Light scattering; Optical constants; Refractive index; Thin films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 30/3/2021 16:00.
      More: https://is.muni.cz/publication/1598881/en
    9. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions
      FRANTA, Daniel. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions. Journal of applied physics. Melville: American Institute of Physics, 2020, vol. 127, No 22, p. 1-17. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/5.0005735.
      URL
      RIV/00216224:14310/20:00116683 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: optical activity; sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 19/10/2020 16:30.
      More: https://is.muni.cz/publication/1686030/en

    2019

    1. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK and Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 16-26. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0037.
      URL
      RIV/00216224:14310/19:00111214 Article in a journal. English. Slovakia.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Ženíšek, Jaroslav (203 Czech Republic, belonging to the institution) -- Vašina, Petr (203 Czech Republic, belonging to the institution)
      Keywords in English: ellipsometric parameters;inhomogeneous thin films;optical characterization;reflectance
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 26/3/2020 13:12.
      More: https://is.muni.cz/publication/1577436/en
    2. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA and Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films. Elsevier, 2019, vol. 692, 31 December 2019, p. 1-17. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2019.03.001.
      odkaz na stránku nakladatele
      RIV/00216224:14310/19:00112003 Article in a journal. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Mistrík, Jan (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Vižďa, František (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Reflectance;Transmittance;Ellipsometric parameters;Inhomogeneous thin films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 28/3/2020 14:05.
      More: https://is.muni.cz/publication/1598679/en
    3. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties. BRISTOL: OP PUBLISHING LTD, 2019, vol. 7, No 4, p. 1-12. ISSN 2051-672X. Available from: https://dx.doi.org/10.1088/2051-672x/ab359d.
      URL
      RIV/00216224:14310/19:00111208 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: optical characterization;surface roughness;spectroscopic ellipsometry;spectroscopic reflectometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 26/3/2020 13:10.
      More: https://is.muni.cz/publication/1577317/en
    4. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory
      VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA and Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta. Bristol: IOP Publishing Ltd., 2019, vol. 94, No 4, p. 1-22. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aafbc1.
      URL
      RIV/00216224:14310/19:00109310 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: optical quantities; Rayleigh-Rice theory; multi-layer systems; random boundary roughness
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 17/3/2020 12:11.
      More: https://is.muni.cz/publication/1507078/en
    5. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions
      VOHÁNKA, Jiří, David NEČAS and Daniel FRANTA. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions. Journal of Vacuum Science & Technology B. 2019, vol. 37, No 6, p. "062909-1"-"062909-7", 7 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122276.
      URL
      RIV/00216224:14310/19:00112014 Article in a journal. English. United States of America.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Spectroscopy; Series expansion; Density of states; Phonons; Optical properties; Optical constants; Gaussian broadening
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 17/4/2020 17:17.
      More: https://is.muni.cz/publication/1598856/en
    6. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 2019, vol. 37, No 6, p. "062921-1"-"062921-10", 10 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122014.
      URL
      RIV/00216224:14310/19:00107920 Article in a journal. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Ženíšek, Jaroslav (203 Czech Republic, belonging to the institution) -- Vašina, Petr (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical constants;Optical absorption;Reflectometry;Magnetron sputtering;Optical metrology;Thin films;Chemical vapor deposition;Optical properties
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 17/4/2020 17:19.
      More: https://is.muni.cz/publication/1598865/en
    7. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK and Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. Basel: MDPI, 2019, vol. 9, No 7, p. 1-21. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings9070416.
      Full Text
      RIV/00216224:14310/19:00110403 Article in a journal. English. Switzerland.
      Vohánka, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Šustek, Štěpán (203 Czech Republic) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Šulc, Václav (203 Czech Republic) -- Vašina, Petr (203 Czech Republic, belonging to the institution) -- Ženíšek, Jaroslav (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: silicon nitride;optical characterization;ellipsometry;inhomogeneous films;optical anisotropy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 24/3/2020 10:12.
      More: https://is.muni.cz/publication/1549343/en
    8. Optical properties of the crystalline silicon wafers described using the universal dispersion model
      FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL and Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B. New York: A V S AMER INST PHYSICS, 2019, vol. 37, No 6, p. "062907-1"-"062907-14", 14 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122284.
      URL
      RIV/00216224:14310/19:00112018 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Bránecký, Martin (203 Czech Republic) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Čech, Vladimír (203 Czech Republic)
      Keywords in English: Spectrophotometry;Gaussian broadening;Optical constants;Optical properties;Phonons;Dielectric properties
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 17/4/2020 17:21.
      More: https://is.muni.cz/publication/1598876/en
    9. Temperature dependent dispersion models applicable in solid state physics
      FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA and Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 1-15. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0036.
      URL
      RIV/00216224:14310/19:00111216 Article in a journal. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: temperature dependent dielectrics dispersion model;Kramers-Kronig relation;crystalline silicon
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 26/3/2020 13:14.
      More: https://is.muni.cz/publication/1577498/en

    2018

    1. Amorphous gallium oxide grown by low-temperature PECVD
      KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA, Stefaan DE WOLF, Monica MORALES-MASIS and Christophe BALLIF. Amorphous gallium oxide grown by low-temperature PECVD. Journal of Vacuum Science and Technology A. AIP, 2018, vol. 36, No 2, p. 1-7. ISSN 0734-2101. Available from: https://dx.doi.org/10.1116/1.5018800.
      URL
      RIV/00216224:14310/18:00102357 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: Chemical compounds; Optical properties; Thin films; Electron energy loss spectroscopy; Physics of gases
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 23/4/2024 11:04.
      More: https://is.muni.cz/publication/1409778/en
    2. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
      FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK and Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics. 2018, vol. 123, No 18, p. 185707-185717. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/1.5026195.
      URL
      RIV/00216224:14310/18:00106358 Article in a journal. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: optical constants; temperature dependence
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 23/4/2024 14:14.
      More: https://is.muni.cz/publication/1501220/en
    3. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK and Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 11, p. 1230-1233. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6463.
      odkaz na stránku nakladatele
      RIV/00216224:14310/18:00104690 Article in a journal. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Mistrík, Jan (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: native oxide layers;optical characterization;roughness;silicon surfaces
      Changed by: Mgr. Tereza Miškechová, učo 341652. Changed: 2/5/2019 16:16.
      More: https://is.muni.cz/publication/1472996/en
    4. Ellipsometry of Layered Systems
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 233-267. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_9.
      odkaz na stránku nakladatele
      RIV/00216224:14310/18:00104686 Chapter(s) of a specialized book. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Layered systems;Jones formalism;Stokes–Mueller formalism;Yeh formalism;Ellipsometry;Ellipsometric techniques
      Changed by: Mgr. Jiří Vohánka, Ph.D., učo 60662. Changed: 28/11/2018 15:17.
      More: https://is.muni.cz/publication/1472962/en
    5. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence
      HOLOVSKÝ, Jakub, Zdeněk REMEŠ, Aleš PORUBA, Daniel FRANTA, Briana CONRAD, Lucie ABELOVÁ and David BUŠEK. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence. Review of Scientific Instruments. 2018, vol. 89, No 6, p. 063114-63119. ISSN 0034-6748. Available from: https://dx.doi.org/10.1063/1.5015988.
      URL
      RIV/00216224:14310/18:00106359 Article in a journal. English. United States of America.
      Holovský, Jakub (203 Czech Republic) -- Remeš, Zdeněk (203 Czech Republic) -- Poruba, Aleš (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Conrad, Briana (203 Czech Republic)
      Keywords in English: IR reflectance; doping; semiconductors
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 23/4/2024 14:15.
      More: https://is.muni.cz/publication/1501223/en
    6. Optical Characterization of Thin Films Exhibiting Defects
      OHLÍDAL, Ivan, Martin ČERMÁK and Jiří VOHÁNKA. Optical Characterization of Thin Films Exhibiting Defects. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 271-313. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_10.
      odkaz na stránku nakladatele
      RIV/00216224:14310/18:00104687 Chapter(s) of a specialized book. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution)
      Keywords in English: Thin film defects;Boundary roughness;Thickness non-uniformity;Optical inhomogeneity;Overlayers;Transition-layers
      Changed by: Mgr. Jiří Vohánka, Ph.D., učo 60662. Changed: 28/11/2018 15:24.
      More: https://is.muni.cz/publication/1472963/en
    7. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
      ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL and Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, vol. 65, No 14, p. 1720-1736. ISSN 0950-0340. Available from: https://dx.doi.org/10.1080/09500340.2018.1457187.
      URL
      RIV/00216224:14310/18:00103626 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Čermák, Martin (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Multilayer systems; rough boundaries; ellipsometric parameters; reflectance; transmittance
      Changed by: Mgr. Martin Čermák, Ph.D., učo 63855. Changed: 11/9/2018 16:50.
      More: https://is.muni.cz/publication/1434656/en
    8. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
      FRANTA, Daniel, Jiří VOHÁNKA and Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_3.
      odkaz na stránku nakladatele
      RIV/00216224:14310/18:00104688 Chapter(s) of a specialized book. English. Switzerland.
      Franta, Daniel (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution)
      Keywords in English: Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states
      Changed by: Mgr. Jiří Vohánka, Ph.D., učo 60662. Changed: 28/11/2018 15:32.
      More: https://is.muni.cz/publication/1472965/en
    9. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 7, p. 757-765. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6473.
      odkaz na stránku nakladatele
      RIV/00216224:14310/18:00104689 Article in a journal. English. United States of America.
      Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Ženíšek, Jaroslav (203 Czech Republic, belonging to the institution) -- Vašina, Petr (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: ellipsometry;inhomogeneous layers;optical characterization;silicon nitride
      Changed by: Mgr. Tereza Miškechová, učo 341652. Changed: 2/5/2019 16:16.
      More: https://is.muni.cz/publication/1472976/en

    2017

    1. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution
      VODÁK, Jiří, David NEČAS, Miloslav OHLÍDAL and Ivan OHLÍDAL. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. Measurement Science and Technology. Bristol: IOP PUBLISHING LTD, 2017, vol. 28, No 2, p. nestránkováno, 6 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/1361-6501/aa5534.
      URL
      RIV/00216224:14310/17:00094433 Article in a journal. English. United Kingdom of Great Britain and Northern Ireland.
      Vodák, Jiří (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: enhanced spatial resolution; high gradient thickness distribution; imaging spectroscopic reflectometer; non-uniform thin films
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 31/3/2018 13:29.
      More: https://is.muni.cz/publication/1409387/en
    2. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
      FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA and Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films. LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, vol. 631, June, p. 12-22. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2017.03.051.
      URL
      RIV/00216224:14310/17:00100084 Article in a journal. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical constants;Dispersion model;Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 1/4/2018 09:54.
      More: https://is.muni.cz/publication/1409198/en
    3. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
      OHLÍDAL, Ivan, Daniel FRANTA and David NEČAS. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. Applied Surface Science. AMSTERDAM, NETHERLANDS: Elsevier Science BV, 2017, vol. 421, November, p. 687-696. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.10.186.
      URL
      RIV/00216224:14310/17:00094430 Article in a journal. English. Netherlands.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical constants;Ellipsometry;Spectrophotometry;Thin films;Roughness;Non-uniformity
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 3/4/2018 13:55.
      More: https://is.muni.cz/publication/1409184/en
    4. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
      KOTILAINEN, Minna Paula Katriina, Richard KRUMPOLEC, Daniel FRANTA, Pavel SOUČEK, Tomáš HOMOLA, David Campbell CAMERON and Petri VUORISTO. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers. Solar Energy Materials and Solar Cells. AMSTERDAM, NETHERLANDS: ELSEVIER SCIENCE BV, 2017, vol. 166, July, p. 140-146. ISSN 0927-0248. Available from: https://dx.doi.org/10.1016/j.solmat.2017.02.033.
      URL
      Name (in English): Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
      RIV/00216224:14310/17:00096512 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Kotilainen, Minna Paula Katriina (246 Finland, belonging to the institution) -- Krumpolec, Richard (703 Slovakia, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Souček, Pavel (203 Czech Republic, belonging to the institution) -- Homola, Tomáš (703 Slovakia, belonging to the institution) -- Cameron, David Campbell (826 United Kingdom of Great Britain and Northern Ireland, belonging to the institution) -- Vuoristo, Petri (246 Finland)
      Keywords in English: Solar absorber;Diffusion barrier;Thermal ageing;Copper diffusion;HfO2 thin film
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 4/4/2018 13:29.
      More: https://is.muni.cz/publication/1378718/en
    5. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
      FRANTA, Daniel, Minna Paula Katriina KOTILAINEN, Richard KRUMPOLEC and Ivan OHLÍDAL. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry. Applied Surface Science. AMSTERDAM: ELSEVIER SCIENCE BV, 2017, vol. 421, November, p. 420-423. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.12.164.
      URL
      RIV/00216224:14310/17:00097950 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Franta, Daniel (203 Czech Republic, belonging to the institution) -- Kotilainen, Minna Paula Katriina (246 Finland, belonging to the institution) -- Krumpolec, Richard (703 Slovakia, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Hafnia; Ellipsometry; Atomic layer deposition; Solar absorber
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 10/4/2018 11:43.
      More: https://is.muni.cz/publication/1392856/en
    6. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science. AMSTERDAM: Elsevier Science, 2017, vol. 419, October, p. 942-956. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.04.211.
      URL
      RIV/00216224:14310/17:00100085 Article in a journal. English. Netherlands.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Čermák, Martin (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: Ellipsometry;Thin films;Roughness;Effective medium approximation;Rayleigh-Rice theory
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 10/4/2018 11:49.
      More: https://is.muni.cz/publication/1409203/en
    7. Temperature-dependent dispersion model of float zone crystalline silicon
      FRANTA, Daniel, Adam DUBROKA, Chennan WANG, Angelo GIGLIA, Jiří VOHÁNKA, Pavel FRANTA and Ivan OHLÍDAL. Temperature-dependent dispersion model of float zone crystalline silicon. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 405-419. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.021.
      URL
      RIV/00216224:14310/17:00094432 Article in a journal. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Dubroka, Adam (203 Czech Republic, belonging to the institution) -- Wang, Chennan (156 China, belonging to the institution) -- Giglia, Angelo (380 Italy) -- Vohánka, Jiří (203 Czech Republic, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Crystalline silicon;Optical constants;Temperature dependence;Ellipsometry;Spectrophotometry;Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 12/4/2018 11:59.
      More: https://is.muni.cz/publication/1409192/en
    8. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
      FRANTA, Daniel, David NEČAS, Angelo GIGLIA, Pavel FRANTA and Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 424-429. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.09.149.
      URL
      RIV/00216224:14310/17:00094431 Article in a journal. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Giglia, Angelo (380 Italy) -- Franta, Pavel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical constants;Ellipsometry;Spectrophotometry;Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Nicole Zrilić, učo 240776. Changed: 12/4/2018 17:44.
      More: https://is.muni.cz/publication/1409188/en

    2016

    1. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range (Materiály pro polarizátory z drátěných mřížek posouvající aplikační omezení dále do ultrafialové spektrální oblasti)
      SIEFKE, Thomas, Stefanie KROKER, Kristin PFEIFFER, Oliver PUFFKY, Kay DIETRICH, Daniel FRANTA, Ivan OHLÍDAL, Adriana SZEGHALMI, Ernst-Bernhard KLEY and Andreas TÜNNERMANN. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range (Materiály pro polarizátory z drátěných mřížek posouvající aplikační omezení dále do ultrafialové spektrální oblasti). Advanced Optical Materials. 2016, vol. 4, No 11, p. 1780-1786. ISSN 2195-1071. Available from: https://dx.doi.org/10.1002/adom.201600250.
      URL
      Name (in English): Materiály pro polarizátory z drátěných mřížek posouvající aplikační omezení dále do ultrafialové spektrální oblasti
      RIV/00216224:14310/16:00093988 Article in a journal. Optics, masers and lasers. English. Germany.
      Siefke, Thomas (276 Germany) -- Kroker, Stefanie (276 Germany) -- Pfeiffer, Kristin (276 Germany) -- Puffky, Oliver (276 Germany) -- Dietrich, Kay (276 Germany) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Szeghalmi, Adriana (276 Germany) -- Kley, Ernst-Bernhard (276 Germany) -- Tünnermann, Andreas (276 Germany)
      Keywords in English: Wire Grid Polarizers; Dispersion model; Films; Lithography
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 6/4/2017 22:20.
      More: https://is.muni.cz/publication/1376392/en
    2. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Angelo GIGLIA. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. In Gorecki, C; Asundi, AK; Osten, W. Conference on Optical Micro- and Nanometrology VI. 9890th ed. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, 2016, p. "989014-1"-"989014-15", 15 pp. ISBN 978-1-5106-0135-2. Available from: https://dx.doi.org/10.1117/12.2227580.
      Name in Czech: Optická charakterizace tenkých vrstev SiO2 pomocí univerzálního disperzního modelu v širokém spektrálním oboru
      RIV/00216224:14310/16:00094359 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Giglia, Angelo (380 Italy)
      Keywords in English: optical constants; optical thin films; ellipsometry; spectrophotometry
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 18/4/2018 14:36.
      More: https://is.muni.cz/publication/1384148/en
    3. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, M. OHLIDAL and J. VODAK. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. Journal of Optics. Bristol: IOP Publishing, 2016, vol. 18, No 1, p. nestránkováno, 10 pp. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8978/18/1/015401.
      URL
      RIV/00216224:14740/16:00087663 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlidal, M. (203 Czech Republic) -- Vodak, J. (203 Czech Republic)
      Keywords in English: thin films; roughness; scalar diffraction theory; spectrophotometry; imaging techniques; zinc selenide; reflectometry
      Changed by: Mgr. Eva Špillingová, učo 110713. Changed: 9/3/2017 11:03.
      More: https://is.muni.cz/publication/1375048/en

    2015

    1. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6° (Beamsplitter for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm and angle of incident 45°±6°)
      BŘEZINA, Jaromír and Daniel FRANTA. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6° (Beamsplitter for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm and angle of incident 45°±6°). 2015.
      Name (in English): Beamsplitter for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm and angle of incident 45°±6°
      RIV/00216224:14310/15:00080451 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: beamsplitter; HfO2/SiO2; deep ultraviolet (DUV) region; wavelength of 266nm; BS 80/20
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 3/4/2016 12:18.
      More: https://is.muni.cz/publication/1340469/en
    2. Dispersion model for optical thin films applicable in wide spectral range
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Angelo GIGLIA. Dispersion model for optical thin films applicable in wide spectral range. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96281U-1"-"96281U-12", 12 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190104.
      Name in Czech: Disperzní model pro optické tenké vrstvy použitelný v širokém spektrálním rozsahu
      RIV/00216224:14310/15:00094360 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Giglia, Angelo (380 Italy)
      Keywords in English: optical constants; optical thin films; ellipsometry; spectrophotometry
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 18/4/2018 14:28.
      More: https://is.muni.cz/publication/1384149/en
    3. Optická charakterizace povrchů skel SML3103/3/15 (Optical characterization of glass surfaces SML3103/3/15)
      FRANTA, Daniel and Pavel FRANTA. Optická charakterizace povrchů skel SML3103/3/15 (Optical characterization of glass surfaces SML3103/3/15). Brno: Preciosa a.s., 2015, 18 pp.
      Name (in English): Optical characterization of glass surfaces SML3103/3/15
      RIV/00216224:14310/15:00087314 Research report. Optics, masers and lasers. Czech. Czech Republic.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Pavel (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical characterization; glass
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 19/4/2016 09:27.
      More: https://is.muni.cz/publication/1342797/en
    4. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Polarizing cube for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Polarizing cube for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2015.
      Name (in English): Polarizing cube for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm
      RIV/00216224:14310/15:00080450 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: polarizing cube; HfO2/SiO2; deep ultraviolet (DUV) region; wavelength of 266nm
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 3/4/2016 12:20.
      More: https://is.muni.cz/publication/1340467/en
    5. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, David NEČAS, Jiří VODÁK, Daniel FRANTA, Pavel NÁDASKÝ and František VIŽĎA. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280R-1"-"96280R-13", 13 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2191052.
      Name in Czech: Možnosti a omezení zobrazovací spektroskopické reflektometrie v optické charakterizaci tenkých vrstev
      RIV/00216224:14310/15:00094363 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Miloslav (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Vodák, Jiří (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nádaský, Pavel (203 Czech Republic) -- Vižďa, František (203 Czech Republic)
      Keywords in English: Imaging spectroscopic reflectometry; non-uniform thin films; optical parameters
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 18/4/2018 14:29.
      More: https://is.muni.cz/publication/1384154/en
    6. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry
      NEČAS, David, Jiří VODÁK, Ivan OHLÍDAL, Miloslav OHLÍDAL, Abhijit MAJUMDAR and Lenka ZAJÍČKOVÁ. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. Applied Surface Science. Elsevier, 2015, vol. 350, SEP, p. 149-155. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2015.01.093.
      RIV/00216224:14740/15:00080452 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Vodák, Jiří (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Majumdar, Abhijit (276 Germany) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution)
      Keywords in English: Imaging spectrophotometry; Levenberg-Marquardt; Non-linear least-squares; Optical properties; Thickness mapping; Thin films
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Eva Špillingová, učo 110713. Changed: 18/5/2017 14:58.
      More: https://is.muni.cz/publication/1340778/en
    7. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Jiří VODÁK, Miloslav OHLÍDAL and Daniel FRANTA. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280C-1"-"96280C-9", 9 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190091.
      Name in Czech: Současné určení optických konstant, lokální tloušťky a lokální drsnosti tenkých vrstev pomocí zobrazovací spektroskopické refektometrie
      RIV/00216224:14310/15:00094362 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Vodák, Jiří (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: thin films; roughness; scalar diffraction theory; Rayleigh-Rice theory; spectrophotometry; ellipsometry; imaging techniques; zinc selenide
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 18/4/2018 14:38.
      More: https://is.muni.cz/publication/1384153/en
    8. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia
      FRANTA, Daniel, David NEČAS and Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia. Applied Optics. 2015, vol. 54, No 31, p. 9108-9112, 12 pp. ISSN 1559-128X. Available from: https://dx.doi.org/10.1364/AO.54.009108.
      RIV/00216224:14310/15:00080435 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Thin films; Dispersion; Ellipsometry; Spectrophotometry; Far IR; Vacuum UV
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 30/3/2016 12:42.
      More: https://is.muni.cz/publication/1339817/en
    9. Wide spectral range characterization of antireflective coatings and their optimization
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Jiří JANKUJ. Wide spectral range characterization of antireflective coatings and their optimization. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280F-1"-"96280F-14", 14 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190109.
      Name in Czech: Charakterizace antiodrazných pokrytí a jejich optimalizace v širokém spektrálním oboru
      RIV/00216224:14310/15:00094361 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Jankuj, Jiří (203 Czech Republic)
      Keywords in English: antireflective coatings; optical thin films; ellipsometry; spectrophotometry
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Michal Petr, učo 65024. Changed: 18/4/2018 14:31.
      More: https://is.muni.cz/publication/1384151/en

    2014

    1. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating (Al2O3/MgF2) for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating (Al2O3/MgF2) for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      Name (in English): Antireflection coating (Al2O3/MgF2) for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm
      RIV/00216224:14310/14:00073339 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: double-layer antireflection coating; Al2O3/MgF2; deep ultraviolet (DUV) region; wavelength of 266nm
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 8/4/2015 16:16.
      More: https://is.muni.cz/publication/1297282/en
    2. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm (Antireflection coating (SiO2/Al2O3/MgF2) for the far ultraviolet (FUV, VUV) region of the spectrum at the wavelength of 193nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm (Antireflection coating (SiO2/Al2O3/MgF2) for the far ultraviolet (FUV, VUV) region of the spectrum at the wavelength of 193nm). 2014.
      Name (in English): Antireflection coating (SiO2/Al2O3/MgF2) for the far ultraviolet (FUV, VUV) region of the spectrum at the wavelength of 193nm
      RIV/00216224:14310/14:00073340 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: triple-layer antireflection coating; SiO2/Al2O3/MgF2; far ultraviolet (FUV/VUV) region; wavelength of 193nm
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 8/4/2015 17:25.
      More: https://is.muni.cz/publication/1297287/en
    3. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Ivan OHLÍDAL. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      Name (in English): Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm
      RIV/00216224:14310/14:00073341 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: multi-layer antireflection coating; Al2O3/SiO2 materials; deep ultraviolet (DUV) region; wavelength of 266nm
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 9/4/2015 10:08.
      More: https://is.muni.cz/publication/1297326/en
    4. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45° (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm at AOI 45°)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45° (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm at AOI 45°). 2014.
      Name (in English): Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm at AOI 45°
      RIV/00216224:14310/14:00073342 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: multi-layer antireflection coating; Al2O3/SiO2 materials; deep ultraviolet (DUV) region; wavelength of 266nm; AOI 45°
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 9/4/2015 10:13.
      More: https://is.muni.cz/publication/1297329/en
    5. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of HfO2/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of HfO2/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      Name (in English): Antireflection coating consisting of HfO2/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm
      RIV/00216224:14310/14:00073343 Outcomes put into operation (prototype, working sample). Optics, masers and lasers. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Březina, Jaromír (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: multi-layer antireflection coating; HfO2/SiO2 materials; deep ultraviolet (DUV) region; wavelength of 266nm
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 9/4/2015 10:20.
      More: https://is.muni.cz/publication/1297331/en
    6. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Miloslav OHLÍDAL, Jiří VODÁK, Lucia SLÁDKOVÁ, Lenka ZAJÍČKOVÁ, Marek ELIÁŠ and František VIZĎA. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, november, p. 573-578. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.12.036.
      URL
      RIV/00216224:14740/14:00073337 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Čudek, Vladimír (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Vodák, Jiří (203 Czech Republic) -- Sládková, Lucia (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Eliáš, Marek (203 Czech Republic, belonging to the institution) -- Vizďa, František (203 Czech Republic)
      Keywords in English: Variable-angle spectroscopic ellipsometry; Mapping spectroscopic ellipsometry; Imaging spectroscopic reflectometry; Non-uniform thin films
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 1/4/2015 14:20.
      More: https://is.muni.cz/publication/1232792/en
    7. Broadening of dielectric response and sum rule conservation
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Broadening of dielectric response and sum rule conservation. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, November, p. 496-501. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.11.148.
      URL
      RIV/00216224:14310/14:00079589 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Dielectric response; Dispersion model; Broadening; Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 18/3/2015 10:17.
      More: https://is.muni.cz/publication/1230808/en
    8. Consolidated series for efficient calculation of the reflection and transmission in rough multilayers
      NEČAS, David and Ivan OHLÍDAL. Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. Optics Express. WASHINGTON: Optical Socienty of America, 2014, vol. 22, No 4, p. 4499-4515. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.22.004499.
      Vydavatel
      Name in Czech: Konsolidovaná řada pro efektivní výpočet odrazivosti a propostnosti drsných vícevrstev
      RIV/00216224:14740/14:00075175 Article in a journal. Optics, masers and lasers. English. United States of America.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: thin films; roughness; theory and design; mathematical methods in physics
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 26/8/2014 11:05.
      More: https://is.muni.cz/publication/1169904/en
    9. Dispersion model of two-phonon absorption: application to c-Si
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS. WASHINGTON: OPTICAL SOC AMER, 2014, vol. 4, No 8, p. 1641-1656. ISSN 2159-3930. Available from: https://dx.doi.org/10.1364/OME.4.001641.
      URL
      RIV/00216224:14310/14:00073318 Article in a journal. Optics, masers and lasers. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: HFO2 THIN-FILMS; LATTICE ABSORPTION; OPTICAL-PROPERTIES; SILICON; DEPOSITION
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 18/3/2015 10:02.
      More: https://is.muni.cz/publication/1230792/en
    10. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
      OHLÍDAL, Ivan, Daniel FRANTA and David NEČAS. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, November, p. 695-700. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2014.02.092.
      URL
      RIV/00216224:14310/14:00073316 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: Spectroscopic ellipsometry; Spectroscopic reflectometry; Rayleigh-Rice theory; Scalar diffraction theory; Rough surfaces
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 17/3/2015 13:27.
      More: https://is.muni.cz/publication/1230700/en
    11. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Miloslav OHLÍDAL, Vladimír ČUDEK and Jiří VODÁK. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. Applied Optics. USA: Optical Society of America, 2014, vol. 53, No 25, p. 5606-5614. ISSN 1559-128X. Available from: https://dx.doi.org/10.1364/AO.53.005606.
      URL
      RIV/00216224:14740/14:00073332 Article in a journal. Optics, masers and lasers. English. United States of America.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Čudek, Vladimír (203 Czech Republic, belonging to the institution) -- Vodák, Jiří (203 Czech Republic)
      Keywords in English: CHEMICAL-VAPOR-DEPOSITION; II-VI COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; LARGE-AREA; SURFACE-ROUGHNESS; LIGHT-SCATTERING; DOUBLE-LAYERS; SUM-RULE; BOUNDARIES; DEPOLARIZATION
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 30/3/2015 11:54.
      More: https://is.muni.cz/publication/1232510/en
    12. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, november, p. 490-495. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2014.03.059.
      URL
      RIV/00216224:14310/14:00079590 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Dispersion model; Sum rule; Transition strength; Crystalline silicon
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 31/10/2017 16:28.
      More: https://is.muni.cz/publication/1230809/en

    2013

    1. Advanced modeling for optical characterization of amorphous hydrogenated silicon films
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Jiří STUCHLÍK. Advanced modeling for optical characterization of amorphous hydrogenated silicon films. Thin Solid Films. Lausanne: Elsevier Science, 2013, vol. 541, Aug, p. 12-16. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.04.129.
      URL
      RIV/00216224:14740/13:00071634 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Stuchlík, Jiří (203 Czech Republic)
      Keywords in English: Ellipsometry; Spectrophotometry; a-Si:H; Urbach tail; Localized states; Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Olga Křížová, učo 56639. Changed: 6/4/2014 08:25.
      More: https://is.muni.cz/publication/1161986/en
    2. Application of sum rule to the dispersion model of hydrogenated amorphous silicon
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jiří STUCHLÍK and Dagmar CHVOSTOVA. Application of sum rule to the dispersion model of hydrogenated amorphous silicon. Thin Solid Films. Lausanne: Elsevier Science, 2013, vol. 539, Jul, p. 233-244. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.04.012.
      URL
      RIV/00216224:14740/13:00071631 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Stuchlík, Jiří (203 Czech Republic) -- Chvostova, Dagmar (203 Czech Republic)
      Keywords in English: Optical constants; Ellipsometry; Spectrophotometry; a-Si:H; Urbach tail; Localized states; Sum rule
      International impact: yes
      Reviewed: yes
      Changed by: Olga Křížová, učo 56639. Changed: 14/7/2015 10:04.
      More: https://is.muni.cz/publication/1161978/en
    3. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models
      FRANTA, Daniel, David NEČAS and Lenka ZAJÍČKOVÁ. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models. Thin Solid Films. Oxford: Elsevier Science, 2013, vol. 534, May, p. 432-441. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.01.081.
      URL
      RIV/00216224:14740/13:00066826 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution)
      Keywords in English: Sum rule; Optical constants; Dispersion model
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 9/4/2015 11:44.
      More: https://is.muni.cz/publication/1161970/en
    4. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
      NEČAS, David, Daniel FRANTA, Ivan OHLÍDAL, Aleš PORUBA and Petr WOSTRÝ. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. Surface and Interface Analysis. Hoboken: WILEY-BLACKWELL, 2013, vol. 45, No 7, p. 1188-1192. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.5250.
      URL
      Name in Czech: Elipsometrická charakterizace nehomogenních nestechiometrických vrstev nitridu křemíku
      RIV/00216224:14740/13:00065705 Article in a journal. Optics, masers and lasers. English. United States of America.
      Nečas, David (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Poruba, Aleš (203 Czech Republic) -- Wostrý, Petr (203 Czech Republic)
      Keywords in English: optical characterization; variable-angle spectroscopic ellipsometry; phase-modulated ellipsometry; inhomogeneous films; silicon nitride films
      International impact: yes
      Reviewed: yes
      Changed by: Martina Prášilová, učo 342282. Changed: 9/4/2015 11:45.
      More: https://is.muni.cz/publication/1113198/en

    2012

    1. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
      KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK and Pavel HÁN. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode. 2012.
      Name in Czech: Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou
      Name (in English): Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
      RIV/00216224:14310/12:00068013 Patent. Plasma physics and discharge through gases. English. Netherlands. obsah podléhá obchodnímu tajemství.
      Klíma, Miloš (203 Czech Republic, guarantor, belonging to the institution) -- Alberti, Milan (203 Czech Republic) -- Svoboda, Tomáš (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Slavíček, Pavel (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Mazík, Michal (703 Slovakia) -- Hán, Pavel (203 Czech Republic, belonging to the institution)
      Keywords in English: polyreactions; plasma chemical polyreactions; modification of macromolecular substances; discharges; plasma jets; atmosperic hollow cathodes
      Changed by: RNDr. Milan Alberti, CSc., učo 720. Changed: 15/4/2014 17:41.
      More: https://is.muni.cz/publication/1093944/en
    2. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD
      MOCANU, Valentin, Adrian STOICA, Lukáš KELAR, Daniel FRANTA, Vilma BURŠÍKOVÁ, Romana MIKSOVA and Vratislav PERINA. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD. Chem. Listy. 2012, 106/2012, No 106, p. s1460-s1464, 4 pp. ISSN 0009-2770.
      URL
      Name in Czech: Multifunkcni transparentni ochranných nátěrů na polykarbonáty připravena pomocí PECVD
      RIV/00216224:14310/12:00057154 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Mocanu, Valentin (642 Romania, belonging to the institution) -- Stoica, Adrian (642 Romania, belonging to the institution) -- Kelar, Lukáš (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, guarantor, belonging to the institution) -- Miksova, Romana (203 Czech Republic) -- Perina, Vratislav (203 Czech Republic)
      Keywords in English: vícevrstevnaté povlaky; ochranné vrstvy; transparentní; polycarbonate
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 3/4/2013 17:44.
      More: https://is.muni.cz/publication/1092432/en

    2011

    1. Anisotropy-enhanced depolarization on transparent film/substrate system
      FRANTA, Daniel, David NEČAS and Ivan OHLÍDAL. Anisotropy-enhanced depolarization on transparent film/substrate system. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2637-2640. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.113.
      URL
      RIV/00216224:14310/11:00050716 Article in a journal. Optics, masers and lasers. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: anisotropy; depolarization; optical properties; ellipsometry
      Reviewed: yes
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 20/4/2012 10:16.
      More: https://is.muni.cz/publication/932462/en
    2. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Christoph COBET. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2694-2697. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.059.
      URL
      RIV/00216224:14310/11:00049732 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Cobet, Christoph (276 Germany)
      Keywords in English: diamond-like carbon; amorphous hydrogenated carbon; optical properties; band structure
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:08.
      More: https://is.muni.cz/publication/932461/en
    3. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
      ZAJÍČKOVÁ, Lenka, Daniel FRANTA, David NEČAS, Vilma BURŠÍKOVÁ, Mihai George MURESAN, Vratislav PEŘINA and Christoph COBET. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture. Thin Solid Films. Elsevier, 2011, vol. 519, No 13, p. 4299-4308. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2011.02.021.
      URL
      RIV/00216224:14310/11:00049805 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Zajíčková, Lenka (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Muresan, Mihai George (642 Romania, belonging to the institution) -- Peřina, Vratislav (203 Czech Republic, belonging to the institution) -- Cobet, Christoph (276 Germany)
      Keywords in English: Diamond-like carbon; Amorphous hydrogenated carbon; Optical properties; Band structure
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:08.
      More: https://is.muni.cz/publication/940456/en
    4. Ellipsometric characterisation of thin films non-uniform in thickness
      NEČAS, David, Daniel FRANTA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Ellipsometric characterisation of thin films non-uniform in thickness. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2715-2717. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.065.
      URL
      RIV/00216224:14310/11:00050721 Article in a journal. Optics, masers and lasers. English. Netherlands.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical characterisation; Variable angle spectroscopic ellipsometry; Phase-modulated ellipsometry; Non-uniform thin films
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 20/4/2012 10:25.
      More: https://is.muni.cz/publication/940454/en
    5. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Vratislav PEŘINA and Romana MIKŠOVÁ. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC. In 12th International Balkan Workshop on Applied Physics, 2011. 2011.
      Name (in English): INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC
      RIV/00216224:14310/11:00050061 Conference abstract. Plasma physics and discharge through gases. English. Romania.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Peřina, Vratislav (203 Czech Republic, belonging to the institution) -- Mikšová, Romana (203 Czech Republic)
      Keywords in English: Diamond-like carbon; Amorphous hydrogenated carbon; Optical properties; Nitrogen
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 5/12/2011 13:56.
      More: https://is.muni.cz/publication/953441/en
    6. Measurement of the thickness distribution and optical constants of non-uniform thin films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS and Abhijit MAJUMDAR. Measurement of the thickness distribution and optical constants of non-uniform thin films. Measurement Science and Technology. Bristol, England: IOP Publishing, 2011, vol. 22, No 8, p. "nestránkováno", 8 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/0957-0233/22/8/085104.
      URL
      Name in Czech: Měření rozdělení tloušťek a optických konstant neuniformních tenkých vrstev
      RIV/00216224:14310/11:00050733 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Klapetek, Petr (203 Czech Republic) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Majumdar, Abhijit (276 Germany)
      Keywords in English: non-uniform thin films; imaging spectroscopic reflectometry; distribution of the local thickness
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 23/3/2012 13:19.
      More: https://is.muni.cz/publication/966976/en
    7. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges
      BURŠÍKOVÁ, Vilma, Olga BLÁHOVÁ, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Petr KLAPETEK and Jiří BURŠÍK. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges. CHEMICKÉ LISTY. Praha: Česká společnost chemická, 2011, vol. 105, CHLSAC 105, p. 98 - 101. ISSN 0009-2770.
      URL
      Name in Czech: Mechanické vlastnosti ultrananokrystalickýh tenkých vrstev deponovaných pomocí dvoufrekvenčního výboje
      RIV/00216224:14310/11:00049530 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Bláhová, Olga (203 Czech Republic) -- Karásková, Monika (203 Czech Republic, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Jašek, Ondřej (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Klapetek, Petr (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic)
      Keywords in English: ultrananocrystalline diamond; plasma enhanced chemical vapor deposition; dual frequency discharge; local mechanical properties
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 14/3/2014 10:21.
      More: https://is.muni.cz/publication/966868/en
    8. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS and Vratislav PEŘINA. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel. In E-MRS 2011 Spring Meeting. 2011.
      Name (in English): Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel
      RIV/00216224:14310/11:00050060 Conference abstract. Plasma physics and discharge through gases. English. France.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Peřina, Vratislav (203 Czech Republic, belonging to the institution)
      Keywords in English: Diamond-like carbon DLC; Adhesion; Silicon oxide; Nitrogen doping; Stainless steel
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 13/12/2011 16:09.
      More: https://is.muni.cz/publication/953439/en
    9. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, David NEČAS, Daniel FRANTA and Vilma BURŠÍKOVÁ. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2874-2876. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.069.
      URL
      RIV/00216224:14310/11:00050720 Article in a journal. Optics, masers and lasers. English. Netherlands.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Miloslav (203 Czech Republic) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: Optical characterisation; Non-uniform films; Spectroscopic ellipsometry; Spectroscopic reflectometry; Spectroscopic imaging reflectometry
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 20/4/2012 10:24.
      More: https://is.muni.cz/publication/940438/en
    10. Optical characterization of HfO2 thin films
      FRANTA, Daniel, Ivan OHLÍDAL, David NEČAS, František VIŽĎA, Ondřej CAHA, Martin HASOŇ and Pavel POKORNÝ. Optical characterization of HfO2 thin films. Thin Solid Films. Oxford, UK: Elsevier, 2011, vol. 519, No 18, p. 6085–6091. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2011.03.128.
      URL
      Name in Czech: Optická charakterizace tenkých vrstev HfO2
      RIV/00216224:14310/11:00055011 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Vižďa, František (203 Czech Republic) -- Caha, Ondřej (203 Czech Republic, belonging to the institution) -- Hasoň, Martin (203 Czech Republic, belonging to the institution) -- Pokorný, Pavel (203 Czech Republic)
      Keywords in English: Optical properties; Ellipsometry; Spectrophotometry; Hafnium oxide; Transition-metal oxide; Urbach tail
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 23/3/2012 13:22.
      More: https://is.muni.cz/publication/966962/en
    11. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
      NEČAS, David, Ivan OHLÍDAL and Daniel FRANTA. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. Journal of Optics. Bristol: IOP Publishing, 2011, vol. 13, No 8, p. "nestránkováno", 10 pp. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8978/13/8/085705.
      URL
      Name in Czech: Víceúhlová spektroskopická elipsometrie značně ne-uniformních tenkých vrstev
      RIV/00216224:14310/11:00050732 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Nečas, David (203 Czech Republic, guarantor, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: ellipsometry; thin films; non-uniformity
      International impact: yes
      Reviewed: yes
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 20/4/2012 12:03.
      More: https://is.muni.cz/publication/966931/en

    2010

    1. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Christoph COBET. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range. Diamond and Related Materials. Amsterdam: Elsevier, 2010, vol. 19, 2-3, p. 114-122. ISSN 0925-9635.
      RIV/00216224:14310/10:00040194 Article in a journal. Plasma physics and discharge through gases. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Cobet, Christoph (276 Germany)
      Keywords in English: Diamond-like carbon; Amorphous hydrogenated carbon; Optical properties; Band structure
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:10.
      More: https://is.muni.cz/publication/895717/en
    2. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD
      STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK and Vilma BURŠÍKOVÁ. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD. In E-MRS 2010 Spring Meeting Book of Abstracts. 2010.
      program
      Name in Czech: Srovnávací studie o hydrogenované a deuterovaný amorfního uhlíku filmy uloženy RF PECVD
      Name (in English): Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD
      Plasma physics and discharge through gases. English. France.
      Keywords in English: PECVD; diamond-like carbon; deuterated layer; hydrogen; mechanical characterization; thin layer
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 10/1/2011 16:38.
      More: https://is.muni.cz/publication/918551/en
    3. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge
      TRUNEC, David, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Filip STUDNIČKA, Pavel SŤAHEL, Vadym PRYSIAZHNYI, Vratislav PEŘINA, Jana HOUDKOVÁ, Zdeněk NAVRÁTIL and Daniel FRANTA. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge. Journal of Physics D: Applied Physics. Bristol, England: IOP Publishing Ltd., 2010, vol. 43, No 22, p. 225403-225410. ISSN 0022-3727.
      URL
      Name in Czech: Depozice tvrdých tenkých vrstev z HMDSO v dielektrickém bariérovém výboji za atmosférického tlaku
      RIV/00216224:14310/10:00043949 Article in a journal. Plasma physics and discharge through gases. English. United Kingdom of Great Britain and Northern Ireland.
      Trunec, David (203 Czech Republic, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Studnička, Filip (203 Czech Republic, belonging to the institution) -- Sťahel, Pavel (203 Czech Republic, belonging to the institution) -- Prysiazhnyi, Vadym (804 Ukraine, belonging to the institution) -- Peřina, Vratislav (203 Czech Republic) -- Houdková, Jana (203 Czech Republic) -- Navrátil, Zdeněk (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: thin film deposition; atmospheric pressure discharge
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:10.
      More: https://is.muni.cz/publication/883750/en
    4. Development of transparent protective coatings on polycarbonate substrates using PECVD
      MOCANU, Valentin, Vilma BURŠÍKOVÁ, Adrian STOICA, Vratislav PEŘINA, Daniel FRANTA, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Miloslav OHLÍDAL. Development of transparent protective coatings on polycarbonate substrates using PECVD. In Twelfth International Conference on Plasma Surface Engineering, 2010. 2010.
      Name in Czech: Vývoj transparentních ochranných vrstev na polykarbonát substráty pomocí PECVD
      Name (in English): Development of transparent protective coatings on polycarbonate substrates using PECVD
      Plasma physics and discharge through gases. English. Germany.
      Keywords in English: polycarbonate, protective coatings, thin films, multilayered, transparent
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 1/6/2011 15:45.
      More: https://is.muni.cz/publication/918434/en
    5. Diamond-Like Carbon film for protective use on glass and polymer surfaces
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. Diamond-Like Carbon film for protective use on glass and polymer surfaces. In Potential and applications of surface nanotreatment of polymers and glass. 2010.
      URL
      RIV/00216224:14310/10:00047541 Conference abstract. Plasma physics and discharge through gases. English. Czech Republic.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: DLC; pecvd; glass; polymers; hardness
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 14/3/2011 19:34.
      More: https://is.muni.cz/publication/930234/en
    6. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS and Vratislav PEŘINA. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates. In Material Science and Engineering. 2010.
      URL
      RIV/00216224:14310/10:00047540 Conference abstract. Plasma physics and discharge through gases. English. Germany.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Peřina, Vratislav (203 Czech Republic, belonging to the institution)
      Keywords in English: DLC; metallic substrate; adhesion
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 14/3/2011 19:23.
      More: https://is.muni.cz/publication/930230/en
    7. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers. In 19th Annual Student Conference - Week of Doctoral Students 2010. 2010.
      URL
      RIV/00216224:14310/10:00047539 Conference abstract. Plasma physics and discharge through gases. English. Czech Republic.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: Diamond-Like Carbon; optical properties
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 14/3/2011 19:08.
      More: https://is.muni.cz/publication/930229/en
    8. Multilayered transparent polymer protective coatings using PECVD
      MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ and Daniel FRANTA. Multilayered transparent polymer protective coatings using PECVD. In 11th International Balkan Workshop on Applied Physics, 2010. 2010. ISBN 978-973-614-554-4.
      Accepted abstracts
      Name in Czech: Vícevrstvé polymerové transparentní ochranné nátěry pomocí PECVD
      Name (in English): Multilayered transparent polymer protective coatings using PECVD
      Plasma physics and discharge through gases. English. Romania.
      Keywords in English: polycarbonate, protective coatings, thin films, multilayered, transparent
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 1/6/2011 15:46.
      More: https://is.muni.cz/publication/918526/en
    9. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Olga BLÁHOVÁ and Jiří ŠPERKA. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges. Surface & coatings technology. Elsevier Science, 2010, vol. 204, 12-13, p. 1997–2001. ISSN 0257-8972.
      RIV/00216224:14310/10:00040570 Article in a journal. Plasma physics and discharge through gases. English. Netherlands.
      Karásková, Monika (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Bláhová, Olga (203 Czech Republic) -- Šperka, Jiří (203 Czech Republic, belonging to the institution)
      Keywords in English: ultrananocrystalline diamond; bias enhanced nucleation; indentation hardness; ellipsometry; FTIR
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:11.
      More: https://is.muni.cz/publication/895715/en
    10. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS. In 11th International Balkan Workshop on Applied Physics 2010. 2010. ISBN 978-973-614-554-4.
      official site
      RIV/00216224:14310/10:00047524 Conference abstract. Plasma physics and discharge through gases. English. Romania.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: diamond-like carbon; nitrogen; pecvd; optical properties
      Changed by: Mihai George Muresan, Ph.D., M.Sc., učo 365448. Changed: 14/3/2011 18:54.
      More: https://is.muni.cz/publication/930176/en
    11. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA and David NEČAS. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS. In TANGER Ltd. 2nd International Conference Nanocon 2010. 1st. Olomouc: TANGER Ltd., 2010, p. 434-440. ISBN 978-80-87294-19-2.
      RIV/00216224:14310/10:00049718 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Muresan, Mihai George (642 Romania, guarantor, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution)
      Keywords in English: Diamond-Like Carbon; PECVD
      Type of proceedings: post-proceedings
      Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 20/4/2012 10:09.
      More: https://is.muni.cz/publication/930213/en
    12. Preparation of multifunctional layered materials
      MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ and Daniel FRANTA. Preparation of multifunctional layered materials. In European Materials Research Society. 2010.
      Name in Czech: Příprava multifunkční vrstvených materiálů
      Name (in English): Preparation of multifunctional layered materials
      Plasma physics and discharge through gases. English. France.
      Keywords in English: polycarbonate, protective coatings, thin films, transparent multilayers
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 1/6/2011 15:46.
      More: https://is.muni.cz/publication/918461/en
    13. Study on the properties of modified amorphous carbon thin films deposited by PECVD.
      STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK and Vilma BURŠÍKOVÁ. Study on the properties of modified amorphous carbon thin films deposited by PECVD. In Twefth International Conference on Plasma Surface Engineering. 2010.
      program
      Name in Czech: Studie o vlastnostech modifikovaného filmů amorfního uhlíku tenký uloženy PECVD.
      Name (in English): Study on the properties of modified amorphous carbon thin films deposited by PECVD.
      Plasma physics and discharge through gases. English. Romania.
      Keywords in English: RF-PECVD, amorphous carbon, protective coatings, DLC, modification.
      Type of participation: active participation (giving a lecture, organization, etc.)
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 10/1/2011 17:16.
      More: https://is.muni.cz/publication/918569/en

    2009

    1. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS and Vilma BURŠÍKOVÁ. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 384-387. ISSN 0925-9635.
      Name in Czech: Použití spektroskopické zobrazovací reflektometrie pro analýzu plošné neuniformity diamantu podobných uhlíkových vrstev
      RIV/00216224:14310/09:00029277 Article in a journal. Optics, masers and lasers. English. Switzerland.
      Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Nečas, David (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic)
      Keywords in English: diamond-like carbon films; optical properties characterization
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 11/5/2009 13:45.
      More: https://is.muni.cz/publication/831301/en
    2. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL, Martin HRDLIČKA, Martin PAVLIŠTA, Miloslav FRUMAR and Miloslav OHLÍDAL. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2009, vol. 11, No 12, p. 1891-1898. ISSN 1454-4164.
      Name in Czech: Kombinovaná metoda spektroskopické elipsometrie a fotometrie jako účinný nástroj pro optickou charakterizaci chakogenidových vrstev
      RIV/00216224:14310/09:00030131 Article in a journal. Solid-state physics and magnetism. English. Romania.
      Franta, Daniel (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Hrdlička, Martin (203 Czech Republic) -- Pavlišta, Martin (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic)
      Keywords in English: elipsometrie; spektrofotometrie; chalkogenidy; tenké vrstvy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 12/4/2010 14:13.
      More: https://is.muni.cz/publication/879780/en
    3. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
      OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA and Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 364-367. ISSN 0925-9635. Available from: https://dx.doi.org/10.1016/j.diamond.2008.09.003.
      URL
      Name in Czech: Charakterizace neuniformních vrstev diamantu-podobného uhlíku pomocí spektroskopické elipsometrie
      Name (in English): Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
      RIV/00216224:14310/09:00029162 Article in a journal. Plasma physics and discharge through gases. English. Switzerland.
      Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: diamond-like carbon films; thickness non-uniformity; material parameters; optical constants
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 18/6/2020 15:47.
      More: https://is.muni.cz/publication/808473/en
    4. Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates
      VIZDA, Frantisek, Ivan OHLÍDAL and Vojtech HRUBY. Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates. In Caldas, M. J. ; Studart, N. PHYSICS OF SEMICONDUCTORS. MELVILLE: AMER INST PHYSICS, 2009, p. 19-20. ISBN 978-0-7354-0736-7. Available from: https://dx.doi.org/10.1063/1.3295367.
      URL
      RIV: Proceedings paper. English. United States of America.
      Vizda, Frantisek (guarantor) -- Ohlídal, Ivan (203 Czech Republic, belonging to the institution)
      Keywords in English: Rough thin films; Semiconductor substrates; Cross-correlation; Reflectance
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 20/8/2020 14:44.
      More: https://is.muni.cz/publication/1674880/en
    5. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Vilma BURŠÍKOVÁ. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 413–418. ISSN 0925-9635.
      Name in Czech: Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
      Name (in English): Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
      RIV/00216224:14310/09:00029160 Article in a journal. Plasma physics and discharge through gases. English. Taiwan.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution)
      Keywords in English: diamond-like carbon; amorhpous hydrogenated carbon; optical properties; band structure
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:14.
      More: https://is.muni.cz/publication/808451/en
    6. Modeling of dielectric response of GexSbyTez (GST) materials
      FRANTA, Daniel, David NEČAS and Miloslav FRUMAR. Modeling of dielectric response of GexSbyTez (GST) materials. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2009, vol. 5, No 5, p. 1324-1327. ISSN 1610-1634.
      Name in Czech: Modelování dielektrické odezvy GexSbyTez (GST) materiálů
      RIV/00216224:14310/09:00039953 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Franta, Daniel (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic)
      Keywords in English: chlkogenidy; teplotní stabilita; elipsometrie; optické konstanty
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 12/4/2010 14:26.
      More: https://is.muni.cz/publication/879784/en
    7. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
      NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, vol. 7, březen, p. 486-490. ISSN 1348-0391.
      Name in Czech: Optická charakterizace ultratenkých vrstev železa a kysličníků železa
      RIV/00216224:14310/09:00028505 Article in a journal. Solid-state physics and magnetism. English. Japan.
      Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Sťahel, Pavel (203 Czech Republic, belonging to the institution) -- Mikulík, Petr (203 Czech Republic) -- Meduňa, Mojmír (203 Czech Republic, belonging to the institution) -- Valtr, Miroslav (203 Czech Republic)
      Keywords in English: iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:17.
      More: https://is.muni.cz/publication/836841/en
    8. Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK and David NEČAS. Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry. In Proceedings of IMEKO XIX World Congress. Lisabon: IMEKO, 2009, p. 100-105. ISBN 978-963-88410-0-1.
      Name in Czech: Přesné měření rozdělení tloušťěk neuniformních vrstev zobrazovací spektrofotometrií
      RIV/00216224:14310/09:00030121 Proceedings paper. Optics, masers and lasers. English. Portugal.
      Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Nečas, David (203 Czech Republic)
      Keywords in English: non-uniform thin films; imaging spectroscopic reflectometry
      Type of proceedings: post-proceedings
      International impact: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 30/11/2009 12:16.
      More: https://is.muni.cz/publication/857321/en
    9. Reflectance of non-uniform thin films
      NEČAS, David, Ivan OHLÍDAL and Daniel FRANTA. Reflectance of non-uniform thin films. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2009, vol. 11, No 4, p. 1-9. ISSN 1464-4258.
      Name in Czech: Odrazivost neuniformních tenkých vrstev
      RIV/00216224:14310/09:00035189 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Nečas, David (203 Czech Republic, belonging to the institution) -- Ohlídal, Ivan (203 Czech Republic, guarantor, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution)
      Keywords in English: thin films; thickness non-uniformity; spectrophotometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 30/1/2012 14:17.
      More: https://is.muni.cz/publication/824022/en

    2008

    1. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane
      ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Vratislav PEŘINA and Anna MACKOVÁ. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane. In ORGANIC/INORGANIC HYBRID MATERIALS - 2007. WARRENDALE: MATERIALS RESEARCH SOCIETY, 2008, p. 159-164. ISBN 978-1-55899-967-1.
      Name in Czech: Složení a funkční vlastnosti organosilikonových polymerů vytvářených z hexamethyldisiloxanu a octamethylcyclotetrasiloxanu
      Plasma physics and discharge through gases. English. United Kingdom of Great Britain and Northern Ireland.
      Keywords in English: THIN-FILMS; HYBRID; DEPOSITION; SILICA; MODEL
      Type of proceedings: post-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:19.
      More: https://is.muni.cz/publication/839392/en
    2. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge
      BURŠÍKOVÁ, Vilma, Vratislav PEŘINA, Jaroslav SOBOTA, Petr KLAPETEK, Pavel DVOŘÁK, Adrian STOICA, Jiří BURŠÍK and Daniel FRANTA. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge. In 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases. 19th ed. Cordoba, Spain: European Physical Society, 2008, 2 pp. ISBN 2-914771-04-5.
      Name in Czech: Depozice nanostrukrurovaných diamantu podobných uhlíkových vrstev v kapacitním výboji s dvojí frekvencí
      Plasma physics and discharge through gases. English. Spain.
      Type of proceedings: pre-proceedings
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 4/1/2009 15:46.
      More: https://is.muni.cz/publication/777914/en
    3. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges
      BURSIKOVA, Vilma, Vratislav PERINA, Jaroslav SOBOTA, Jan GROSSMAN, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA, Ivan OHLIDAL, Lenka ZAJICKOVA, Josef HAVEL and Jan JANCA. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
      Name in Czech: Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges
      Name (in English): Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges
      Plasma physics and discharge through gases. English. Taiwan.
      Keywords in English: Characterization; nanostructured diamond-like carbon coatings; single; dual frequency capacitive discharge
      International impact: yes
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 13/1/2009 15:26.
      More: https://is.muni.cz/publication/808478/en
    4. Influence of cross-correlation effects on the optical quantities of rough films
      FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express. elektronicky: Optical Society of America, 2008, vol. 16, No 11, p. 7789–7803. ISSN 1094-4087.
      Name in Czech: Vliv vzájemných korelačních efektů na optické veličiny drsných vrstev
      RIV/00216224:14310/08:00025416 Article in a journal. Optics, masers and lasers. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Nečas, David (203 Czech Republic)
      Keywords in English: Roughness; Rayleigh-Rice theory; Cross-correlation effects
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/7/2009 09:45.
      More: https://is.muni.cz/publication/806290/en
    5. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films
      OHLÍDAL, Ivan and David NEČAS. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. Journal of modern optics. Londýn: Taylor & Francis Ltd., 2008, vol. 55, No 7, p. 1077-1099. ISSN 0950-0340.
      Name in Czech: Vliv stínění na elipsometrické veličiny náhodně drsných povrchů a tenkých vrstev
      RIV/00216224:14310/08:00026336 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic)
      Keywords in English: ellipsometry; rough surfaces; rough films; shadowing; scalar diffraction theory
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 1/9/2008 15:29.
      More: https://is.muni.cz/publication/775829/en
    6. Modeling of optical constants of diamond-like carbon
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, David NEČAS and Lenka ZAJÍČKOVÁ. Modeling of optical constants of diamond-like carbon. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 705–708. ISSN 0925-9635.
      Name in Czech: Modelování optických konstant diamantu podobných vrstev
      RIV/00216224:14310/08:00024371 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Nečas, David (203 Czech Republic, belonging to the institution) -- Zajíčková, Lenka (203 Czech Republic, belonging to the institution)
      Keywords in English: Diamon-like carbon; Amorphou hydrogenated carbon; Optical properties; Band structure
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 27/3/2013 09:18.
      More: https://is.muni.cz/publication/806285/en
    7. Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition
      BURSIKOVA, Vilma, Miroslav VALTR, Petr KLAPETEL, Jiri BURSIK, Olga BLAHOVA and Ivan OHLIDAL. Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition. 2008.
      Name in Czech: Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition
      Name (in English): Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition
      Plasma physics and discharge through gases. English. Taiwan.
      Keywords in English: Nanoindentation; amorphous carbon films; plasma enchanced chemical vapor deposition
      International impact: yes
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 13/1/2009 15:06.
      More: https://is.muni.cz/publication/808472/en
    8. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES. In CESPC II Book Of Extended Abstracts. 1st ed. Brno: Masarykova Univerzita, 2008, p. 159-160.
      Name in Czech: Nukleace a růst ultrananokrystalických diamantových vrstev metodou PEVCD na různých substrátech
      Name (in English): NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES
      RIV/00216224:14310/08:00024394 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Karásková, Monika (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Jašek, Ondřej (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: ultrananocrystalline diamond; PECVD; nucleation
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: Mgr. Ondřej Jašek, Ph.D., učo 8533. Changed: 12/1/2009 17:26.
      More: https://is.muni.cz/publication/808173/en
    9. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry
      OHLÍDAL, Ivan, David NEČAS, Vilma BURŠÍKOVÁ, Daniel FRANTA and Miloslav OHLÍDAL. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 709–712. ISSN 0925-9635.
      Name in Czech: Optická charakterizace diamantu podobných tenkých vrstev neuniformních v tloušťce za pomocí spektroskopické reflektometrie
      RIV/00216224:14310/08:00025137 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic)
      Keywords in English: Diamon-like carbon films; Non-uniformity in thickness; Material parameters; Optical constants
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/7/2009 09:44.
      More: https://is.muni.cz/publication/806287/en
    10. Optical characterization of non-stoichiometric silicon nitride films
      NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL and Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1320-1323. ISSN 1610-1634.
      Name in Czech: Optická charakterizace nestechiometrických vrstev nitridu křemíku
      RIV/00216224:14310/08:00025411 Article in a journal. Optics, masers and lasers. English. Germany.
      Nečas, David (203 Czech Republic, guarantor) -- Peřina, Vratislav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Zemek, Josef (203 Czech Republic)
      Keywords in English: ellipsometry; spectrophotometry; silicon nitride; stoichiometry; optical constants
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 12/7/2010 07:35.
      More: https://is.muni.cz/publication/775835/en
    11. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
      FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL and Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1324-1327. ISSN 1610-1634.
      Name in Czech: Optická charakterizace fázově měnitelných Ge2Sb2Te5 chalkogenidových filmů
      RIV/00216224:14310/08:00025067 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Franta, Daniel (203 Czech Republic, guarantor) -- Hrdlička, Martin (203 Czech Republic) -- Nečas, David (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Pavlišta, Martin (203 Czech Republic)
      Keywords in English: thin-films; thermal-stability; dispersion model; rough surfaces; optical constants
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/7/2009 09:37.
      More: https://is.muni.cz/publication/798278/en
    12. Optical Characterization of Ultrananocrystalline Diamond Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Ondřej JAŠEK, David NEČAS, Petr KLAPETEK and Miroslav VALTR. Optical Characterization of Ultrananocrystalline Diamond Films. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 1278–1282. ISSN 0925-9635.
      Name in Czech: Optická charakterizace ultrananokrystalických diamantových vrstev
      RIV/00216224:14310/08:00024370 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Karásková, Monika (203 Czech Republic) -- Jašek, Ondřej (203 Czech Republic) -- Nečas, David (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Valtr, Miroslav (203 Czech Republic)
      Keywords in English: Nanocrystalline carbon; Optical properties characterization; Band structure
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Ondřej Jašek, Ph.D., učo 8533. Changed: 24/6/2009 16:12.
      More: https://is.muni.cz/publication/806283/en
    13. Optical quantities of rough films calculated by Rayleigh-Rice theory
      FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1395–1398. ISSN 1610-1634.
      Name in Czech: Optické veličiny drsných vrstev počítané pomocí Rayleigh-Riceovy teorie
      RIV/00216224:14310/08:00026960 Article in a journal. Optics, masers and lasers. English. Germany.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Nečas, David (203 Czech Republic)
      Keywords in English: thin-films; rough film; ellipsometry; spectrophotometry
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/7/2009 09:38.
      More: https://is.muni.cz/publication/798388/en
    14. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD
      SOBOTA, Jaroslav, Vilma BURSIKOVA, Jan GROSSMAN, Tomas FORT, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA and Vratislav PERINA. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
      Name in Czech: Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD
      Name (in English): Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD
      Plasma physics and discharge through gases. English. Taiwan.
      Keywords in English: Optimization; performance; graded amorphous carbon coatings; steel substrates; PECVD
      International impact: yes
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 13/1/2009 14:28.
      More: https://is.muni.cz/publication/808454/en
    15. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
      OHLÍDAL, Ivan, David NEČAS and Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1399–1402. ISSN 1610-1634.
      Name in Czech: Spektroskopická elipsometrie a odrazivost statisticky drsných povrchů vykazující široký interval prostorových frekvencí
      RIV/00216224:14310/08:00025069 Article in a journal. Optics, masers and lasers. English. Germany.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: ellipsometry; spectrophotometry; rough surfaces
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/7/2009 09:40.
      More: https://is.muni.cz/publication/798460/en
    16. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. In 2nd Central European Symposium on Plasma Chemistry. 2008.
      Name in Czech: Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      Name (in English): Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      RIV/00216224:14310/08:00025189 Conference abstract. Plasma physics and discharge through gases. English. Czech Republic.
      Valtr, Miroslav (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Surface; morphology; amorphous hydrocarbon thin films; pulsed radiofrequency discharge
      International impact: yes
      Changed by: Mgr. Adrian Stoica, Ph.D., učo 250983. Changed: 14/1/2009 13:59.
      More: https://is.muni.cz/publication/813598/en
    17. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, vol. 102, No 16, p. 1529-1532. ISSN 0009-2770.
      URL
      Name in Czech: Morfologie povrchu amorfních uhlíkových vrstev s příměsí vodíku deponované v pulzním radiofrekvenčním výboji
      Name (in English): Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      RIV/00216224:14310/08:00024346 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Valtr, Miroslav (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: plasma enhanced chemical vapor deposition;pulsed discharge;atomic force microscopy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 8/12/2008 13:51.
      More: https://is.muni.cz/publication/798200/en

    2007

    1. Atomic force microscopy studies of cross-sections of columnar films
      KLAPETEK, Petr, Ivan OHLÍDAL and Jiří BURŠÍK. Atomic force microscopy studies of cross-sections of columnar films. Measurement Science and Technology. Bristol, England: IOP Publishing, 2007, vol. 18, No 2, p. 528-531. ISSN 0957-0233.
      Name in Czech: Studie řezů sloupcových vrstev pomocí mikroskopie atomové síly
      Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Keywords in English: atomic force microscopy, columnar structure
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 7/3/2008 11:10.
      More: https://is.muni.cz/publication/748026/en
    2. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Angelique BOUSQUET, Agnes GRANIER, Antoine GOULLET and Jiří BURŠÍK. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges. Plasma processes and polymers. Weinheim: Wiley-VCH, 2007, vol. 4, S1, p. S287-S293, 7 pp. ISSN 1612-8850.
      URL
      Name in Czech: Srovnávací studie vrstev připravených z HMDSO/O2 v kontinuálních a pulzních vf výbojích
      RIV/00216224:14310/07:00022256 Article in a journal. Plasma physics and discharge through gases. English. Germany.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Bousquet, Angelique (250 France) -- Granier, Agnes (250 France) -- Goullet, Antoine (250 France) -- Buršík, Jiří (203 Czech Republic)
      Keywords in English: PECVD; hexamethyldisiloxane; oxygen; CCP; ICP
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:57.
      More: https://is.muni.cz/publication/720151/en
    3. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Pavel SŤAHEL, Miloslav OHLÍDAL and David NEČAS. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films. Diamond and Related Materials. New York: Elsevier, 2007, vol. 16, 4-7, p. 1331–1335. ISSN 0925-9635.
      Name in Czech: Korelace tepelné stability mechanických a optických vlasností diamantu podobných uhlíkových vrstev
      RIV/00216224:14310/07:00020890 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Sťahel, Pavel (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic) -- Nečas, David (203 Czech Republic)
      Keywords in English: Thermal stability; Optical constants; Electronic structure; Free-carrier anisotropy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 4/2/2008 18:33.
      More: https://is.muni.cz/publication/755055/en
    4. Deposition and analysis of thin films produced in atmospheric pressure glow discharge
      ŠÍRA, Martin, Vilma BURŠÍKOVÁ, Daniel FRANTA and David TRUNEC. Deposition and analysis of thin films produced in atmospheric pressure glow discharge. In Proceedings of XXVIII International Conference on Phenomena in Ionized Gases. Praha: J.Schmidt, M. Šimek, S.Pekárek, V.Prukner, 2007, p. 713-716. ISBN 978-80-87026-01-4.
      Name in Czech: Depozice a analýza tenkých vrstev vytořených v atmosférickém doutnavém výboji
      RIV/00216224:14310/07:00020440 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Šíra, Martin (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Trunec, David (203 Czech Republic)
      Keywords in English: atmospheric pressure glow discharge thin films
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: Mgr. Martin Šíra, Ph.D., učo 13705. Changed: 6/9/2007 11:08.
      More: https://is.muni.cz/publication/724090/en
    5. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings
      BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Jaroslav SOBOTA, Petr KLAPETEK, Olga BLÁHOVÁ and Vratislav PEŘINA. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, vol. 1, No 10, p. 491-495. ISSN 1842-6573.
      Name in Czech: Depozice a charakterizace nanostrukturovaných diamantu-podobných uhlíkových vrstev obsahujících oxid křemíku
      RIV/00216224:14310/07:00020754 Article in a journal. Plasma physics and discharge through gases. English. Romania.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Dvořák, Pavel (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Janča, Jan (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic) -- Sobota, Jaroslav (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Bláhová, Olga (203 Czech Republic) -- Peřina, Vratislav (203 Czech Republic)
      Keywords in English: Nanostructured coatingsů;DLC;Hardness;Adhesion;Fracture toughness
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Pavel Dvořák, Ph.D., učo 16711. Changed: 3/1/2011 11:26.
      More: https://is.muni.cz/publication/747817/en
    6. Deposition of protective coatings in rf organosilicon discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Zuzana KUČEROVÁ, Daniel FRANTA, Pavel DVOŘÁK, Radek ŠMÍD, Vratislav PEŘINA and Anna MACKOVÁ. Deposition of protective coatings in rf organosilicon discharges. Plasma Sources Science and Technology. Bristol: Institute of Physics Publishing, 2007, vol. 16, No 1, p. S123-S132, 10 pp. ISSN 0963-0252.
      Name in Czech: Depozice ochranných vrstev ve vysokofrekvenčních výbojích v parách organosilikonu
      RIV/00216224:14310/07:00022271 Article in a journal. Plasma physics and discharge through gases. English. United Kingdom of Great Britain and Northern Ireland.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Kučerová, Zuzana (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Dvořák, Pavel (203 Czech Republic) -- Šmíd, Radek (203 Czech Republic) -- Peřina, Vratislav (203 Czech Republic) -- Macková, Anna (203 Czech Republic)
      Keywords in English: CARBON-FILMS; GLOW-DISCHARGES; PLASMA; PECVD; POLYCARBONATE; SUBSTRATE
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Pavel Dvořák, Ph.D., učo 16711. Changed: 3/1/2011 11:26.
      More: https://is.muni.cz/publication/720366/en
    7. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films
      ZAJÍČKOVÁ, Lenka, Monika KARÁSKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films. In New Perspectives of Plasma Science and Technology CD. 1st ed. Brno: VUT Brno, 2007, 1 pp.
      Name in Czech: Depozice a zpracování uhlíkových nanotrubek připravených metodou PECVD za atmosférického tlaku
      Plasma physics and discharge through gases. English. Czech Republic.
      Keywords in English: nanocrystalline diamond; plasma enhanced CVD; hardness; optical constants
      Type of proceedings: pre-proceedings
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 4/1/2009 14:50.
      More: https://is.muni.cz/publication/747143/en
    8. Models of dielectric response in disordered solids
      FRANTA, Daniel, David NEČAS and Lenka ZAJÍČKOVÁ. Models of dielectric response in disordered solids. Optics Express. elektronicky: Optical Society of America, 2007, vol. 15, No 24, p. 16230-16244. ISSN 1094-4087.
      URL
      Name in Czech: Modely dielektrické odezvy neuspořádaných pevných látek
      RIV/00216224:14310/07:00020733 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Nečas, David (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic)
      Keywords in English: Optical constants; Dispersion; Glass and other
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 9/1/2008 12:00.
      More: https://is.muni.cz/publication/747634/en
    9. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers
      ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Daniel FRANTA, Vilma BURŠÍKOVÁ, Jiří BURŠÍK, Pavel SŤAHEL and Petr KLAPETEK. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers. In 18th International Symposium on Plasma Chemistry. Kyoto: International Plasma Chemistry Society, 2007, p. 459.
      Name in Czech: Plazmochemická depozice vrstev z hexametyldisiloxanu a oktametyltetrasiloxanu
      Plasma physics and discharge through gases. English. Japan.
      Keywords in English: PECVD; HMDSO; OMCTS
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 9/1/2008 11:40.
      More: https://is.muni.cz/publication/747827/en
    10. Studium DLC vrstev na plastových substrátech (Study of DLC Coatings Deposited on Plastic Substrates)
      BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Lukáš KELAR, Daniel FRANTA, Petr KLAPETEK and Vratislav PEŘINA. Studium DLC vrstev na plastových substrátech (Study of DLC Coatings Deposited on Plastic Substrates). In VI. ročník konferencie Vrstvy a povlaky 2007. 2007th ed. Rožnov pod Radhoštěm: LISS a.s., 2007, p. 1-4. ISBN 978-80-969310-4-0.
      Name in Czech: Studium DLC vrstev na plastových substrátech
      Name (in English): Study of DLC Coatings Deposited on Plastic Substrates
      RIV/00216224:14310/07:00020899 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Buršík, Jiří (203 Czech Republic) -- Kelar, Lukáš (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Peřina, Vratislav (203 Czech Republic)
      Keywords in English: DLC Coatings; PECVD; Plastic Substrates
      Type of proceedings: post-proceedings
      Changed by: Mgr. Lukáš Kelar, učo 106097. Changed: 8/2/2008 07:47.
      More: https://is.muni.cz/publication/755431/en
    11. Study of Mechanical Properties of NCD Coatings
      BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Monika KARÁSKOVÁ, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Petr KLAPETEK and Olga BLÁHOVÁ. Study of Mechanical Properties of NCD Coatings. In VI. ročník konferencie Vrstvy a povlaky 2007. 1st ed. Rožnov pod Radhoštěm: Liss a.s., 2007, p. 1-4. ISBN 978-80-969310-4-0.
      Name in Czech: Studium mechanických vlastností NCD vrstev
      Name (in English): Study of Mechanical Properties of NCD Coatings
      RIV/00216224:14310/07:00020900 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Buršík, Jiří (203 Czech Republic) -- Karásková, Monika (203 Czech Republic) -- Jašek, Ondřej (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Bláhová, Olga (203 Czech Republic)
      Keywords in English: Mechanical Properties; NCD Coatings;
      Type of proceedings: pre-proceedings
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 8/2/2008 08:02.
      More: https://is.muni.cz/publication/755433/en
    12. Study of thickness reduction of a-C:H thin film under UV light irradiation
      VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Václav DUCHOŇ. Study of thickness reduction of a-C:H thin film under UV light irradiation. In Proceedings of ICPIG XXVIII Conference. Prague: Institute of Plasma Physics AS CR, 2007, p. 761-764. ISBN 978-80-87026-01-4.
      Name in Czech: Studium redukce tlouštky amorfní uhlíkové tenké vrstvy vlivem UV záření
      RIV/00216224:14310/07:00019457 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Valtr, Miroslav (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Duchoň, Václav (203 Czech Republic)
      Keywords in English: Carbon; Oxidation; Optical Properties
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 10/1/2010 17:35.
      More: https://is.muni.cz/publication/722572/en
    13. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Acta Metallurgica Slovaca. Košice, Sloveská republika: Technická univerzita, Košice, 2007, vol. 13, No 6, p. 204-208. ISSN 1335-1532.
      Name in Czech: Studium vlivu nukleační fáze na vlastnosti nanokrystalických diamantových vrstev
      Name (in English): Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      RIV/00216224:14310/07:00019612 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Karásková, Monika (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic, guarantor) -- Jašek, Ondřej (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: nanokrystalline diamond; plasma enhanced CVD; bias enhanced nucleation; hardness
      International impact: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 31/3/2010 07:26.
      More: https://is.muni.cz/publication/756447/en
    14. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Košice, Sloveská republika: Hutnicka fakulta - Technická univerzita v Košiciach, 2007, 321 pp. 6. ISSN 1335-1532.
      Name in Czech: Studium vlivu nukleační fáze na vlastnosti nanokrystalických diamantových vrstev
      Name (in English): Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      Plasma physics and discharge through gases. English. Slovakia.
      Keywords in English: nanocrystalline diamond, plasma enhanced CVD, bias enhanced nucleation, hardness
      Changed by: Mgr. Monika Mervartová, učo 77865. Changed: 7/1/2009 11:20.
      More: https://is.muni.cz/publication/806840/en
    15. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties. In Abstract Booklet of Inernational Conference NANO 07. 1st ed. Brno: VUT Brno, 2007, p. 59-59. ISBN 978-80-214-3460-8.
      Name in Czech: Studium vlivu nukleační fáze na vlastnosti nanokrystalických diamantových vrstev
      Plasma physics and discharge through gases. English. Czech Republic.
      Keywords in English: nanocrystalline diamond; plasma enhanced CVD; bias enhanced nucleation; hardness
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 4/1/2009 14:55.
      More: https://is.muni.cz/publication/747210/en
    16. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
      VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, vol. 1, No 11, p. 620-624. ISSN 1842-6573.
      URL
      Name in Czech: Oxidace a-C:H tenké vrstvy pod UV světlem na vzduchu. Studie poklesu tloušťky
      Name (in English): UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
      RIV/00216224:14310/07:00019537 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Valtr, Miroslav (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Amorphous carbon;Thin film;Optical properties;a-C:H;UV enhanced oxidation;Reflectance spectra
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 4/7/2009 18:59.
      More: https://is.muni.cz/publication/746839/en
    17. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou (Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode)
      KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK and Pavel HÁN. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou (Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode). 2007.
      Name in Czech: Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou
      Name (in English): Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
      RIV/00216224:14330/07:00022688 Patent. Plasma physics and discharge through gases. Czech. Czech Republic. obsah podléhá obchodnímu tajemství.
      Klíma, Miloš (203 Czech Republic, guarantor, belonging to the institution) -- Alberti, Milan (203 Czech Republic, belonging to the institution) -- Svoboda, Tomáš (203 Czech Republic, belonging to the institution) -- Buršíková, Vilma (203 Czech Republic, belonging to the institution) -- Slavíček, Pavel (203 Czech Republic, belonging to the institution) -- Franta, Daniel (203 Czech Republic, belonging to the institution) -- Mazík, Michal (703 Slovakia, belonging to the institution) -- Hán, Pavel (203 Czech Republic, belonging to the institution)
      Keywords in English: polyreactions; plasma chemical polyreactions; modification of macromolecular substances; discharges; plasma jets; atmosperic hollow cathodes
      Changed by: Ing. Zdeňka Rašková, učo 140529. Changed: 29/2/2012 08:29.
      More: https://is.muni.cz/publication/726034/en

    2006

    1. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
      OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids. NORTH-HOLLAND, 2006, vol. 352, 52-54, p. 5633-5641, 8 pp. ISSN 0022-3093.
      URL
      Name in Czech: Srovnání disperzních modelů pro optickou charakterizaci As-S chalkogenidových tenkých vrstev
      RIV/00216224:14310/06:00016388 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Šiler, Martin (203 Czech Republic) -- Vižďa, František (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Jedelský, Jaroslav (203 Czech Republic) -- Omasta, Jaroslav (203 Czech Republic)
      Keywords in English: ellipsometry; chalcogenides
      International impact: yes
      Reviewed: yes
      Changed by: RNDr. JUDr. Vladimír Šmíd, CSc., učo 1084. Changed: 5/8/2008 11:17.
      More: https://is.muni.cz/publication/712430/en
    2. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
      BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Petr KLAPETEK, Olga BLÁHOVÁ, Vratislav PEŘINA and Vladislav NAVRÁTIL. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1st ed. Constanta, Romania: Ovidius University, 2006, p. 101-102, 1 pp. ISBN 978-80-214-3460-8.
      Name in Czech: Depozice a charakterizace nanostrukturovaných SiO modifikovaných diamantu-podobných uhlíkových vrstev
      Name (in English): Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
      RIV/00216224:14410/06:00015921 Proceedings paper. Plasma physics and discharge through gases. English. Romania.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Janča, Jan (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Bláhová, Olga (203 Czech Republic) -- Peřina, Vratislav (203 Czech Republic) -- Navrátil, Vladislav (203 Czech Republic)
      Keywords in English: PECVD; Nanostructured silicon-oxide Containing Diamond-like Carbon; thin films; mechanical properties; tribological properties;RBS; ERDA;
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Vladislav Navrátil, CSc., učo 129. Changed: 25/6/2008 16:50.
      More: https://is.muni.cz/publication/699216/en
    3. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
      ŠÍRA, Martin, David TRUNEC, Pavel SŤAHEL, Vilma BURŠÍKOVÁ and Daniel FRANTA. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge. Czechoslovak Journal of Physics. Praha: Academia Praha, 2006, vol. 56, B, p. 1377-1382. ISSN 0011-4626.
      Name in Czech: Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
      Name (in English): Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
      RIV/00216224:14310/06:00016218 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Šíra, Martin (203 Czech Republic) -- Trunec, David (203 Czech Republic, guarantor) -- Sťahel, Pavel (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Deposition; organic polymers; atmospheric pressure glow discharge
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 31/3/2010 07:52.
      More: https://is.muni.cz/publication/707318/en
    4. Deposition of protective couatings in RF organosilicon discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Zuzana KUČEROVÁ, Angelique BOUSQUET, Antoine GOULLET and Agnes GRANIER. Deposition of protective couatings in RF organosilicon discharges. In In Abstracts of Invited Lectures and Contributed Papers, 18th Europhysics Conference on Atomic and Molecular Physics of Ionized Gases. Piacenza, Italy: European Physical Society, 2006, p. 51-54. ISBN 2-914771-38-X.
      Name in Czech: Depozice ochranných povrchů ve vf. organosilikonových výbojích
      Name (in English): Deposition of protective couatings in RF organosilicon discharges
      RIV/00216224:14310/06:00018304 Proceedings paper. Plasma physics and discharge through gases. English. Italy.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Kučerová, Zuzana (203 Czech Republic) -- Bousquet, Angelique (250 France) -- Goullet, Antoine (250 France) -- Granier, Agnes (250 France)
      Keywords in English: deposition-organosilicon-discharge
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 31/3/2010 18:56.
      More: https://is.muni.cz/publication/708986/en
    5. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge
      TRUNEC, David, Martin ŠÍRA, Pavel SŤAHEL, Vilma BURŠÍKOVÁ and Daniel FRANTA. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge. In 10th International Symposium on High Pressure Low Temperature Plasma Chemistry. Saga, Japan: Saga University, 2006, p. 331-334.
      Name in Czech: Depozice tenkých vrstev za vysších teplot substrátu v atmosférickém doutnavém výboji
      Name (in English): Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge
      RIV/00216224:14310/06:00016224 Proceedings paper. Plasma physics and discharge through gases. English. Japan.
      Trunec, David (203 Czech Republic, guarantor) -- Šíra, Martin (203 Czech Republic) -- Sťahel, Pavel (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: thin films; glow discharge; atmospheric pressure
      Type of proceedings: post-proceedings
      International impact: yes
      Changed by: Mgr. Martin Šíra, Ph.D., učo 13705. Changed: 4/1/2007 12:06.
      More: https://is.muni.cz/publication/707510/en
    6. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX (Nanocrystalline diamond films deposition by PECVD in ASTEX type microwave reactor)
      JAŠEK, Ondřej, Monika KARÁSKOVÁ, Vilma BURŠÍKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Zdeněk FRGALA, Jiřina MATĚJKOVÁ, Antonín REK, Petr KLAPETEK and Jiří BURŠÍK. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX (Nanocrystalline diamond films deposition by PECVD in ASTEX type microwave reactor). In Moderní trendy ve fyzice plazmatu a pevných látek II. 1st ed. Brno: Masarykova univerzita, 2006, p. 133-138. ISBN 80-210-4195-1.
      URL
      Name in Czech: Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX
      Name (in English): Nanocrystalline diamond films deposition by PECVD in ASTEX type microwave reactor
      RIV/00216224:14310/06:00016135 Proceedings paper. Plasma physics and discharge through gases. Czech. Czech Republic.
      Jašek, Ondřej (203 Czech Republic, guarantor) -- Karásková, Monika (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Frgala, Zdeněk (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic) -- Rek, Antonín (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic)
      Keywords in English: nanocrystalline diamond;PECVD; microwave discharge
      Type of proceedings: pre-proceedings
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 2/1/2007 09:30.
      More: https://is.muni.cz/publication/705269/en
    7. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ and Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, vol. 38, No 4, p. 842-846. ISSN 0142-2421.
      Name in Czech: Charakterizace polymerních tenkých vrstev deponovaných na hliníkových vrstvách pomocí kombinované optické metody a mikroskopie atomové síly
      RIV/00216224:14310/06:00016537 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Nepustilová, Růžena (203 Czech Republic) -- Bajer, Svatopluk (203 Czech Republic)
      Keywords in English: ellipsometry; reflectometry; polymer films; AFM
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 31/1/2007 20:18.
      More: https://is.muni.cz/publication/711185/en
    8. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
      FRANTA, Daniel and Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, vol. 8, No 9, p. 763-774. ISSN 1464-4258.
      Name in Czech: Vliv laterálních rozměrů nerovností na optické veličiny drsných povrchů
      RIV/00216224:14310/06:00016538 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: roughness; ellipsometry; spectrophotometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 31/1/2007 20:45.
      More: https://is.muni.cz/publication/711191/en
    9. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias
      BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Jiří BURŠÍK, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Jiřina MATĚJKOVÁ, Antonín REK, Daniel FRANTA and Petr KLAPETEK. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias. In E-MRS 2006 Fall meeting. 1st ed. Warsaw: EMRS, 2006, p. 14-14. ISBN 83-89-585-09-X.
      Name in Czech: Mechanické vlastnosti nanostrukturovaných kompozitních diamantových vrstev připravených plazmovou depozicí podpořenou vysokofrekvenčně indukaném stejnosměrném předpětí
      Name (in English): Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias
      RIV/00216224:14310/06:00015918 Proceedings paper. Plasma physics and discharge through gases. English. Poland.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Frgala, Zdeněk (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic) -- Jašek, Ondřej (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Karásková, Monika (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic) -- Rek, Antonín (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: nanostructures; composites; diamond films; PECVD; RF induced DC self bias voltage
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 23/10/2006 18:12.
      More: https://is.muni.cz/publication/699195/en
    10. Mechanické vlastnosti nanokrystalických diamantových vrstev (Mechanical properties of nanocrystaline diamond films)
      BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jiří BURŠÍK, Olga BLÁHOVÁ, Petr KLAPETEK and Jiřina MATĚJKOVÁ. Mechanické vlastnosti nanokrystalických diamantových vrstev (Mechanical properties of nanocrystaline diamond films). In Vrstvy a povlaky 2006. 1st ed. Rožnov pod Radhoštěm: Liss a.s., 2006, p. 1-6. ISBN 80-969310-2-4.
      Name in Czech: Mechanické vlastnosti nanokrystalických diamantových vrstev.
      Name (in English): Mechanical properties of nanocrystaline diamond films
      RIV/00216224:14310/06:00015924 Proceedings paper. Plasma physics and discharge through gases. English. Czech Republic.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Frgala, Zdeněk (203 Czech Republic) -- Jašek, Ondřej (203 Czech Republic) -- Karásková, Monika (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic) -- Bláhová, Olga (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic)
      Keywords in English: Mechanical properties of nanocrystaline diamond films
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 31/3/2010 19:19.
      More: https://is.muni.cz/publication/699236/en
    11. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation
      FRGALA, Zdeněk, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ, Antonin REK, Petr KLAPETEK and Jiří BURŠÍK. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation. Czechoslovak Journal of Physics B. Praha: Institute of Physics, AV ČR, 2006, vol. 56, No 1, p. B1218-B1223, 6 pp. ISSN 0011-4626.
      Name in Czech: Depozice nanokystalickéhi diamantu metodou mikrovlnného PECVD s nukleací pomocí rf predpětí
      RIV/00216224:14310/06:00015900 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Frgala, Zdeněk (203 Czech Republic, guarantor) -- Jašek, Ondřej (203 Czech Republic) -- Karásková, Monika (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Matějková, Jiřina (203 Czech Republic) -- Rek, Antonin (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic)
      Keywords in English: nanocrystalline diamond; plasma enhanced chemical vapor deposition; self-bias
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Ondřej Jašek, Ph.D., učo 8533. Changed: 11/12/2006 13:27.
      More: https://is.muni.cz/publication/698650/en
    12. Modeling of DLC Optical Properties Based on Parameterization of Density of States
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Vilma BURŠÍKOVÁ. Modeling of DLC Optical Properties Based on Parameterization of Density of States. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 39-50.
      Name in Czech: Modeling of DLC Optical Properties Based on Parameterization of Density of States
      Name (in English): Modeling of DLC Optical Properties Based on Parameterization of Density of States
      RIV/00216224:14310/06:00016281 Proceedings paper. Plasma physics and discharge through gases. English. Indonesia.
      Franta, Daniel (203 Czech Republic) -- Nečas, David (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic, guarantor)
      Keywords in English: Modeling of DLC Optical Properties Based on Parameterization Density of States
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 11/1/2007 14:25.
      More: https://is.muni.cz/publication/708573/en
    13. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Thomas BEGOU, Angelique BOUSQUET, Agnes GRANIER, Bruno BECHE and Antoine GOULLET. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states. In 4th Workshop Ellipsometry. 2006th ed. Berlin: Uwe Beck, 2006, p. 110-111, 1 pp. ISBN 3-00-018751-0.
      Name in Czech: Modelovani optickych konstant organosilikonovych vrstev pomoci paramtrizave hustoty stavu
      Name (in English): Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
      RIV/00216224:14310/06:00018470 Proceedings paper. Plasma physics and discharge through gases. English. Germany.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Begou, Thomas (250 France) -- Bousquet, Angelique (250 France) -- Granier, Agnes (250 France) -- Beche, Bruno (250 France) -- Goullet, Antoine (250 France)
      Keywords in English: optical-konstant-organosilicon-density-states
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 25/1/2007 22:04.
      More: https://is.muni.cz/publication/710460/en
    14. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
      VALTR, Miroslav, Ivan OHLÍDAL and Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, 56/2006, Suppl. B, p. 1103 - 1109. ISSN 0011-4626.
      Name in Czech: Optická charakterizace uhlíkových vrstev připravených metodou PECVD pomocí elipsometrie a reflektometrie
      RIV/00216224:14310/06:00015814 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Valtr, Miroslav (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: plasma discharge; PECVD; ellipsometry; reflectometry; plasma
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 4/7/2009 17:58.
      More: https://is.muni.cz/publication/694025/en
    15. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
      BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, O. BLÁHOVÁ, V. PEŘINA and P. KLAPETEK. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 311-315.
      Name in Czech: Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
      Name (in English): Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
      RIV/00216224:14310/06:00016282 Proceedings paper. Plasma physics and discharge through gases. English. Indonesia.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Dvořák, Pavel (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Janča, Jan (203 Czech Republic) -- Buršík, Jiří (203 Czech Republic) -- Bláhová, O. (203 Czech Republic) -- Peřina, V. (203 Czech Republic) -- Klapetek, P. (203 Czech Republic)
      Keywords in English: PECVD; DLC; mechanical properties; adhesion; thermal stability
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 8/2/2008 19:08.
      More: https://is.muni.cz/publication/708581/en
    16. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
      BURŠÍKOVÁ, Vilma, Nihar Ranjan RAY, O. BLÁHOVÁ, J. JAŠEK, Z. FRGALA, L. ZAJÍČKOVÁ, D. FRANTA, J. BURŠÍK and P. KLAPETEK. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 27-37.
      Name in Czech: Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
      Name (in English): Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
      RIV/00216224:14310/06:00016280 Proceedings paper. Plasma physics and discharge through gases. English. Indonesia.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Ray, Nihar Ranjan (356 India) -- Bláhová, O. (203 Czech Republic) -- Jašek, J. (203 Czech Republic) -- Frgala, Z. (20 Andorra) -- Zajíčková, L. (203 Czech Republic) -- Franta, D. (203 Czech Republic) -- Buršík, J. (203 Czech Republic) -- Klapetek, P. (203 Czech Republic)
      Keywords in English: PECVD; DLC; diamond; mechanical properties; adhesion
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 11/1/2007 14:30.
      More: https://is.muni.cz/publication/708564/en

    2005

    1. AFM Study of Hydrocarbon Thin Films
      VALTR, Miroslav, Ivan OHLÍDAL and Petr KLAPETEK. AFM Study of Hydrocarbon Thin Films. In WDS'05 Proceedings of Contributed Papers: Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha: Matfyzpress, 2005, p. 391-396. ISBN 80-86732-59-2.
      Name in Czech: AFM studie uhlíkových tenkých vrstev
      Plasma physics and discharge through gases. English. Czech Republic.
      Keywords in English: plasma;polymer;films;argon;acetylene;pecvd;pulsed;radio frequency;discharge;afm;rough boundary
      Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 19/5/2009 16:58.
      More: https://is.muni.cz/publication/589066/en
    2. Application of the wavelet transformation in AFM data analysis
      KLAPETEK, Petr and Ivan OHLÍDAL. Application of the wavelet transformation in AFM data analysis. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 295-303. ISSN 0323-0465.
      Name in Czech: Aplikace waveletové transformace při analýze AFM dat
      RIV/00216224:14310/05:00013548 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor)
      Keywords in English: AFM; Wavelet transform
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 18:33.
      More: https://is.muni.cz/publication/630336/en
    3. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
      KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces. In Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range. Weinheim 2005: Wiley-VCH Verlag GmbH and Co. KGaA, 2005, p. 452-462. ISBN 3-527-40502-X.
      Name in Czech: Vliv hrotu mikroskopu atomové síly na fraktálovou a multi-fraktálovou analýzu vlastností náhodně drsných povrchů
      RIV/00216224:14310/05:00015082 Proceedings paper. Solid-state physics and magnetism. English. Germany.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Bílek, Jindřich (203 Czech Republic)
      Keywords in English: AFM
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 20:00.
      More: https://is.muni.cz/publication/630345/en
    4. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
      KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI and Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 53-57. ISSN 0042-207X.
      Name in Czech: Analýza morfologie horních rozhraní vrstev GaN připravených pomocí MOCVD s využitím mikroskopie atomové síly
      RIV/00216224:14310/05:00015079 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Montaigne Ramil, Alberto (192 Cuba) -- Bonnanni, Alberta (380 Italy) -- Sitter, Helmut (40 Austria)
      Keywords in English: Roughness; AFM; GaN films
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 17:44.
      More: https://is.muni.cz/publication/630333/en
    5. Combination of optical methods and atomic force microscopy at characterization of thin film systems
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 271-294. ISSN 0323-0465.
      URL
      Name in Czech: Kombinace optických metod a mikroskopie atomové síly pro zkoumání systémů tenkých vrstev
      RIV/00216224:14330/05:00013181 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Roughness; Ellipsometry; Spectrophotometry; AFM
      Changed by: RNDr. JUDr. Vladimír Šmíd, CSc., učo 1084. Changed: 27/4/2006 19:52.
      More: https://is.muni.cz/publication/621521/en
    6. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
      FRANTA, Daniel and Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, vol. 248, No 1, p. 459-467. ISSN 0030-4018.
      URL
      Name in Czech: Srovnání teorie efektivního prostředí a Rayleigho-Riceovy teorie týkající se elipsometrického studia drsných povrchů
      RIV/00216224:14310/05:00013547 Article in a journal. Optics, masers and lasers. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: Roughness; Ellipsometry; EMA; RRT
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:18.
      More: https://is.muni.cz/publication/621520/en
    7. Digital two-wavelength holographic interference microscopy for surface roughness measurement
      OHLÍDAL, Miloslav, L. ŠÍR, M. JÁKL and Ivan OHLÍDAL. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In Proceedings of SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59450I-1-59450I-8, 8 pp. ISBN 0-8194-5958-8.
      Name in Czech: Digitální dvousvazková holografická interferenční mikroskopie měření drsností povrchů
      RIV/00216224:14310/05:00013301 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Miloslav (203 Czech Republic) -- Šír, L. (203 Czech Republic) -- Jákl, M. (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor)
      Keywords in English: Holography; Interference; Surface roughness; Metrology
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 2/3/2006 15:21.
      More: https://is.muni.cz/publication/630443/en
    8. Ellipsometry in characterization of thin films
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005, p. 81-111. ISBN 80-223-2099-4.
      URL
      Name in Czech: Elipsometrie při charakterizaci tenkých vrstev
      RIV/00216224:14330/05:00013302 Proceedings paper. Solid-state physics and magnetism. English. Slovakia.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Ellipsometry; Thin films
      Changed by: RNDr. JUDr. Vladimír Šmíd, CSc., učo 1084. Changed: 27/4/2006 19:55.
      More: https://is.muni.cz/publication/630449/en
    9. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films
      JAN, Mistrík, Ivan OHLÍDAL, Roman ANTOŠ, Mitsuru AOYAMA and Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 51-54. ISSN 0169-4332.
      Name in Czech: Důkaz změny indexu lomu ve skleněných podložkách indukovanou deposicí SiO2 vrstev reaktivním plátováním s vysokou hustotou
      RIV/00216224:14310/05:00015081 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Jan, Mistrík (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Antoš, Roman (203 Czech Republic) -- Aoyama, Mitsuru (392 Japan) -- Yamaguchi, Tomuo (392 Japan)
      Keywords in English: ellipsometry; reflectometry; ion plating; SiO2/glass interface; change of refractive index; plasma-assisted deposition; Schott B270
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 19:41.
      More: https://is.muni.cz/publication/630338/en
    10. Characterization of optical thin films exhibiting defects
      FRANTA, Daniel and Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59632H-1-59632H-12, 12 pp. ISBN 0-8194-5981-X.
      URL
      Name in Czech: Charakterizace optických tenkých vrstev vykazující defekty
      RIV/00216224:14330/05:00013207 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: ellipsometry; spectrophotometry; thin films; roughness; refractive index profile
      Changed by: RNDr. JUDr. Vladimír Šmíd, CSc., učo 1084. Changed: 27/4/2006 19:54.
      More: https://is.muni.cz/publication/621764/en
    11. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating
      BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Pavel DVOŘÁK, Daniel FRANTA, Vratislav PEŘINA and Jan JANČA. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating. In International Conference ELMECO-5, Book of Abstracts. Lublin, Poland: Lublin University of Technology, 2005, p. 18. ISBN 83-89868-23-7.
      Name in Czech: Vliv přísad křemíku, kyslíku a dusíku na vlastnosti amorfních diamantu-podobných uhlíkových vrstev
      RIV/00216224:14310/05:00012630 Proceedings paper. Plasma physics and discharge through gases. English. Poland.
      Buršíková, Vilma (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Dvořák, Pavel (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Peřina, Vratislav (203 Czech Republic) -- Janča, Jan (203 Czech Republic)
      Keywords in English: DLC; protective coatings; PECVD
      International impact: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 15:52.
      More: https://is.muni.cz/publication/575941/en
    12. Influence of technological conditions on mechanical stresses inside diamond-like carbon films
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ, Petr KLAPETEK and Kateřina PÁLENÍKOVÁ. Influence of technological conditions on mechanical stresses inside diamond-like carbon films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, vol. 14, 11-12, p. 1835-1838. ISSN 0925-9635.
      URL
      Name in Czech: Vliv technologických podmínek na mechanické pnutí v diamantu podobných vrstvách
      RIV/00216224:14310/05:00014248 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Ohlídal, Miloslav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Čudek, Vlastimil (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Páleníková, Kateřina (203 Czech Republic)
      Keywords in English: intrisic stress; DLC; PECVD
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 8/2/2008 19:27.
      More: https://is.muni.cz/publication/593787/en
    13. Influence of the temperature on properties of plasma polymerised organosilicon coatings
      KUČEROVÁ, Zuzana, Vilma BURŠÍKOVÁ, Vratislav PEŘINA, Daniel FRANTA, Lenka ZAJÍČKOVÁ, Jan ČECH and Jana FRANCLOVÁ. Influence of the temperature on properties of plasma polymerised organosilicon coatings. In 15th Symposium on applications of plasma processes. Bratislava: Univerzita Komenského, 2005, p. 197-198. ISBN 80-223-2018-8.
      Name in Czech: Vliv teploty na vlastnosti plazmových polymerních vrstev z organosilanů
      RIV/00216224:14310/05:00013629 Proceedings paper. Plasma physics and discharge through gases. English. Slovakia.
      Kučerová, Zuzana (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic, guarantor) -- Peřina, Vratislav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Čech, Jan (203 Czech Republic) -- Franclová, Jana (203 Czech Republic)
      Keywords in English: coatings
      Changed by: doc. RNDr. Vilma Buršíková, Ph.D., učo 2418. Changed: 23/2/2006 11:49.
      More: https://is.muni.cz/publication/568106/en
    14. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody (Measurement of mechanical stress in thin films using combined optical method)
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ and Martin ŠILER. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody (Measurement of mechanical stress in thin films using combined optical method). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, No 3, p. 72-75. ISSN 0447-6441.
      URL
      Name (in English): Measurement of mechanical stress in thin films using combined optical method
      RIV/00216224:14310/05:00012755 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Ohlídal, Miloslav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Čudek, Vlastimil (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Šiler, Martin (203 Czech Republic)
      Keywords in English: DLC thin films; mechanical stress; double-beam interferometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 7/2/2006 20:36.
      More: https://is.muni.cz/publication/588304/en
    15. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (Measurement of nanoroughness using optical methods and atomic force microscopy)
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (Measurement of nanoroughness using optical methods and atomic force microscopy). In Kvalita a GPS 2005. Brno: Subkomise metrologie při TNK 7, 2005, p. 131-139. ISBN 80-214-3033-8.
      URL
      Name (in English): Measurement of nanoroughness using optical methods and atomic force microscopy
      RIV/00216224:14310/05:00013550 Proceedings paper. Solid-state physics and magnetism. Czech. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Drsnost; AFM; Elipsometrie; Odrazivost
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 2/3/2006 14:42.
      More: https://is.muni.cz/publication/630447/en
    16. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
      ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, vol. 52, No 4, p. 583-602. ISSN 0950-0340.
      URL
      Name in Czech: Optická charakterizace dvojvrstev obsahující eptaxní ZnSe a ZnTe vrstvy
      RIV/00216224:14310/05:00013026 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Šiler, Martin (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: ellipsometry; spectrophotometry; epitaxial layer
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:42.
      More: https://is.muni.cz/publication/605344/en
    17. Optical characterization of non-uniform thin films using imaging spectrophotometry
      OHLÍDAL, Miloslav, Vladimír ČUDEK, Ivan OHLÍDAL and Petr KLAPETEK. Optical characterization of non-uniform thin films using imaging spectrophotometry. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 596329-1-596329-9, 9 pp. ISBN 0-8194-5981-X.
      Name in Czech: Optická charakterizace neuniformních tenkých vrstev pomocí zobrazovací spektrofotometrie
      RIV/00216224:14310/05:00013299 Proceedings paper. Optics, masers and lasers. English. United States of America.
      Ohlídal, Miloslav (203 Czech Republic, guarantor) -- Čudek, Vladimír (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Non-uniforn Thin Films; Imaging Spectrophotometry; Epitaxial ZnSe Thin Films
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 19:40.
      More: https://is.muni.cz/publication/630337/en
    18. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
      FRANTA, Daniel, Ivan OHLÍDAL, Jan MISTÍK, Tomuo YAMAGUCHI, Gu Jin HU and Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 338-342. ISSN 0169-4332.
      URL
      Name in Czech: Optická charakterizace tenkých vrstev PZT deponovaných sol-gel metodou pomocí spektroskopické elipsometrie a měření odrazivosti v blízké UV a viditelé oblasti
      RIV/00216224:14310/05:00014764 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Mistík, Jan (203 Czech Republic) -- Yamaguchi, Tomuo (392 Japan) -- Hu, Gu Jin (156 China) -- Dai, Ning (156 China)
      Keywords in English: PZT films; Optical constants; Ellipsometry; Reflectometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:43.
      More: https://is.muni.cz/publication/621464/en
    19. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
      FRANTA, Daniel, Ivan OHLÍDAL and David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 159-162. ISSN 0042-207X.
      URL
      Name in Czech: Optická charakterizace tenkých vrstev TiO2 pomocí kombinované metody spektroskopické elipsometrie a spektroskopické fotometrie
      RIV/00216224:14310/05:00014797 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Petrýdes, David (203 Czech Republic)
      Keywords in English: TiO2 films; optical constants; ellipsometry; photometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 7/2/2006 19:46.
      More: https://is.muni.cz/publication/621749/en
    20. Optical measurement of mechanical stresses in diamond-like carbon films
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ and Petr KLAPETEK. Optical measurement of mechanical stresses in diamond-like carbon films. In 8-th International Symposium on Laser Metrology. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 717-728. ISBN 0-8194-5757-4.
      URL
      Name in Czech: Optické měření mechanického napětí v diamatu podobných vrstvách
      RIV/00216224:14310/05:00013025 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Ohlídal, Miloslav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Čudek, Vladimír (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: DLC films; mechanical stress; two-beam interferometry; chromatic aberration method
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:44.
      More: https://is.muni.cz/publication/605326/en
    21. Optical properties of NiO thin films prepared by pulsed laser deposition technique
      FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK and Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 426-430. ISSN 0169-4332.
      URL
      Name in Czech: Optické vlastnosti tekých NiO vrstev připravených pomocí pulzní laserové depoziční metody
      RIV/00216224:14310/05:00014765 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Negulescu, Beatrice (642 Romania) -- Thomas, Luc (250 France) -- Dahoo, Pierre Richard (250 France) -- Guyot, Marcel (250 France) -- Ohlídal, Ivan (203 Czech Republic) -- Mistrík, Jan (203 Czech Republic) -- Yamaguchi, Tomuo (392 Japan)
      Keywords in English: NiO films; Optical constants; Ellipsometry; Reflectometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:45.
      More: https://is.muni.cz/publication/621484/en
    22. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
      MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU and Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 431-434. ISSN 0169-4332.
      URL
      Name in Czech: Optické vlastnosti jemně drsných tenkých vrstev LaNiO3 studovaných spektroskopickou elipsometrií a reflektometrií
      RIV/00216224:14310/05:00014774 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Mistrík, Jan (203 Czech Republic) -- Yamaguchi, Tomuo (392 Japan) -- Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Hu, Gu Jin (156 China) -- Dai, Ning (156 China)
      Keywords in English: Ellipsometry; Reflectometry; Optical constants; LNO; LaNiO3
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:48.
      More: https://is.muni.cz/publication/621519/en
    23. Scanning thermal microscopy - theory and applications
      KLAPETEK, Petr, Ivan OHLÍDAL and Jiří BURŠÍK. Scanning thermal microscopy - theory and applications. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, 11-12, p. 327-329. ISSN 0447-6441.
      Name in Czech: Rastrovací termální mikroskopie - teorie a aplikace
      RIV/00216224:14310/05:00013549 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Buršík, Jiří (203 Czech Republic)
      Keywords in English: Scanning thermal microscopy
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 19:38.
      More: https://is.muni.cz/publication/630344/en
    24. Spectroscopic ellipsometry of sinusoidal surface-relief gratings
      ANTOŠ, Roman, Ivan OHLÍDAL, Daniel FRANTA, Petr KLAPETEK, Jan MISTÍK, Tomuo YAMAGUCHI and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry of sinusoidal surface-relief gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 221-224. ISSN 0169-4332.
      URL
      Name in Czech: Spektroskopická elipsometrie sinusoidálních reliéfních mřížek
      RIV/00216224:14310/05:00013177 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Antoš, Roman (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Mistík, Jan (203 Czech Republic) -- Yamaguchi, Tomuo (392 Japan) -- Višňovský, Štefan (203 Czech Republic)
      Keywords in English: Optical metrology; Spekroscopic ellipsometry; Sinusoidal gratings; Wood anomaly; RCWA; Incoherent light
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:49.
      More: https://is.muni.cz/publication/621445/en
    25. Spectroscopic ellipsometry on lamellar gratings
      ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 225-229. ISSN 0169-4332.
      Name in Czech: Spektroskopická elipsometrie na lamelárních mřížkách
      RIV/00216224:14310/05:00013300 Article in a journal. Optics, masers and lasers. English. United States of America.
      Antoš, Roman (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Mistrík, Jan (203 Czech Republic) -- Murakami, K. (392 Japan) -- Yamaguchi, Tomuo (392 Japan) -- Pištora, J. (203 Czech Republic) -- Horie, M. (392 Japan) -- Višňovský, Štefan (203 Czech Republic)
      Keywords in English: optical metrology; scatterometry; spectroscopic ellipsometry; diffraction grating; wood anomaly; RCWA
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 19:25.
      More: https://is.muni.cz/publication/630341/en
    26. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
      ANTOŠ, Roman, Jaromír PIŠTORA, Ivan OHLÍDAL, Kamil POSTAVA, Jan MISTRÍK, Tomuo YAMAGUCHI and Štefan VIŠŇOVSKÝ. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate. Journal of Applied Physics. USA: American Institute of Physics, 2005, vol. 97, No 5, p. 053107-1-053107-7, 7 pp. ISSN 0021-8979.
      Name in Czech: Zrcadlová spektroskopická elipsometrie pro monitorování kritické velikosti mřížek vyrobených na tlustých transparentních substrátech
      RIV/00216224:14310/05:00013296 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Antoš, Roman (203 Czech Republic) -- Pištora, Jaromír (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Postava, Kamil (203 Czech Republic) -- Mistrík, Jan (203 Czech Republic) -- Yamaguchi, Tomuo (392 Japan) -- Višňovský, Štefan (203 Czech Republic)
      Keywords in English: Ellipsometry; Gratings
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 13:55.
      More: https://is.muni.cz/publication/630309/en
    27. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Lenka ZAJÍČKOVÁ and Pavel SŤAHEL. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, vol. 14, 11-12, p. 1795-1798. ISSN 0925-9635.
      URL
      Name in Czech: Termální stabilita optických vlastností diamantu podobných uhlíkových vrstev připravených plazmochemickou depozicí
      RIV/00216224:14310/05:00014247 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic) -- Sťahel, Pavel (203 Czech Republic)
      Keywords in English: DLC; Thermal stability; optical properties; sp3/sp2 ratio
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:57.
      More: https://is.muni.cz/publication/593764/en

    2004

    1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
      KLAPETEK, Petr, Ivan OHLÍDAL and Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, vol. 147, No 3, p. 175-180. ISSN 0026-3672.
      Name in Czech: Analýza statistické drsnosti povrchů GaAs vzniklých termickou oxidací pomocí mikroskopie atomové síly
      RIV/00216224:14310/04:00011769 Article in a journal. Solid-state physics and magnetism. English. Austria.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: THIN-FILMS; OPTICAL-PROPERTIES; OXIDE FILM; TIO2; BOUNDARIES; INTERFACE; SINGLE; LAYERS
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Karel Navrátil, CSc., učo 1646. Changed: 13/2/2007 16:28.
      More: https://is.muni.cz/publication/562896/en
    2. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 399-403. ISSN 0040-6090.
      URL
      Name in Czech: Úplná charakterizace drsných polymorfních křemíkových vrstev pomocí mikroskopie atomové síly a kombinované metody spektroskopické elipsometrie a spektroskopické reflektometrie
      RIV/00216224:14310/04:00010139 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Roca i Cabarrocas, Pere (250 France)
      Keywords in English: Ellipsometry; Reflection; Optical properties; Polymorphous materials
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:50.
      More: https://is.muni.cz/publication/555840/en
    3. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, vol. 36, No 8, p. 1203-1206. ISSN 0142-2421.
      URL
      Name in Czech: Charakterizace tenkých oxidových vrstev na GaAs podložkách pomocí optických metod a mikroskopie atomové síly
      RIV/00216224:14310/04:00010692 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic)
      Keywords in English: THERMAL-OXIDATION; ROUGH BOUNDARIES; LAYERS
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:51.
      More: https://is.muni.cz/publication/562878/en
    4. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films
      OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, vol. 6, No 1, p. 139-148. ISSN 1454-4164.
      URL
      Name in Czech: Vliv složení, exposice a tepelného zahřívání na optické vlastnosti tenkých vrstev As-S chalkogenidů
      RIV/00216224:14310/04:00011460 Article in a journal. Solid-state physics and magnetism. English. Romania.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Frumar, Miroslav (203 Czech Republic) -- Jedelský, Jaroslav (203 Czech Republic) -- Omasta, Jaroslav (203 Czech Republic)
      Keywords in English: As-S chalcogenide films; Ellipsometry; Combined spectrophotometric method; Amorphous materials; Optical constants
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 09:05.
      More: https://is.muni.cz/publication/555827/en
    5. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
      KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.
      Name in Czech: Vliv
      RIV: Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Bílek, Jindřich (203 Czech Republic)
      Keywords in English: Roughness; AFM
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 15/8/2005 18:25.
      More: https://is.muni.cz/publication/574146/en
    6. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ and Martin ŠILER. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O. In SPIE's 49th Annual Meeting. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2004, p. 139-147. ISBN 0-8194-5465-6.
      URL
      Name in Czech: Mechanická napětí v diamantu podobných uhlíkových vrstvách obsahující Si a O studovaná pomocí optických metod
      RIV/00216224:14310/04:00010888 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Ohlídal, Miloslav (203 Czech Republic) -- Franta, Daniel (203 Czech Republic) -- Čudek, Vladimír (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Šiler, Martin (203 Czech Republic)
      Keywords in English: DLC films; mechanical stress; two-beam interferometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:57.
      More: https://is.muni.cz/publication/565712/en
    7. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
      FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 393-398. ISSN 0040-6090.
      URL
      Name in Czech: Optické vlastnosti diamantu podobných uhlíkových vrstev obsahujících SiOx studované kombinovanou optickou metodou spektroskopické elipsometrie a spektroskopické reflektometrie
      RIV/00216224:14310/04:00010137 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic)
      Keywords in English: Ellipsometry; Reflection; Optical properties; Amorphous materials
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 16/2/2005 17:55.
      More: https://is.muni.cz/publication/555829/en
    8. Optical properties of ZnTe films prepared by molecular beam epitaxy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, vol. 468, 1-2, p. 193-202. ISSN 0040-6090.
      URL
      Name in Czech: Optické vlastnosti vrstev ZnTe připravených molekulovou svazkovou epitaxií
      RIV/00216224:14310/04:00010693 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: THIN-FILMS; ROUGH BOUNDARIES; SUBSTRATE; GAAS; DEPENDENCE; CONSTANTS
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 3/2/2006 17:59.
      More: https://is.muni.cz/publication/562879/en

    2003

    1. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films)
      OHLÍDAL, Ivan, Petr KLAPETEK and Daniel FRANTA. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 97-100. ISSN 0009-0700.
      URL
      Name (in English): Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films
      RIV/00216224:14310/03:00008098 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: AFM; ZnSe; ZnTe
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:15.
      More: https://is.muni.cz/publication/487577/en
    2. Atomic force microscopy characterization of ZnTe epitaxial films
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.
      URL
      RIV/00216224:14310/03:00009017 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: OPTICAL METHODS; THIN-FILMS; GOLD
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:17.
      More: https://is.muni.cz/publication/489711/en
    3. Atomic force microscopy characterization of ZnTe epitaxial thin films
      KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, vol. 42, 7B, p. 4706-4709, 5 pp. ISSN 0021-4922.
      RIV/00216224:14310/03:00008287 Article in a journal. Solid-state physics and magnetism. English. Japan.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: ZnTe epitaxial films; AFM analysis; faceted boundaries
      Changed by: Mgr. Petr Klapetek, Ph.D., učo 11111. Changed: 12/11/2003 15:29.
      More: https://is.muni.cz/publication/490021/en
    4. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model
      FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2003, 212-213, No 1, p. 116-121. ISSN 0169-4332.
      URL
      RIV/00216224:14310/03:00008103 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Jedelský, Jaroslav (203 Czech Republic)
      Keywords in English: Dispersion model of the optical constants; Amorphous solids; Chalcogenide thin films
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:20.
      More: https://is.muni.cz/publication/487590/en
    5. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Petr KLAPETEK, Vladimír ČUDEK and Miloš JÁKL. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry. Proceedings of SPIE. Bellingham: SPIE, 2003, vol. 5182, No 2, p. 260-271, 11 pp. ISSN 0277-786X.
      RIV/00216224:14310/03:00008532 Article in a journal. Optics, masers and lasers. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Ohlídal, Miloslav (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Čudek, Vladimír (203 Czech Republic) -- Jákl, Miloš (203 Czech Republic)
      Keywords in English: fims nonuniform in optical parameters; optical characterization
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 20/12/2004 12:02.
      More: https://is.muni.cz/publication/493197/en
    6. Mikroskopie magnetické síly: Aplikace při studiu pevných disků (Magnetic Force Microscopy: Application at study of hard disks)
      ŠILER, Martin, Ivan OHLÍDAL and Petr KLAPETEK. Mikroskopie magnetické síly: Aplikace při studiu pevných disků (Magnetic Force Microscopy: Application at study of hard disks). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 124-127. ISSN 0009-0700.
      Name (in English): Magnetic Force Microscopy: Application at study of hard disks
      Optics, masers and lasers. Czech. Czech Republic.
      Keywords in English: Mikroskopie magnetické síly; Magnetic Force microscopy; MFM; AFM
      Changed by: Mgr. Martin Šiler, Ph.D., učo 14410. Changed: 6/11/2003 15:10.
      More: https://is.muni.cz/publication/489945/en
    7. New Dispersion Model of the Optical Constants of the DLC Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 5, p. 373-384. ISSN 0323-0465.
      URL
      RIV/00216224:14310/03:00008252 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: Diamond-like Carbon; Ellipsometry; Dispersion Model
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 28/11/2004 18:18.
      More: https://is.muni.cz/publication/489710/en
    8. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, Miloš JÁKL, Vladimír ČUDEK and Marek ELIÁŠ. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, vol. 42, 7B, p. 4760-4765, 5 pp. ISSN 0021-4922.
      RIV/00216224:14310/03:00008288 Article in a journal. Solid-state physics and magnetism. English. Japan.
      Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Jákl, Miloš (203 Czech Republic) -- Čudek, Vladimír (203 Czech Republic) -- Eliáš, Marek (203 Czech Republic)
      Keywords in English: films nonuniform in optical parameters; optical characterization; CN_x and SiO_y mixture films
      Changed by: Mgr. Marek Eliáš, Ph.D., učo 16171. Changed: 9/8/2005 11:36.
      More: https://is.muni.cz/publication/490025/en
    9. Optical constants of ZnTe and ZnSe epitaxial thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465.
      URL
      RIV/00216224:14310/03:00008102 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:24.
      More: https://is.muni.cz/publication/487588/en
    10. Optical characterization of ZnSe thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003, p. 831-832. ISBN 0-8194-4596-7.
      URL
      RIV/00216224:14310/03:00009333 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: ZnSe; Optical constants; Ellipsometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 2/2/2005 19:59.
      More: https://is.muni.cz/publication/491338/en
    11. Optical properties of diamond-like carbon films containing SiOx
      FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, vol. 12, No 9, p. 1532-1538. ISSN 0925-9635.
      URL
      RIV/00216224:14310/03:00008251 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Buršíková, Vilma (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic)
      Keywords in English: Ellipsometry; Density of States; Diamond-like carbon; Silicon
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:57.
      More: https://is.muni.cz/publication/489708/en
    12. Srovnání snímků NSOM a AFM při studiu vybraných objektů (Comparison of NSOM and AFM images of chosen samples)
      KLAPETEK, Petr and Ivan OHLÍDAL. Srovnání snímků NSOM a AFM při studiu vybraných objektů (Comparison of NSOM and AFM images of chosen samples). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 47, 6-7s, p. 79-81. ISSN 0009-0700.
      Name (in English): Comparison of NSOM and AFM images of chosen samples
      RIV/00216224:14310/03:00008191 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Klapetek, Petr (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: NSOM; AFM
      Changed by: Mgr. Petr Klapetek, Ph.D., učo 11111. Changed: 30/9/2003 09:15.
      More: https://is.muni.cz/publication/488940/en
    13. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
      KLAPETEK, Petr and Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy. Amsterdam: Elsevier, 2003, vol. 94, No 1, p. 19-29. ISSN 0304-3991.
      RIV/00216224:14310/03:00007965 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor)
      Keywords in English: columnar films; atomic force microscopy
      Changed by: Mgr. Petr Klapetek, Ph.D., učo 11111. Changed: 30/9/2003 08:53.
      More: https://is.muni.cz/publication/485221/en

    2002

    1. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA and Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 559-564. ISSN 0142-2421.
      URL
      RIV/00216224:14310/02:00006294 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Pokorný, Pavel (203 Czech Republic)
      Keywords in English: ZrO2 and Hfo2 films; AFM; optical methods; rough upper boundaries
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 18/12/2003 15:20.
      More: https://is.muni.cz/publication/404727/en
    2. Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků (Applications of magnetic force microscopy for studying hard disk storage media)
      ŠILER, Martin, Petr KLAPETEK and Ivan OHLÍDAL. Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků (Applications of magnetic force microscopy for studying hard disk storage media). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 216-219. ISSN 0447-6441.
      Name (in English): Applications of magnetic force microscopy for studying hard disk storage media
      Optics, masers and lasers. Czech. Czech Republic.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 15/8/2002 18:02.
      More: https://is.muni.cz/publication/404729/en
    3. Applications of atomic force microscopy for thin film boundary measurements
      KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 195-199. ISSN 0447-6441.
      URL
      RIV/00216224:14310/02:00006295 Article in a journal. Optics, masers and lasers. English. Czech Republic.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Roughness; Atomic Force Microscopy
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:03.
      More: https://is.muni.cz/publication/404728/en
    4. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 759-762. ISSN 0142-2421.
      URL
      RIV/00216224:14310/02:00007050 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Klapetek, Petr (203 Czech Republic) -- Pokorný, Pavel (203 Czech Republic)
      Keywords in English: TiO2 thin films; optical characterization; AFM; boundary roughness
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:05.
      More: https://is.muni.cz/publication/407667/en
    5. Influence of overlayers on determination of the optical constants of ZnSe thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, vol. 92, No 4, p. 1873-1880. ISSN 0021-8979.
      URL
      RIV/00216224:14310/02:00008572 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: SPECTROSCOPIC ELLIPSOMETRY; GAAS; MULTISAMPLE; OXIDE
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:07.
      More: https://is.muni.cz/publication/407666/en
    6. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jan JANČA and Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, vol. 11, No 1, p. 105-117. ISSN 0925-9635.
      URL
      RIV/00216224:14310/02:00005469 Article in a journal. Solid-state physics and magnetism. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Janča, Jan (203 Czech Republic) -- Veltruská, Kateřina (203 Czech Republic)
      Keywords in English: DLC films; Ellipsometry; Optical properties; Amorphous materials
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:10.
      More: https://is.muni.cz/publication/392491/en
    7. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Daniel FRANTA, Tomáš KRÁLÍK, Miloš JÁKL and Marek ELIÁŠ. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 660-663. ISSN 0142-2421.
      URL
      RIV/00216224:14310/02:00007060 Article in a journal. Optics, masers and lasers. English. United States of America.
      Ohlídal, Miloslav (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Králík, Tomáš (203 Czech Republic) -- Jákl, Miloš (203 Czech Republic) -- Eliáš, Marek (203 Czech Republic)
      Keywords in English: non-uniform thin films; optical characterization
      Changed by: Mgr. Marek Eliáš, Ph.D., učo 16171. Changed: 9/8/2005 11:40.
      More: https://is.muni.cz/publication/407704/en

    2001

    1. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ and Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2001, vol. 32, No 1, p. 91-94. ISSN 0142-2421.
      URL
      RIV/00216224:14310/01:00004374 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Pokorný, Pavel (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic)
      Keywords in English: inhomogeneous ZrO2 films; optical characterization; AFM
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:00.
      More: https://is.muni.cz/publication/367252/en
    2. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
      FRANTA, Daniel and Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001, p. 207-212. ISBN 0-8194-4047-7.
      URL
      RIV/00216224:14310/01:00004153 Proceedings paper. Optics, masers and lasers. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: inhomogeneous thin films; optical quantities; matrix formalism; Drude approximation
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:14.
      More: https://is.muni.cz/publication/360731/en
    3. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
      OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, vol. 3, No 4, p. 873-878. ISSN 1454-4164.
      URL
      RIV/00216224:14310/01:00005240 Article in a journal. Solid-state physics and magnetism. English. Romania.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants
      International impact: yes
      Changed by: doc. RNDr. Karel Navrátil, CSc., učo 1646. Changed: 13/2/2007 16:35.
      More: https://is.muni.cz/publication/387372/en
    4. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, No 1, p. 285-289. ISSN 0042-207X.
      URL
      RIV/00216224:14310/01:00004312 Article in a journal. Optics, masers and lasers. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: Thin films; Spectral reflectance; Optical parameters
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:21.
      More: https://is.muni.cz/publication/366094/en
    5. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly (Measurement of Basic Statistical Quantities of Statistical Roughness by Atomic Force Microscopy)
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly (Measurement of Basic Statistical Quantities of Statistical Roughness by Atomic Force Microscopy). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, vol. 51, No 1, p. 16-21. ISSN 0009-0700.
      URL
      Name (in English): Measurement of Basic Statistical Quantities of Statistical Roughness by Atomic Force Microscopy
      RIV/00216224:14310/01:00004318 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:24.
      More: https://is.muni.cz/publication/366173/en
    6. Optical Characterization of Diamond-like Carbon Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 279-283. ISSN 0042-207X.
      URL
      RIV/00216224:14310/01:00004311 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic) -- Janča, Jan (203 Czech Republic)
      Keywords in English: DLC films; Ellipsometry; Optical properties; Amorphous materials
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:45.
      More: https://is.muni.cz/publication/366093/en
    7. Optical characterization of DLC:Si films prepared by PECVD
      FRANTA, Daniel, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical characterization of DLC:Si films prepared by PECVD. In Proceedings of 13th Symposium on Application of Plasma Processes. Bratislava (Slovakia): Dept. of Plasma Physics & Inst. of Physics, Comenius University Bratislava (Slovakia), 2001, p. 87-88. ISBN 80-223-157.
      URL
      RIV/00216224:14310/01:00004615 Proceedings paper. Plasma physics and discharge through gases. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Zajíčková, Lenka (203 Czech Republic)
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:45.
      More: https://is.muni.cz/publication/374773/en
    8. Optical Characterization of Chalcogenide Thin Films
      FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, 175-176, No 1, p. 555-561. ISSN 0169-4332.
      URL
      RIV/00216224:14310/01:00004310 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Jedelský, Jaroslav (203 Czech Republic)
      Keywords in English: Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:41.
      More: https://is.muni.cz/publication/366091/en
    9. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. USA: Optical Society of America, 2001, vol. 40, No 31, p. 5711-5717. ISSN 0003-6935.
      URL
      RIV/00216224:14310/01:00004763 Article in a journal. Optics, masers and lasers. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Ohlídal, Miloslav (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: REFLECTION; CONSTANTS; THICKNESS; SILICON; SYSTEM
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:46.
      More: https://is.muni.cz/publication/378151/en
    10. Study of Thin Film Defects by Atomic Force Microscopy
      KLAPETEK, Petr, Daniel FRANTA and Ivan OHLÍDAL. Study of Thin Film Defects by Atomic Force Microscopy. In Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. Braunschweig: Physikalisch-Technische Bundesanstalt, 2001, p. 107-117. ISBN 3-89701-840-3.
      URL
      Name in Czech: Studium defektů tenkých vrstev pomocí mikroskopu atomové síly
      RIV/00216224:14310/01:00008554 Proceedings paper. Solid-state physics and magnetism. English. Germany.
      Klapetek, Petr (203 Czech Republic) -- Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: AFM
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:49.
      More: https://is.muni.cz/publication/401791/en
    11. Vliv diskrétní Fourierovy transformace na zpracování AFM dat (Influence of the Discrete Fourier Transform on the Treatment of AFM Data)
      KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Vliv diskrétní Fourierovy transformace na zpracování AFM dat (Influence of the Discrete Fourier Transform on the Treatment of AFM Data). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, vol. 51, No 1, p. 49-51. ISSN 0009-0700.
      URL
      Name (in English): Influence of the Discrete Fourier Transform on the Treatment of AFM Data
      RIV/00216224:14310/01:00004331 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Klapetek, Petr (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 00:52.
      More: https://is.muni.cz/publication/366226/en
    12. XPS and Ellipsometric Study of DLC/Silicon Interface
      ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD and Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 269-273. ISSN 0042-207X.
      URL
      RIV/00216224:14310/01:00004313 Article in a journal. Plasma physics and discharge through gases. English. United States of America.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Veltruská, Kateřina (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: DLC films; XPS; Ellipsometry; Interface
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:40.
      More: https://is.muni.cz/publication/366095/en

    2000

    1. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
      FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.
      URL
      RIV/00216224:14310/00:00002233 Article in a journal. Solid-state physics and magnetism. English. Austria.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Spectroscopic Ellipsometry; Spectroscopic Reflectometry; Atomic Force Microscopy; Rough Thin Films
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:23.
      More: https://is.muni.cz/publication/313891/en
    2. Analysis of thin films by optical multi-sample methods
      FRANTA, Daniel and Ivan OHLÍDAL. Analysis of thin films by optical multi-sample methods. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 411-421. ISSN 0323-0465.
      URL
      RIV/00216224:14310/00:00002317 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:38.
      More: https://is.muni.cz/publication/329671/en
    3. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films. In Proceedings of the 4th Seminar on Quantitative Microscopy. Braunschweig: Physikalisch-Technische Bundesanstalt, 2000, p. 124-131. ISBN 3-89701-503-X.
      URL
      RIV/00216224:14310/00:00002241 Proceedings paper. Solid-state physics and magnetism. English. Germany.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:41.
      More: https://is.muni.cz/publication/321011/en
    4. Ellipsometry of Thin Film Systems
      OHLÍDAL, Ivan and Daniel FRANTA. Ellipsometry of Thin Film Systems. In Progress in Optics, Vol. 41 (Ed. E. Wolf). 1st ed. Amsterdam: Elsevier, 2000, p. 181-282. ISBN 0-444-568-7.
      URL
      RIV/00216224:14310/00:00002671 Chapter(s) of a specialized book. Optics, masers and lasers. English. Netherlands.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:43.
      More: https://is.muni.cz/publication/345405/en
    5. Matrix formalism for imperfect thin films
      OHLÍDAL, Ivan and Daniel FRANTA. Matrix formalism for imperfect thin films. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 489-500. ISSN 0323-0465.
      URL
      RIV/00216224:14310/00:00002316 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:46.
      More: https://is.muni.cz/publication/329651/en
    6. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
      FRANTA, Daniel and Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, vol. 30, No 1, p. 574-579. ISSN 0142-2421.
      URL
      RIV/00216224:14310/00:00002371 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: Inhomogeneous ZrO2-films; Optical characterization; Spectroscopic ellipsometry; Spectroscopic reflectometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:49.
      More: https://is.muni.cz/publication/334911/en
    7. Optical characterization of thin films with randomly rough boundaries using the photovoltage method
      PAVELKA, Radek, Ivan OHLÍDAL, Jan HLÁVKA, Daniel FRANTA and Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films. UK Oxford: Elsevier science, 2000, vol. 366, No 1, p. 43-50. ISSN 0040-6090.
      URL
      RIV/00216224:14310/00:00002318 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Pavelka, Radek (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Hlávka, Jan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Photovoltage; Optical properties; Ellipsometry; Reflection spectroscopy
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 01:01.
      More: https://is.muni.cz/publication/329691/en

    1999

    1. Comparison of optical and non-optical methods for measuring surface roughness
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA and Miroslav TYKAL. Comparison of optical and non-optical methods for measuring surface roughness. In Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 456-467. ISBN 0-8194-3306-3.
      URL
      RIV/00216224:14310/99:00002100 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Coherent optics; Surface roughness; Metrology
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:20.
      More: https://is.muni.cz/publication/207571/en
    2. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
      OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK and Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, vol. 28, No 1, p. 240-244. ISSN 0142-2421.
      URL
      RIV/00216224:14310/99:00002109 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Optical constants of Si and SiO2; Spectrosopic reflectometry; Spectroscopic ellipsometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:28.
      More: https://is.muni.cz/publication/208731/en
    3. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
      OHLÍDAL, Miloslav, Marek UNČOVSKÝ, Ivan OHLÍDAL and Daniel FRANTA. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, vol. 46, No 2, p. 279-293. ISSN 0950-0340.
      URL
      RIV/00216224:14310/99:00003214 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Ohlídal, Miloslav (guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:12.
      More: https://is.muni.cz/publication/206064/en
    4. Characterisation of DLC Films Prepared by PECVD
      FRANTA, Daniel and Lenka ZAJÍČKOVÁ. Characterisation of DLC Films Prepared by PECVD. In Proceedings of 12th Symposium on Application of Plasma Processes. Bratislava: Comenius University, Bratislava, Slovakia, 1999, p. 158-159. ISBN 80-223-1370-X.
      URL
      RIV/00216224:14310/99:00001776 Proceedings paper. Plasma physics and discharge through gases. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Zajíčková, Lenka (203 Czech Republic)
      Type of proceedings: pre-proceedings
      International impact: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:31.
      More: https://is.muni.cz/publication/234131/en
    5. Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky (Measuring the Surface Roughness in Mechanical Engineering by Selected Methods of Coherence Optics)
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miroslav TYKAL, Dominik PRAŽÁK and Marek UNČOVSKÝ. Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky (Measuring the Surface Roughness in Mechanical Engineering by Selected Methods of Coherence Optics). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 44, No 9, p. 259-267. ISSN 0447-6441.
      Name (in English): Measuring the Surface Roughness in Mechanical Engineering by Selected Methods of Coherence Optics
      RIV/00216224:14310/99:00003218 Article in a journal. Optics, masers and lasers. Czech. Czech Republic.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 27/2/2001 16:28.
      More: https://is.muni.cz/publication/209133/en
    6. New Ways od Observing Optical Inhomogeneities in Glass
      OHLÍDAL, Miloslav, Josef VRÁNA, Aleš MICHÁLEK, Dominik PRAŽÁK, Miloš JÁKL and Ivan OHLÍDAL. New Ways od Observing Optical Inhomogeneities in Glass. In Proceedings of the 5th ESG Conference: Glass Science and Technology for the 21st Century. Prague, Czech Republic: The Czech Glass Society, 1999, p. 107-111. ISBN 80-238-3861-x.
      Optics, masers and lasers. English. Czech Republic.
      Keywords in English: optics; spatial filtering; phase-objects; optical inhomogeneities
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 27/2/2001 13:09.
      More: https://is.muni.cz/publication/209091/en
    7. Optical characterization of multilayer systems with randomly rough boundaries
      OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In 18th Congress of the International Commision for Optics: Optics for the Next Millennium. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 150-151. SPIE Volume 3749. ISBN 0-8194-3234-2.
      RIV/00216224:14310/99:00003217 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Keywords in English: multilayer systems; rough boundaries; coherent reflectance; optical characterization
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 27/2/2001 13:00.
      More: https://is.muni.cz/publication/207732/en
    8. Optical methods for surface characterization
      OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.
      RIV/00216224:14310/99:00003216 Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Keywords in English: Optical methods; Solid surfaces Thin films
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 25/1/2001 15:48.
      More: https://is.muni.cz/publication/207572/en
    9. Optical quantities of multilayer systems with correlated randomly rough boundaries
      OHLÍDAL, Ivan and František VIŽĎA. Optical quantities of multilayer systems with correlated randomly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, vol. 46, No 14, p. 2043-2062. ISSN 0950-0340.
      RIV/00216224:14310/99:00003229 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 26/1/2001 12:08.
      More: https://is.muni.cz/publication/217471/en
    10. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness
      OHLÍDAL, Ivan, Daniel FRANTA, Petr KLAPETEK and Martin VIČAR. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 44, No 10, p. 307-311. ISSN 0447-6441.
      URL
      RIV/00216224:14310/99:00002111 Article in a journal. Optics, masers and lasers. English. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Vičar, Martin (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:17.
      More: https://is.muni.cz/publication/211391/en
    11. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ and Daniel FRANTA. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films. Czechoslovak Journal of Physics. Praha, 1999, vol. 49, No 8, p. 1213-1228. ISSN 0011-4626.
      URL
      RIV/00216224:14310/99:00001115 Article in a journal. Plasma physics and discharge through gases. English. Czech Republic.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Buršíková, Vilma (203 Czech Republic) -- Franta, Daniel (203 Czech Republic)
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:27.
      More: https://is.muni.cz/publication/207851/en
    12. Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie (Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry)
      OHLÍDAL, Ivan. Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie (Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 1999, No 2, p. 53-57. ISSN 0447-6441.
      Name (in English): Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry
      RIV/00216224:14310/99:00003230 Article in a journal. Optics, masers and lasers. Czech. Czech Republic.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 27/2/2001 16:37.
      More: https://is.muni.cz/publication/217531/en

    1998

    1. Analysis of thin films with slightly rough boundaries
      OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER and Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, No 1, p. 177-180. ISSN 0026-3672.
      URL
      RIV/00216224:14310/98:00003184 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Hora, Jaroslav (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: Spectroscopic Ellipsometry; Spectroscopic Reflectometry; Atomic Force Microscopy
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:25.
      More: https://is.muni.cz/publication/200406/en
    2. Comparison of AFM and optical methods at measuring nanometric surface roughness
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR and Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, p. 123-129. ISBN 3-89701-280-4.
      URL
      RIV/00216224:14310/98:00002080 Proceedings paper. Solid-state physics and magnetism. English. Germany.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Vičar, Martin (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:29.
      More: https://is.muni.cz/publication/206012/en
    3. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1998, vol. 45, No 5, p. 903-934. ISSN 0950-0340.
      URL
      RIV/00216224:14310/98:00003213 Article in a journal. Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:32.
      More: https://is.muni.cz/publication/206016/en
    4. Ellipsometry of thin films
      OHLÍDAL, Ivan and Daniel FRANTA. Ellipsometry of thin films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 1998, vol. 48, No 4, p. 459-468. ISSN 0323-0465.
      URL
      RIV/00216224:14310/98:00002060 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:36.
      More: https://is.muni.cz/publication/200399/en
    5. Optical parameter analysis of thin absorbing films measured by the photovoltage method
      PAVELKA, Radek, Jan HLÁVKA, Ivan OHLÍDAL and Helmut SITTER. Optical parameter analysis of thin absorbing films measured by the photovoltage method. Acta physica polonica A. Jaszowiec, Polsko: Intern.School on Physics of Semicond.Com, 1998, vol. 94, No 3, p. 468-472.
      RIV/00216224:14310/98:00003183 Article in a journal. Optics, masers and lasers. English. Poland.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 27/2/2001 16:09.
      More: https://is.muni.cz/publication/200286/en
    6. Rubidium Bromide (RbBr)
      OHLÍDAL, Ivan and Miloslav OHLÍDAL. Rubidium Bromide (RbBr). In Handbook of Optical Constants of Solids III. San Diego: Academic Press, 1998, p. 845-855. ISBN 0-12-544423-0.
      Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 29/11/2001 12:13.
      More: https://is.muni.cz/publication/197820/en
    7. Rubidium lodide (RbI)
      OHLÍDAL, Ivan and Daniel FRANTA. Rubidium lodide (RbI). In Handbook of Optical Constants of Solids III. San Diego, USA: Academic Press, 1998, p. 857-870. ISBN 0-12-544423-0.
      URL
      Solid-state physics and magnetism. English. United States of America.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:05.
      More: https://is.muni.cz/publication/197819/en
    8. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou (Comparing the results of measuring surface the roughness which have been achieved by optical methods and by profilometric method)
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Miroslav TYKAL, Dominik PRAŽÁK and Aleš MICHÁLEK. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou (Comparing the results of measuring surface the roughness which have been achieved by optical methods and by profilometric method). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1998, vol. 43, No 4, p. 130-136. ISSN 0447-6441.
      URL
      Name (in English): Comparing the results of measuring surface the roughness which have been achieved by optical methods and by profilometric method
      RIV/00216224:14310/98:00003189 Article in a journal. Solid-state physics and magnetism. Czech. Czech Republic.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:11.
      More: https://is.muni.cz/publication/200581/en
    9. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, vol. 147, No 1, p. 349-358. ISSN 0030-4018.
      URL
      RIV/00216224:14310/98:00003212 Article in a journal. Optics, masers and lasers. English. Netherlands.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: Near-field optics; Speckle effect; Rough thin films
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:15.
      More: https://is.muni.cz/publication/206015/en

    1997

    1. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
      OHLÍDAL, Ivan, Daniel FRANTA, Bohuslav REZEK and Miloslav OHLÍDAL. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy. In ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1997, p. 1051-1054. ISBN 0-471-97827-2.
      URL
      Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:22.
      More: https://is.muni.cz/publication/197818/en
    2. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1997, vol. 42, No 3, p. 76-79. ISSN 0447-6441.
      Name (in English): Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
      RIV: Article in a journal. Optics, masers and lasers. English. Czech Republic.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 6/3/2000 18:15.
      More: https://is.muni.cz/publication/197822/en

    1996

    1. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA and Aleš MICHÁLEK. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces. In Specification, Production, and Testing of Optical Components and Systems. USA: SPIE - The International Society for Optical Engineering, 1996, p. 442-451. ISBN 0-8194-2160-X.
      URL
      Optics, masers and lasers. English. United States of America.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:14.
      More: https://is.muni.cz/publication/197821/en
    2. New Technique of Measurement of Optical Parameters of thin Films
      HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films. Oxford, UK: Elsevier science, 1996, vol. 279, p. 209-212. ISSN 0040-6090.
      Name (in English): New Technique of Measurement of Optical Parameters of thin Films
      RIV: Article in a journal. Theoretical physics. English.
      Keywords in English: Optical properties; Photovoltage; Semiconductors
      Changed by: doc. RNDr. Jan Hlávka, CSc., učo 1555. Changed: 7/7/1999 16:23.
      More: https://is.muni.cz/publication/197459/en
    3. Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses
      ZAJÍČKOVÁ, Lenka, Ivan OHLÍDAL and Jan JANČA. Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses. Thin Solid Films. UK Oxford: Elsevier science, 1996, vol. 1996, No 280, p. 26-36. ISSN 0040-6090.
      RIV/00216224:14310/96:00000441 Article in a journal. Plasma physics and discharge through gases. English. United Kingdom of Great Britain and Northern Ireland.
      Zajíčková, Lenka (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Janča, Jan (203 Czech Republic)
      Keywords in English: PECVD; TEOS
      International impact: yes
      Reviewed: yes
      Changed by: doc. Mgr. Lenka Zajíčková, Ph.D., učo 1414. Changed: 17/7/2007 17:04.
      More: https://is.muni.cz/publication/197508/en
    4. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers
      OHLÍDAL, Ivan, Daniel FRANTA and Jaroslav HORA. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers. In ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1996, p. 823-826. ISBN 0-471-95899-9.
      URL
      Theoretical physics. English. United Kingdom of Great Britain and Northern Ireland.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:16.
      More: https://is.muni.cz/publication/197476/en
    5. Spektroskopická elipsometrie slabě drsných povrchů (Spectroscopic Ellipsometry of Slightly Rough Surfaces)
      FRANTA, Daniel, Ivan OHLÍDAL, Jaroslav HORA and Karel NAVRÁTIL. Spektroskopická elipsometrie slabě drsných povrchů (Spectroscopic Ellipsometry of Slightly Rough Surfaces). In 12. konference českých a slovenských fyziků. Ostrava: Fyzikální vědecká sekce Jednoty českých matematiků a fyziků, 1996, p. 482-485.
      URL
      Name (in English): Spectroscopic Ellipsometry of Slightly Rough Surfaces
      Solid-state physics and magnetism. Czech. Czech Republic.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:19.
      More: https://is.muni.cz/publication/484630/en

    1995

    1. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER and Daniel FRANTA. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids. Pure Appl. Opt. UK: Publishing Ltd, 1995, vol. 4, No 5, p. 599-616. ISSN 0963-9659.
      URL
      Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:06.
      More: https://is.muni.cz/publication/197252/en
    2. Interferometry of Randomly Rough Surfaces
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER and Daniel FRANTA. Interferometry of Randomly Rough Surfaces. In Photonics '95. Czech Republic: European Optical Society, 1995, p. 109-111.
      URL
      Optics, masers and lasers. English. Czech Republic.
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:04.
      More: https://is.muni.cz/publication/206281/en
    3. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries
      OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries. Optical Engineering. 1995, vol. 34, No 6, p. 1761-1768. ISSN 0091-3286.
      Name in Czech: Optická analýza pomocí spektroskopické reflektometrie jenoduchých a dvojitých vrstev s korelovanými náhodnými rozhraními
      Optics, masers and lasers. English. United Kingdom of Great Britain and Northern Ireland.
      Keywords in English: reflectance of single and double layers; roughness of boundaries of layers; correlation of boundaries
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. David Nečas, Ph.D., učo 19972. Changed: 27/1/2013 11:39.
      More: https://is.muni.cz/publication/849999/en
    4. Scattering of Light from Multilayer Systems with Rough Boundaries
      OHLÍDAL, Ivan, Karel NAVRÁTIL and Miloslav OHLÍDAL. Scattering of Light from Multilayer Systems with Rough Boundaries. In Progress in Optics, Vol. 34 (Ed. E. Wolf). Amsterdam: Elsevier, 1995, p. 249-331. ISBN 0 444 82140 6.
      RIV: Chapter(s) of a specialized book. Solid-state physics and magnetism. English. Netherlands.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 29/11/2001 12:20.
      More: https://is.muni.cz/publication/197253/en

    1994

    1. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry. Applied Optics. USA: Optical Society of America, 1994, 33(1994), No 34, p. 7838-7945. ISSN 0003-6935.
      Name (in English): Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry
      RIV: Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 21/5/1999 08:36.
      More: https://is.muni.cz/publication/197045/en
    2. Optical characterization of single and double layers with correlated randomly rough boundaries
      OHLÍDAL, Ivan and František VIŽĎA. Optical characterization of single and double layers with correlated randomly rough boundaries. In Optical Interference Coatings. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1994, p. 1143-1151. SPIE Proceedings Series, Volume 2253. ISBN 0-8194-1562-6.
      Name (in English): Optical characterization of single and double layers with correlated randomly rough boundaries
      RIV: Proceedings paper. Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 6/3/2000 18:45.
      More: https://is.muni.cz/publication/197046/en

    1993

    1. Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries
      OHLÍDAL, Ivan. Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries. J. Opt. Soc. Am. A. USA: Optical Society of America, 1993, 10(1993), No 1, p. 158-171. ISSN 0740-3233.
      Name (in English): Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries
      RIV: Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 21/5/1999 08:34.
      More: https://is.muni.cz/publication/196783/en
    2. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference)
      MUSILOVÁ, Jana and Ivan OHLÍDAL. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference). J. Phys. D: Appl. Phys. 1993, 25(1992), No 1, p. 1131-1138. ISSN 0022-3727.
      Name in Czech: Vliv defektů v tenkých vrstvách na určení jejich tloušťky metodou interference bílého světla
      Name (in English): Influence of defects of thin films on determining their thi ckness by the method based on white light interference
      RIV: Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Musilová, Jana (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: thin films
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Jana Musilová, CSc., učo 851. Changed: 23/6/2009 22:26.
      More: https://is.muni.cz/publication/196781/en
    3. The diffuse x-ray scattering in real periodical superlatices
      HOLÝ, Václav, Josef KUBĚNA and Ivan OHLÍDAL. The diffuse x-ray scattering in real periodical superlatices. Superlattices and Microstructures. 1993, vol. 12, No 1, p. 25-35. ISSN 0749-6036.
      Name (in English): The diffuse x-ray scattering in real periodical superlatices
      RIV/00216224:14310/93:00000230 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Changed by: prof. RNDr. Václav Holý, CSc., učo 1656. Changed: 20/3/2000 07:36.
      More: https://is.muni.cz/publication/196768/en
    4. X-ray reflection from rough layered systems
      HOLÝ, Václav, Josef KUBĚNA and Ivan OHLÍDAL. X-ray reflection from rough layered systems. Phys. Rev. B. 1993, vol. 47, No 23, p. 15896-16798. ISSN 0163-1829.
      Name (in English): X-ray reflection from rough layered systems
      RIV/00216224:14310/93:00000229 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Václav Holý, CSc., učo 1656. Changed: 20/3/2000 07:41.
      More: https://is.muni.cz/publication/196766/en

    1991

    1. Sodium Fluoride (NaF)
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Sodium Fluoride (NaF). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991, p. 1021-1034. ISBN 0-12-544422-2.
      Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/11/2001 18:01.
      More: https://is.muni.cz/publication/378243/en
    2. Thorium Fluoride (ThF4)
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Thorium Fluoride (ThF4). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991, p. 1049-1058. ISBN 0-12-544422-2.
      Solid-state physics and magnetism. English. United States of America.
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/11/2001 18:00.
      More: https://is.muni.cz/publication/378244/en
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