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    2025

    1. Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model
      FRANTA, Daniel, Mihai-George MURESAN, Pavel ONDRAČKA, Beáta HRONCOVÁ and František VIŽĎA. Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model. Optics and Laser Technology. Elsevier Ltd, 2025, vol. 181, February, p. 111916-111933. ISSN 0030-3992. Available from: https://dx.doi.org/10.1016/j.optlastec.2024.111916.
      More: https://is.muni.cz/publication/2445447/en

    2024

    1. Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan DVOŘÁK, Vilma BURŠÍKOVÁ and Petr KLAPETEK. Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries. Coatings. MDPI, 2024, vol. 14, No 11, p. 1439-1458. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings14111439.
      More: https://is.muni.cz/publication/2453159/en
    2. Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory
      VOHÁNKA, Jiří, Ivan OHLÍDAL and Petr KLAPETEK. Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory. Optik. Elsevier GmbH, 2024, vol. 317, November 2024, p. 172086-172099. ISSN 0030-4026. Available from: https://dx.doi.org/10.1016/j.ijleo.2024.172086.
      More: https://is.muni.cz/publication/2453141/en
    3. Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition
      DVOŘÁK, Jan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition. Heliyon. Elsevier Ltd, 2024, vol. 10, No 5, p. 1-12. ISSN 2405-8440. Available from: https://dx.doi.org/10.1016/j.heliyon.2024.e27246.
      More: https://is.muni.cz/publication/2394537/en
    4. Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model
      FRANTA, Daniel, Beáta HRONCOVÁ, Jan DVOŘÁK, Jiří VOHÁNKA, Pavel FRANTA, Ivan OHLÍDAL, Václav PEKAŘ and David ŠKODA. Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model. Optical Materials. Elsevier, 2024, vol. 157, November, p. 1-14. ISSN 0925-3467. Available from: https://dx.doi.org/10.1016/j.optmat.2024.116133.
      More: https://is.muni.cz/publication/2445444/en

    2023

    1. Dispersion models exhibiting natural optical activity: application to tartaric acid solutions
      HRONCOVÁ, Beáta, Daniel FRANTA, Jan DVOŘÁK and David PAVLIŇÁK. Dispersion models exhibiting natural optical activity: application to tartaric acid solutions. Journal of the Optical Society of America B: Optical Physics. Optica Publishing Group, 2023, vol. 40, No 12, p. 3209-3220. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.498720.
      More: https://is.muni.cz/publication/2355417/en
    2. Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems
      FRANTA, Daniel, Jiří VOHÁNKA and Beáta HRONCOVÁ. Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems. Journal of the Optical Society of America B: Optical Physics. Optica Publishing Group, 2023, vol. 40, No 11, p. 2928-2941. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.497572.
      More: https://is.muni.cz/publication/2355411/en
    3. FV0343AR – optický prvek s AR pokrytím pro λ = 343 nm, R < 0,2 %, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 pro pulsy 900 fs (FV0343AR – optical element with AR coating for λ = 343nm, R < 0.2%, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 for 900fs pulses)
      BŘEZINA, Jaromír, Václav PEKAŘ, David ŠKODA, Jan VANDA, Mihai-George MURESAN, Priyadarshani NARAYANASAMY, Martin MYDLÁŘ, Ivan OHLÍDAL, Jan DVOŘÁK, Jiří VOHÁNKA, Daniel FRANTA and Pavel FRANTA. FV0343AR – optický prvek s AR pokrytím pro λ = 343 nm, R < 0,2 %, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 pro pulsy 900 fs (FV0343AR – optical element with AR coating for λ = 343nm, R < 0.2%, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 for 900fs pulses). 2023.
      More: https://is.muni.cz/publication/2394202/en
    4. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory
      ŠULC, Václav, Jiří VOHÁNKA, Ivan OHLÍDAL, Petr KLAPETEK, Miloslav OHLÍDAL, Nupinder Jeet KAUR and František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. Coatings. MDPI, 2023, vol. 13, No 11, p. 1-15. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13111853.
      More: https://is.muni.cz/publication/2355407/en
    5. Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model
      FRANTA, Daniel, Jiří VOHÁNKA, Jan DVOŘÁK, Pavel FRANTA, Ivan OHLÍDAL, Petr KLAPETEK, Jaromír BŘEZINA and David ŠKODA. Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model. Coatings. MDPI, 2023, vol. 13, No 2, p. 1-21. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13020218.
      More: https://is.muni.cz/publication/2286924/en
    6. Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates
      DVOŘÁK, Jan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA and Ivan OHLÍDAL. Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates. Coatings. MDPI, 2023, vol. 13, No 5, p. 1-16. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13050873.
      More: https://is.muni.cz/publication/2286922/en
    7. Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data
      VOHÁNKA, Jiří, Václav ŠULC, Ivan OHLÍDAL, Miloslav OHLÍDAL and Petr KLAPETEK. Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data. Optik. Elsevier, 2023, vol. 280, June, p. 1-13. ISSN 0030-4026. Available from: https://dx.doi.org/10.1016/j.ijleo.2023.170775.
      More: https://is.muni.cz/publication/2310144/en

    2022

    1. Optical characterization of inhomogeneous thin films with randomly rough boundaries
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ, Petr KLAPETEK and Nupinder Jeet KAUR. Optical characterization of inhomogeneous thin films with randomly rough boundaries. Optics Express. Washington, D.C.: Optica Publishing Group, 2022, vol. 30, No 2, p. 2033-2047. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.447146.
      More: https://is.muni.cz/publication/1830997/en
    2. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jan DVOŘÁK, Petr KLAPETEK and Nupinder Jeet KAUR. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies. Optics Express. Optica Publishing Group, 2022, vol. 30, No 21, p. 39068-39085. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.470692.
      More: https://is.muni.cz/publication/2243981/en
    3. Soubor dělicích vrstev ve specifikaci s parametry prvního děliče Rp = 50 % ± 3 % @248 nm; druhého děliče Rp = <0,4; 0,75> a Rs < 1 % na vlnové délce 248 nm a zvýšenou propustností v oblasti od 630 nm do 670 nm. (Set of beam splitters coating in specification with parameters of the first beam splitter Rp = 50% ± 3% @248 nm; and second beamsplitter Rp = <0.4; 0.75> and Rs < 1 % at a wavelength of 248 nm and increased transmittance in the region from 630 nm to 670)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Jan DVOŘÁK, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Soubor dělicích vrstev ve specifikaci s parametry prvního děliče Rp = 50 % ± 3 % @248 nm; druhého děliče Rp = <0,4; 0,75> a Rs < 1 % na vlnové délce 248 nm a zvýšenou propustností v oblasti od 630 nm do 670 nm. (Set of beam splitters coating in specification with parameters of the first beam splitter Rp = 50% ± 3% @248 nm; and second beamsplitter Rp = <0.4; 0.75> and Rs < 1 % at a wavelength of 248 nm and increased transmittance in the region from 630 nm to 670). 2022.
      More: https://is.muni.cz/publication/2267879/en

    2021

    1. Constitutive equations describing optical activity in theory of dispersion
      FRANTA, Daniel and Jiří VOHÁNKA. Constitutive equations describing optical activity in theory of dispersion. Journal of the Optical Society of America B. Optical Society of America, 2021, vol. 38, No 2, p. 553-561. ISSN 0740-3224. Available from: https://dx.doi.org/10.1364/JOSAB.410315.
      More: https://is.muni.cz/publication/1765638/en
    2. Higher harmonic frequencies in a capacitively coupled plasma
      DVOŘÁK, Pavel, Radek ŽEMLIČKA, Roman PŘIBYL, Maroš TKÁČIK, Juraj PÁLENIK, Petr VAŠINA, Petr SKOPAL, Zdeněk NAVRÁTIL and Vilma BURŠÍKOVÁ. Higher harmonic frequencies in a capacitively coupled plasma. In 8th Plasma Science & Entrepreneurship Workshop. 2021.
      More: https://is.muni.cz/publication/1802098/en
    3. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy
      ŠUSTEK, Štěpán, Jiří VOHÁNKA, Ivan OHLÍDAL, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Nupinder Jeet KAUR. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy. Journal of Optics. Bristol: IOP Publishing, 2021, vol. 23, No 10, p. 105602-105615. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8986/ac1f35.
      More: https://is.muni.cz/publication/1821387/en
    4. On the transition of reaction pathway during microwave plasma gas-phase synthesis of graphene nanosheets: From amorphous to highly crystalline structure
      TOMAN, Jozef, Ondřej JAŠEK, Miroslav ŠNÍRER, David PAVLIŇÁK, Zdeněk NAVRÁTIL, Jana JURMANOVÁ, Stanislav CHUDJÁK, František KRČMA, Vít KUDRLE and Jan MICHALIČKA. On the transition of reaction pathway during microwave plasma gas-phase synthesis of graphene nanosheets: From amorphous to highly crystalline structure. Plasma processes and polymers. Weinheim: Wiley-VCH, 2021, vol. 18, No 8, p. "e2100008", 22 pp. ISSN 1612-8850. Available from: https://dx.doi.org/10.1002/ppap.202100008.
      More: https://is.muni.cz/publication/1781679/en
    5. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization
      OHLÍDAL, Ivan, Jiří VOHÁNKA and Martin ČERMÁK. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization. Coatings. Basel: MDPI, 2021, vol. 11, No 1, p. 22-52. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings11010022.
      More: https://is.muni.cz/publication/1740136/en
    6. Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45. (High reflection coating on the glass substrate within two specifications R >= 98,5% @ 248 nm for angle of incidence 45, and R >= 98% @ 213 nm for angle of incidence 45.)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Jan DVOŘÁK, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45. (High reflection coating on the glass substrate within two specifications R >= 98,5% @ 248 nm for angle of incidence 45, and R >= 98% @ 213 nm for angle of incidence 45.). 2021.
      More: https://is.muni.cz/publication/2267878/en
    7. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model
      FRANTA, Daniel and Mihai-George MURESAN. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model. Optical Materials Express. Optica Publishing Group, 2021, vol. 11, No 12, p. 3930-3945. ISSN 2159-3930. Available from: https://dx.doi.org/10.1364/OME.441088.
      More: https://is.muni.cz/publication/1812943/en

    2020

    1. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas
      KELAROVÁ, Štěpánka, Roman PŘIBYL, Vojtěch HOMOLA, Lukáš ZÁBRANSKÝ, Monika STUPAVSKÁ, Martin ČERMÁK and Vilma BURŠÍKOVÁ. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas. Online. In 11th International Conference on Nanomaterials - Research & Application (NANOCON 2019). Ostrava: TANGER Ltd, 2020, p. 657-662. ISBN 978-80-87294-95-6. Available from: https://dx.doi.org/10.37904/nanocon.2019.8643.
      More: https://is.muni.cz/publication/1686360/en
    2. Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm. (Antireflection coating on the substrate in specification: T>=99,8 % at 248 nm and T>=98,5 % at 213 nm.)
      PEKAŘ, Václav, Jaromír BŘEZINA, David ŠKODA, Ivan OHLÍDAL, Jiří VOHÁNKA, Daniel FRANTA, Pavel FRANTA, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK and Marek HAVLÍČEK. Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm. (Antireflection coating on the substrate in specification: T>=99,8 % at 248 nm and T>=98,5 % at 213 nm.). 2020.
      More: https://is.muni.cz/publication/2267877/en
    3. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge
      KELAROVÁ, Štěpánka, Vojtěch HOMOLA, Monika STUPAVSKÁ, Martin ČERMÁK, Jiří VOHÁNKA, Roman PŘIBYL, Lukáš ZÁBRANSKÝ and Vilma BURŠÍKOVÁ. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge. Progress in Organic Coatings. Lausanne: Elsevier, 2020, vol. 149, December 2020, p. 1-8. ISSN 0300-9440. Available from: https://dx.doi.org/10.1016/j.porgcoat.2020.105927.
      More: https://is.muni.cz/publication/1686381/en
    4. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry
      VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL and Ivan OHLÍDAL. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry. Applied Surface Science. Elsevier Science, 2020, vol. 534, December 2020, p. 1-10. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2020.147625.
      More: https://is.muni.cz/publication/1692072/en
    5. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials
      VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials. Optics Express. Washington, D.C.: Optical Society of America, 2020, vol. 28, No 4, p. 5492-5506. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.380657.
      More: https://is.muni.cz/publication/1692056/en
    6. Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Václav ŠULC, Štěpán ŠUSTEK and Miloslav OHLÍDAL. Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films. Optics Express. Washington, D.C.: Optical Society of America, 2020, vol. 28, No 24, p. 36796-36811. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.412043.
      More: https://is.muni.cz/publication/1699498/en
    7. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism)
      ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA and Ivan OHLÍDAL. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism). Physica Scripta. Royal Swedish Academy of Sciences, 2020, vol. 95, No 9, p. 095503-95521. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aba77b.
      More: https://is.muni.cz/publication/1692016/en
    8. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA and Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express. Washington, D.C.: OPTICAL SOC AMER, 2020, vol. 28, No 1, p. 160-174. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.28.000160.
      More: https://is.muni.cz/publication/1598881/en
    9. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions
      FRANTA, Daniel. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions. Journal of applied physics. Melville: American Institute of Physics, 2020, vol. 127, No 22, p. 1-17. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/5.0005735.
      More: https://is.muni.cz/publication/1686030/en

    2019

    1. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK and Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 16-26. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0037.
      More: https://is.muni.cz/publication/1577436/en
    2. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA and Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films. Elsevier, 2019, vol. 692, 31 December 2019, p. 1-17. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2019.03.001.
      More: https://is.muni.cz/publication/1598679/en
    3. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties. BRISTOL: OP PUBLISHING LTD, 2019, vol. 7, No 4, p. 1-12. ISSN 2051-672X. Available from: https://dx.doi.org/10.1088/2051-672x/ab359d.
      More: https://is.muni.cz/publication/1577317/en
    4. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory
      VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA and Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta. Bristol: IOP Publishing Ltd., 2019, vol. 94, No 4, p. 1-22. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aafbc1.
      More: https://is.muni.cz/publication/1507078/en
    5. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions
      VOHÁNKA, Jiří, David NEČAS and Daniel FRANTA. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions. Journal of Vacuum Science & Technology B. 2019, vol. 37, No 6, p. "062909-1"-"062909-7", 7 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122276.
      More: https://is.muni.cz/publication/1598856/en
    6. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 2019, vol. 37, No 6, p. "062921-1"-"062921-10", 10 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122014.
      More: https://is.muni.cz/publication/1598865/en
    7. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK and Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. Basel: MDPI, 2019, vol. 9, No 7, p. 1-21. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings9070416.
      More: https://is.muni.cz/publication/1549343/en
    8. Optical properties of the crystalline silicon wafers described using the universal dispersion model
      FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL and Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B. New York: A V S AMER INST PHYSICS, 2019, vol. 37, No 6, p. "062907-1"-"062907-14", 14 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122284.
      More: https://is.muni.cz/publication/1598876/en
    9. Temperature dependent dispersion models applicable in solid state physics
      FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA and Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 1-15. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0036.
      More: https://is.muni.cz/publication/1577498/en

    2018

    1. Amorphous gallium oxide grown by low-temperature PECVD
      KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA, Stefaan DE WOLF, Monica MORALES-MASIS and Christophe BALLIF. Amorphous gallium oxide grown by low-temperature PECVD. Journal of Vacuum Science and Technology A. AIP, 2018, vol. 36, No 2, p. 1-7. ISSN 0734-2101. Available from: https://dx.doi.org/10.1116/1.5018800.
      More: https://is.muni.cz/publication/1409778/en
    2. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
      FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK and Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics. 2018, vol. 123, No 18, p. 185707-185717. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/1.5026195.
      More: https://is.muni.cz/publication/1501220/en
    3. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK and Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 11, p. 1230-1233. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6463.
      More: https://is.muni.cz/publication/1472996/en
    4. Ellipsometry of Layered Systems
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 233-267. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_9.
      More: https://is.muni.cz/publication/1472962/en
    5. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence
      HOLOVSKÝ, Jakub, Zdeněk REMEŠ, Aleš PORUBA, Daniel FRANTA, Briana CONRAD, Lucie ABELOVÁ and David BUŠEK. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence. Review of Scientific Instruments. 2018, vol. 89, No 6, p. 063114-63119. ISSN 0034-6748. Available from: https://dx.doi.org/10.1063/1.5015988.
      More: https://is.muni.cz/publication/1501223/en
    6. Optical Characterization of Thin Films Exhibiting Defects
      OHLÍDAL, Ivan, Martin ČERMÁK and Jiří VOHÁNKA. Optical Characterization of Thin Films Exhibiting Defects. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 271-313. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_10.
      More: https://is.muni.cz/publication/1472963/en
    7. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
      ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL and Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, vol. 65, No 14, p. 1720-1736. ISSN 0950-0340. Available from: https://dx.doi.org/10.1080/09500340.2018.1457187.
      More: https://is.muni.cz/publication/1434656/en
    8. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
      FRANTA, Daniel, Jiří VOHÁNKA and Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_3.
      More: https://is.muni.cz/publication/1472965/en
    9. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
      VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 7, p. 757-765. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6473.
      More: https://is.muni.cz/publication/1472976/en

    2017

    1. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution
      VODÁK, Jiří, David NEČAS, Miloslav OHLÍDAL and Ivan OHLÍDAL. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. Measurement Science and Technology. Bristol: IOP PUBLISHING LTD, 2017, vol. 28, No 2, p. nestránkováno, 6 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/1361-6501/aa5534.
      More: https://is.muni.cz/publication/1409387/en
    2. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
      FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA and Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films. LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, vol. 631, June, p. 12-22. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2017.03.051.
      More: https://is.muni.cz/publication/1409198/en
    3. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
      OHLÍDAL, Ivan, Daniel FRANTA and David NEČAS. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. Applied Surface Science. AMSTERDAM, NETHERLANDS: Elsevier Science BV, 2017, vol. 421, November, p. 687-696. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.10.186.
      More: https://is.muni.cz/publication/1409184/en
    4. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
      KOTILAINEN, Minna Paula Katriina, Richard KRUMPOLEC, Daniel FRANTA, Pavel SOUČEK, Tomáš HOMOLA, David Campbell CAMERON and Petri VUORISTO. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers. Solar Energy Materials and Solar Cells. AMSTERDAM, NETHERLANDS: ELSEVIER SCIENCE BV, 2017, vol. 166, July, p. 140-146. ISSN 0927-0248. Available from: https://dx.doi.org/10.1016/j.solmat.2017.02.033.
      More: https://is.muni.cz/publication/1378718/en
    5. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
      FRANTA, Daniel, Minna Paula Katriina KOTILAINEN, Richard KRUMPOLEC and Ivan OHLÍDAL. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry. Applied Surface Science. AMSTERDAM: ELSEVIER SCIENCE BV, 2017, vol. 421, November, p. 420-423. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.12.164.
      More: https://is.muni.cz/publication/1392856/en
    6. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
      OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science. AMSTERDAM: Elsevier Science, 2017, vol. 419, October, p. 942-956. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.04.211.
      More: https://is.muni.cz/publication/1409203/en
    7. Temperature-dependent dispersion model of float zone crystalline silicon
      FRANTA, Daniel, Adam DUBROKA, Chennan WANG, Angelo GIGLIA, Jiří VOHÁNKA, Pavel FRANTA and Ivan OHLÍDAL. Temperature-dependent dispersion model of float zone crystalline silicon. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 405-419. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.021.
      More: https://is.muni.cz/publication/1409192/en
    8. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
      FRANTA, Daniel, David NEČAS, Angelo GIGLIA, Pavel FRANTA and Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 424-429. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.09.149.
      More: https://is.muni.cz/publication/1409188/en

    2016

    1. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range (Materiály pro polarizátory z drátěných mřížek posouvající aplikační omezení dále do ultrafialové spektrální oblasti)
      SIEFKE, Thomas, Stefanie KROKER, Kristin PFEIFFER, Oliver PUFFKY, Kay DIETRICH, Daniel FRANTA, Ivan OHLÍDAL, Adriana SZEGHALMI, Ernst-Bernhard KLEY and Andreas TÜNNERMANN. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range (Materiály pro polarizátory z drátěných mřížek posouvající aplikační omezení dále do ultrafialové spektrální oblasti). Advanced Optical Materials. 2016, vol. 4, No 11, p. 1780-1786. ISSN 2195-1071. Available from: https://dx.doi.org/10.1002/adom.201600250.
      More: https://is.muni.cz/publication/1376392/en
    2. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Angelo GIGLIA. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. In Gorecki, C; Asundi, AK; Osten, W. Conference on Optical Micro- and Nanometrology VI. 9890th ed. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, 2016, p. "989014-1"-"989014-15", 15 pp. ISBN 978-1-5106-0135-2. Available from: https://dx.doi.org/10.1117/12.2227580.
      More: https://is.muni.cz/publication/1384148/en
    3. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, M. OHLIDAL and J. VODAK. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. Journal of Optics. Bristol: IOP Publishing, 2016, vol. 18, No 1, p. nestránkováno, 10 pp. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8978/18/1/015401.
      More: https://is.muni.cz/publication/1375048/en

    2015

    1. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6° (Beamsplitter for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm and angle of incident 45°±6°)
      BŘEZINA, Jaromír and Daniel FRANTA. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6° (Beamsplitter for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm and angle of incident 45°±6°). 2015.
      More: https://is.muni.cz/publication/1340469/en
    2. Dispersion model for optical thin films applicable in wide spectral range
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Angelo GIGLIA. Dispersion model for optical thin films applicable in wide spectral range. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96281U-1"-"96281U-12", 12 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190104.
      More: https://is.muni.cz/publication/1384149/en
    3. Optická charakterizace povrchů skel SML3103/3/15 (Optical characterization of glass surfaces SML3103/3/15)
      FRANTA, Daniel and Pavel FRANTA. Optická charakterizace povrchů skel SML3103/3/15 (Optical characterization of glass surfaces SML3103/3/15). Brno: Preciosa a.s., 2015, 18 pp.
      More: https://is.muni.cz/publication/1342797/en
    4. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Polarizing cube for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Polarizing cube for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2015.
      More: https://is.muni.cz/publication/1340467/en
    5. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, David NEČAS, Jiří VODÁK, Daniel FRANTA, Pavel NÁDASKÝ and František VIŽĎA. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280R-1"-"96280R-13", 13 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2191052.
      More: https://is.muni.cz/publication/1384154/en
    6. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry
      NEČAS, David, Jiří VODÁK, Ivan OHLÍDAL, Miloslav OHLÍDAL, Abhijit MAJUMDAR and Lenka ZAJÍČKOVÁ. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. Applied Surface Science. Elsevier, 2015, vol. 350, SEP, p. 149-155. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2015.01.093.
      More: https://is.muni.cz/publication/1340778/en
    7. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Jiří VODÁK, Miloslav OHLÍDAL and Daniel FRANTA. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280C-1"-"96280C-9", 9 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190091.
      More: https://is.muni.cz/publication/1384153/en
    8. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia
      FRANTA, Daniel, David NEČAS and Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia. Applied Optics. 2015, vol. 54, No 31, p. 9108-9112, 12 pp. ISSN 1559-128X. Available from: https://dx.doi.org/10.1364/AO.54.009108.
      More: https://is.muni.cz/publication/1339817/en
    9. Wide spectral range characterization of antireflective coatings and their optimization
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL and Jiří JANKUJ. Wide spectral range characterization of antireflective coatings and their optimization. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628th ed. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015, p. "96280F-1"-"96280F-14", 14 pp. ISBN 978-1-62841-817-0. Available from: https://dx.doi.org/10.1117/12.2190109.
      More: https://is.muni.cz/publication/1384151/en

    2014

    1. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating (Al2O3/MgF2) for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating (Al2O3/MgF2) for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      More: https://is.muni.cz/publication/1297282/en
    2. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm (Antireflection coating (SiO2/Al2O3/MgF2) for the far ultraviolet (FUV, VUV) region of the spectrum at the wavelength of 193nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm (Antireflection coating (SiO2/Al2O3/MgF2) for the far ultraviolet (FUV, VUV) region of the spectrum at the wavelength of 193nm). 2014.
      More: https://is.muni.cz/publication/1297287/en
    3. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Ivan OHLÍDAL. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      More: https://is.muni.cz/publication/1297326/en
    4. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45° (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm at AOI 45°)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45° (Antireflection coating consisting of Al2O3/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm at AOI 45°). 2014.
      More: https://is.muni.cz/publication/1297329/en
    5. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of HfO2/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm)
      BŘEZINA, Jaromír and Daniel FRANTA. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (Antireflection coating consisting of HfO2/SiO2 materials for the deep ultraviolet (DUV) region of the spectrum at the wavelength of 266nm). 2014.
      More: https://is.muni.cz/publication/1297331/en
    6. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Miloslav OHLÍDAL, Jiří VODÁK, Lucia SLÁDKOVÁ, Lenka ZAJÍČKOVÁ, Marek ELIÁŠ and František VIZĎA. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, november, p. 573-578. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.12.036.
      More: https://is.muni.cz/publication/1232792/en
    7. Broadening of dielectric response and sum rule conservation
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Broadening of dielectric response and sum rule conservation. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, November, p. 496-501. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.11.148.
      More: https://is.muni.cz/publication/1230808/en
    8. Consolidated series for efficient calculation of the reflection and transmission in rough multilayers
      NEČAS, David and Ivan OHLÍDAL. Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. Optics Express. WASHINGTON: Optical Socienty of America, 2014, vol. 22, No 4, p. 4499-4515. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.22.004499.
      More: https://is.muni.cz/publication/1169904/en
    9. Dispersion model of two-phonon absorption: application to c-Si
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS. WASHINGTON: OPTICAL SOC AMER, 2014, vol. 4, No 8, p. 1641-1656. ISSN 2159-3930. Available from: https://dx.doi.org/10.1364/OME.4.001641.
      More: https://is.muni.cz/publication/1230792/en
    10. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
      OHLÍDAL, Ivan, Daniel FRANTA and David NEČAS. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, November, p. 695-700. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2014.02.092.
      More: https://is.muni.cz/publication/1230700/en
    11. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
      NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Miloslav OHLÍDAL, Vladimír ČUDEK and Jiří VODÁK. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. Applied Optics. USA: Optical Society of America, 2014, vol. 53, No 25, p. 5606-5614. ISSN 1559-128X. Available from: https://dx.doi.org/10.1364/AO.53.005606.
      More: https://is.muni.cz/publication/1232510/en
    12. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Ivan OHLÍDAL. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. Thin Solid Films. Lausanne: Elsevier Science, 2014, vol. 571, november, p. 490-495. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2014.03.059.
      More: https://is.muni.cz/publication/1230809/en

    2013

    1. Advanced modeling for optical characterization of amorphous hydrogenated silicon films
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Jiří STUCHLÍK. Advanced modeling for optical characterization of amorphous hydrogenated silicon films. Thin Solid Films. Lausanne: Elsevier Science, 2013, vol. 541, Aug, p. 12-16. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.04.129.
      More: https://is.muni.cz/publication/1161986/en
    2. Application of sum rule to the dispersion model of hydrogenated amorphous silicon
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jiří STUCHLÍK and Dagmar CHVOSTOVA. Application of sum rule to the dispersion model of hydrogenated amorphous silicon. Thin Solid Films. Lausanne: Elsevier Science, 2013, vol. 539, Jul, p. 233-244. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.04.012.
      More: https://is.muni.cz/publication/1161978/en
    3. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models
      FRANTA, Daniel, David NEČAS and Lenka ZAJÍČKOVÁ. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models. Thin Solid Films. Oxford: Elsevier Science, 2013, vol. 534, May, p. 432-441. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2013.01.081.
      More: https://is.muni.cz/publication/1161970/en
    4. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
      NEČAS, David, Daniel FRANTA, Ivan OHLÍDAL, Aleš PORUBA and Petr WOSTRÝ. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. Surface and Interface Analysis. Hoboken: WILEY-BLACKWELL, 2013, vol. 45, No 7, p. 1188-1192. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.5250.
      More: https://is.muni.cz/publication/1113198/en

    2012

    1. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
      KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK and Pavel HÁN. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode. 2012.
      More: https://is.muni.cz/publication/1093944/en
    2. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD
      MOCANU, Valentin, Adrian STOICA, Lukáš KELAR, Daniel FRANTA, Vilma BURŠÍKOVÁ, Romana MIKSOVA and Vratislav PERINA. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD. Chem. Listy. 2012, 106/2012, No 106, p. s1460-s1464, 4 pp. ISSN 0009-2770.
      More: https://is.muni.cz/publication/1092432/en

    2011

    1. Anisotropy-enhanced depolarization on transparent film/substrate system
      FRANTA, Daniel, David NEČAS and Ivan OHLÍDAL. Anisotropy-enhanced depolarization on transparent film/substrate system. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2637-2640. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.113.
      More: https://is.muni.cz/publication/932462/en
    2. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Christoph COBET. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2694-2697. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.059.
      More: https://is.muni.cz/publication/932461/en
    3. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
      ZAJÍČKOVÁ, Lenka, Daniel FRANTA, David NEČAS, Vilma BURŠÍKOVÁ, Mihai George MURESAN, Vratislav PEŘINA and Christoph COBET. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture. Thin Solid Films. Elsevier, 2011, vol. 519, No 13, p. 4299-4308. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2011.02.021.
      More: https://is.muni.cz/publication/940456/en
    4. Ellipsometric characterisation of thin films non-uniform in thickness
      NEČAS, David, Daniel FRANTA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Ellipsometric characterisation of thin films non-uniform in thickness. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2715-2717. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.065.
      More: https://is.muni.cz/publication/940454/en
    5. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Vratislav PEŘINA and Romana MIKŠOVÁ. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC. In 12th International Balkan Workshop on Applied Physics, 2011. 2011.
      More: https://is.muni.cz/publication/953441/en
    6. Measurement of the thickness distribution and optical constants of non-uniform thin films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS and Abhijit MAJUMDAR. Measurement of the thickness distribution and optical constants of non-uniform thin films. Measurement Science and Technology. Bristol, England: IOP Publishing, 2011, vol. 22, No 8, p. "nestránkováno", 8 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/0957-0233/22/8/085104.
      More: https://is.muni.cz/publication/966976/en
    7. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges
      BURŠÍKOVÁ, Vilma, Olga BLÁHOVÁ, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Petr KLAPETEK and Jiří BURŠÍK. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges. CHEMICKÉ LISTY. Praha: Česká společnost chemická, 2011, vol. 105, CHLSAC 105, p. 98 - 101. ISSN 0009-2770.
      More: https://is.muni.cz/publication/966868/en
    8. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS and Vratislav PEŘINA. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel. In E-MRS 2011 Spring Meeting. 2011.
      More: https://is.muni.cz/publication/953439/en
    9. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, David NEČAS, Daniel FRANTA and Vilma BURŠÍKOVÁ. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2874-2876. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.069.
      More: https://is.muni.cz/publication/940438/en
    10. Optical characterization of HfO2 thin films
      FRANTA, Daniel, Ivan OHLÍDAL, David NEČAS, František VIŽĎA, Ondřej CAHA, Martin HASOŇ and Pavel POKORNÝ. Optical characterization of HfO2 thin films. Thin Solid Films. Oxford, UK: Elsevier, 2011, vol. 519, No 18, p. 6085–6091. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2011.03.128.
      More: https://is.muni.cz/publication/966962/en
    11. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
      NEČAS, David, Ivan OHLÍDAL and Daniel FRANTA. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. Journal of Optics. Bristol: IOP Publishing, 2011, vol. 13, No 8, p. "nestránkováno", 10 pp. ISSN 2040-8978. Available from: https://dx.doi.org/10.1088/2040-8978/13/8/085705.
      More: https://is.muni.cz/publication/966931/en

    2010

    1. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Christoph COBET. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range. Diamond and Related Materials. Amsterdam: Elsevier, 2010, vol. 19, 2-3, p. 114-122. ISSN 0925-9635.
      More: https://is.muni.cz/publication/895717/en
    2. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD
      STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK and Vilma BURŠÍKOVÁ. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD. In E-MRS 2010 Spring Meeting Book of Abstracts. 2010.
      More: https://is.muni.cz/publication/918551/en
    3. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge
      TRUNEC, David, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Filip STUDNIČKA, Pavel SŤAHEL, Vadym PRYSIAZHNYI, Vratislav PEŘINA, Jana HOUDKOVÁ, Zdeněk NAVRÁTIL and Daniel FRANTA. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge. Journal of Physics D: Applied Physics. Bristol, England: IOP Publishing Ltd., 2010, vol. 43, No 22, p. 225403-225410. ISSN 0022-3727.
      More: https://is.muni.cz/publication/883750/en
    4. Development of transparent protective coatings on polycarbonate substrates using PECVD
      MOCANU, Valentin, Vilma BURŠÍKOVÁ, Adrian STOICA, Vratislav PEŘINA, Daniel FRANTA, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Miloslav OHLÍDAL. Development of transparent protective coatings on polycarbonate substrates using PECVD. In Twelfth International Conference on Plasma Surface Engineering, 2010. 2010.
      More: https://is.muni.cz/publication/918434/en
    5. Diamond-Like Carbon film for protective use on glass and polymer surfaces
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. Diamond-Like Carbon film for protective use on glass and polymer surfaces. In Potential and applications of surface nanotreatment of polymers and glass. 2010.
      More: https://is.muni.cz/publication/930234/en
    6. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS and Vratislav PEŘINA. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates. In Material Science and Engineering. 2010.
      More: https://is.muni.cz/publication/930230/en
    7. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers. In 19th Annual Student Conference - Week of Doctoral Students 2010. 2010.
      More: https://is.muni.cz/publication/930229/en
    8. Multilayered transparent polymer protective coatings using PECVD
      MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ and Daniel FRANTA. Multilayered transparent polymer protective coatings using PECVD. In 11th International Balkan Workshop on Applied Physics, 2010. 2010. ISBN 978-973-614-554-4.
      More: https://is.muni.cz/publication/918526/en
    9. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Olga BLÁHOVÁ and Jiří ŠPERKA. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges. Surface & coatings technology. Elsevier Science, 2010, vol. 204, 12-13, p. 1997–2001. ISSN 0257-8972.
      More: https://is.muni.cz/publication/895715/en
    10. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA and David NEČAS. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS. In 11th International Balkan Workshop on Applied Physics 2010. 2010. ISBN 978-973-614-554-4.
      More: https://is.muni.cz/publication/930176/en
    11. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS
      MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA and David NEČAS. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS. In TANGER Ltd. 2nd International Conference Nanocon 2010. 1st. Olomouc: TANGER Ltd., 2010, p. 434-440. ISBN 978-80-87294-19-2.
      More: https://is.muni.cz/publication/930213/en
    12. Preparation of multifunctional layered materials
      MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ and Daniel FRANTA. Preparation of multifunctional layered materials. In European Materials Research Society. 2010.
      More: https://is.muni.cz/publication/918461/en
    13. Study on the properties of modified amorphous carbon thin films deposited by PECVD.
      STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK and Vilma BURŠÍKOVÁ. Study on the properties of modified amorphous carbon thin films deposited by PECVD. In Twefth International Conference on Plasma Surface Engineering. 2010.
      More: https://is.muni.cz/publication/918569/en

    2009

    1. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS and Vilma BURŠÍKOVÁ. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 384-387. ISSN 0925-9635.
      More: https://is.muni.cz/publication/831301/en
    2. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
      FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL, Martin HRDLIČKA, Martin PAVLIŠTA, Miloslav FRUMAR and Miloslav OHLÍDAL. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2009, vol. 11, No 12, p. 1891-1898. ISSN 1454-4164.
      More: https://is.muni.cz/publication/879780/en
    3. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
      OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA and Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 364-367. ISSN 0925-9635. Available from: https://dx.doi.org/10.1016/j.diamond.2008.09.003.
      More: https://is.muni.cz/publication/808473/en
    4. Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates
      VIZDA, Frantisek, Ivan OHLÍDAL and Vojtech HRUBY. Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates. In Caldas, M. J. ; Studart, N. PHYSICS OF SEMICONDUCTORS. MELVILLE: AMER INST PHYSICS, 2009, p. 19-20. ISBN 978-0-7354-0736-7. Available from: https://dx.doi.org/10.1063/1.3295367.
      More: https://is.muni.cz/publication/1674880/en
    5. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Vilma BURŠÍKOVÁ. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 413–418. ISSN 0925-9635.
      More: https://is.muni.cz/publication/808451/en
    6. Modeling of dielectric response of GexSbyTez (GST) materials
      FRANTA, Daniel, David NEČAS and Miloslav FRUMAR. Modeling of dielectric response of GexSbyTez (GST) materials. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2009, vol. 5, No 5, p. 1324-1327. ISSN 1610-1634.
      More: https://is.muni.cz/publication/879784/en
    7. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
      NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, vol. 7, březen, p. 486-490. ISSN 1348-0391.
      More: https://is.muni.cz/publication/836841/en
    8. Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK and David NEČAS. Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry. In Proceedings of IMEKO XIX World Congress. Lisabon: IMEKO, 2009, p. 100-105. ISBN 978-963-88410-0-1.
      More: https://is.muni.cz/publication/857321/en
    9. Reflectance of non-uniform thin films
      NEČAS, David, Ivan OHLÍDAL and Daniel FRANTA. Reflectance of non-uniform thin films. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2009, vol. 11, No 4, p. 1-9. ISSN 1464-4258.
      More: https://is.muni.cz/publication/824022/en

    2008

    1. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane
      ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Vratislav PEŘINA and Anna MACKOVÁ. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane. In ORGANIC/INORGANIC HYBRID MATERIALS - 2007. WARRENDALE: MATERIALS RESEARCH SOCIETY, 2008, p. 159-164. ISBN 978-1-55899-967-1.
      More: https://is.muni.cz/publication/839392/en
    2. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge
      BURŠÍKOVÁ, Vilma, Vratislav PEŘINA, Jaroslav SOBOTA, Petr KLAPETEK, Pavel DVOŘÁK, Adrian STOICA, Jiří BURŠÍK and Daniel FRANTA. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge. In 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases. 19th ed. Cordoba, Spain: European Physical Society, 2008, 2 pp. ISBN 2-914771-04-5.
      More: https://is.muni.cz/publication/777914/en
    3. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges
      BURSIKOVA, Vilma, Vratislav PERINA, Jaroslav SOBOTA, Jan GROSSMAN, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA, Ivan OHLIDAL, Lenka ZAJICKOVA, Josef HAVEL and Jan JANCA. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
      More: https://is.muni.cz/publication/808478/en
    4. Influence of cross-correlation effects on the optical quantities of rough films
      FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express. elektronicky: Optical Society of America, 2008, vol. 16, No 11, p. 7789–7803. ISSN 1094-4087.
      More: https://is.muni.cz/publication/806290/en
    5. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films
      OHLÍDAL, Ivan and David NEČAS. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. Journal of modern optics. Londýn: Taylor & Francis Ltd., 2008, vol. 55, No 7, p. 1077-1099. ISSN 0950-0340.
      More: https://is.muni.cz/publication/775829/en
    6. Modeling of optical constants of diamond-like carbon
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, David NEČAS and Lenka ZAJÍČKOVÁ. Modeling of optical constants of diamond-like carbon. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 705–708. ISSN 0925-9635.
      More: https://is.muni.cz/publication/806285/en
    7. Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition
      BURSIKOVA, Vilma, Miroslav VALTR, Petr KLAPETEL, Jiri BURSIK, Olga BLAHOVA and Ivan OHLIDAL. Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition. 2008.
      More: https://is.muni.cz/publication/808472/en
    8. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES. In CESPC II Book Of Extended Abstracts. 1st ed. Brno: Masarykova Univerzita, 2008, p. 159-160.
      More: https://is.muni.cz/publication/808173/en
    9. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry
      OHLÍDAL, Ivan, David NEČAS, Vilma BURŠÍKOVÁ, Daniel FRANTA and Miloslav OHLÍDAL. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 709–712. ISSN 0925-9635.
      More: https://is.muni.cz/publication/806287/en
    10. Optical characterization of non-stoichiometric silicon nitride films
      NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL and Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1320-1323. ISSN 1610-1634.
      More: https://is.muni.cz/publication/775835/en
    11. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
      FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL and Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1324-1327. ISSN 1610-1634.
      More: https://is.muni.cz/publication/798278/en
    12. Optical Characterization of Ultrananocrystalline Diamond Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Ondřej JAŠEK, David NEČAS, Petr KLAPETEK and Miroslav VALTR. Optical Characterization of Ultrananocrystalline Diamond Films. Diamond and Related Materials. New York: Elsevier, 2008, vol. 17, No 1, p. 1278–1282. ISSN 0925-9635.
      More: https://is.muni.cz/publication/806283/en
    13. Optical quantities of rough films calculated by Rayleigh-Rice theory
      FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1395–1398. ISSN 1610-1634.
      More: https://is.muni.cz/publication/798388/en
    14. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD
      SOBOTA, Jaroslav, Vilma BURSIKOVA, Jan GROSSMAN, Tomas FORT, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA and Vratislav PERINA. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
      More: https://is.muni.cz/publication/808454/en
    15. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
      OHLÍDAL, Ivan, David NEČAS and Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1399–1402. ISSN 1610-1634.
      More: https://is.muni.cz/publication/798460/en
    16. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. In 2nd Central European Symposium on Plasma Chemistry. 2008.
      More: https://is.muni.cz/publication/813598/en
    17. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, vol. 102, No 16, p. 1529-1532. ISSN 0009-2770.
      More: https://is.muni.cz/publication/798200/en

    2007

    1. Atomic force microscopy studies of cross-sections of columnar films
      KLAPETEK, Petr, Ivan OHLÍDAL and Jiří BURŠÍK. Atomic force microscopy studies of cross-sections of columnar films. Measurement Science and Technology. Bristol, England: IOP Publishing, 2007, vol. 18, No 2, p. 528-531. ISSN 0957-0233.
      More: https://is.muni.cz/publication/748026/en
    2. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Angelique BOUSQUET, Agnes GRANIER, Antoine GOULLET and Jiří BURŠÍK. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges. Plasma processes and polymers. Weinheim: Wiley-VCH, 2007, vol. 4, S1, p. S287-S293, 7 pp. ISSN 1612-8850.
      More: https://is.muni.cz/publication/720151/en
    3. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Pavel SŤAHEL, Miloslav OHLÍDAL and David NEČAS. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films. Diamond and Related Materials. New York: Elsevier, 2007, vol. 16, 4-7, p. 1331–1335. ISSN 0925-9635.
      More: https://is.muni.cz/publication/755055/en
    4. Deposition and analysis of thin films produced in atmospheric pressure glow discharge
      ŠÍRA, Martin, Vilma BURŠÍKOVÁ, Daniel FRANTA and David TRUNEC. Deposition and analysis of thin films produced in atmospheric pressure glow discharge. In Proceedings of XXVIII International Conference on Phenomena in Ionized Gases. Praha: J.Schmidt, M. Šimek, S.Pekárek, V.Prukner, 2007, p. 713-716. ISBN 978-80-87026-01-4.
      More: https://is.muni.cz/publication/724090/en
    5. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings
      BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Jaroslav SOBOTA, Petr KLAPETEK, Olga BLÁHOVÁ and Vratislav PEŘINA. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, vol. 1, No 10, p. 491-495. ISSN 1842-6573.
      More: https://is.muni.cz/publication/747817/en
    6. Deposition of protective coatings in rf organosilicon discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Zuzana KUČEROVÁ, Daniel FRANTA, Pavel DVOŘÁK, Radek ŠMÍD, Vratislav PEŘINA and Anna MACKOVÁ. Deposition of protective coatings in rf organosilicon discharges. Plasma Sources Science and Technology. Bristol: Institute of Physics Publishing, 2007, vol. 16, No 1, p. S123-S132, 10 pp. ISSN 0963-0252.
      More: https://is.muni.cz/publication/720366/en
    7. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films
      ZAJÍČKOVÁ, Lenka, Monika KARÁSKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films. In New Perspectives of Plasma Science and Technology CD. 1st ed. Brno: VUT Brno, 2007, 1 pp.
      More: https://is.muni.cz/publication/747143/en
    8. Models of dielectric response in disordered solids
      FRANTA, Daniel, David NEČAS and Lenka ZAJÍČKOVÁ. Models of dielectric response in disordered solids. Optics Express. elektronicky: Optical Society of America, 2007, vol. 15, No 24, p. 16230-16244. ISSN 1094-4087.
      More: https://is.muni.cz/publication/747634/en
    9. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers
      ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Daniel FRANTA, Vilma BURŠÍKOVÁ, Jiří BURŠÍK, Pavel SŤAHEL and Petr KLAPETEK. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers. In 18th International Symposium on Plasma Chemistry. Kyoto: International Plasma Chemistry Society, 2007, p. 459.
      More: https://is.muni.cz/publication/747827/en
    10. Studium DLC vrstev na plastových substrátech (Study of DLC Coatings Deposited on Plastic Substrates)
      BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Lukáš KELAR, Daniel FRANTA, Petr KLAPETEK and Vratislav PEŘINA. Studium DLC vrstev na plastových substrátech (Study of DLC Coatings Deposited on Plastic Substrates). In VI. ročník konferencie Vrstvy a povlaky 2007. 2007th ed. Rožnov pod Radhoštěm: LISS a.s., 2007, p. 1-4. ISBN 978-80-969310-4-0.
      More: https://is.muni.cz/publication/755431/en
    11. Study of Mechanical Properties of NCD Coatings
      BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Monika KARÁSKOVÁ, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Petr KLAPETEK and Olga BLÁHOVÁ. Study of Mechanical Properties of NCD Coatings. In VI. ročník konferencie Vrstvy a povlaky 2007. 1st ed. Rožnov pod Radhoštěm: Liss a.s., 2007, p. 1-4. ISBN 978-80-969310-4-0.
      More: https://is.muni.cz/publication/755433/en
    12. Study of thickness reduction of a-C:H thin film under UV light irradiation
      VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Václav DUCHOŇ. Study of thickness reduction of a-C:H thin film under UV light irradiation. In Proceedings of ICPIG XXVIII Conference. Prague: Institute of Plasma Physics AS CR, 2007, p. 761-764. ISBN 978-80-87026-01-4.
      More: https://is.muni.cz/publication/722572/en
    13. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Acta Metallurgica Slovaca. Košice, Sloveská republika: Technická univerzita, Košice, 2007, vol. 13, No 6, p. 204-208. ISSN 1335-1532.
      More: https://is.muni.cz/publication/756447/en
    14. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Košice, Sloveská republika: Hutnicka fakulta - Technická univerzita v Košiciach, 2007, 321 pp. 6. ISSN 1335-1532.
      More: https://is.muni.cz/publication/806840/en
    15. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties
      KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ and Petr KLAPETEK. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties. In Abstract Booklet of Inernational Conference NANO 07. 1st ed. Brno: VUT Brno, 2007, p. 59-59. ISBN 978-80-214-3460-8.
      More: https://is.muni.cz/publication/747210/en
    16. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
      VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, vol. 1, No 11, p. 620-624. ISSN 1842-6573.
      More: https://is.muni.cz/publication/746839/en
    17. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou (Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode)
      KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK and Pavel HÁN. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou (Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode). 2007.
      More: https://is.muni.cz/publication/726034/en

    2006

    1. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
      OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids. NORTH-HOLLAND, 2006, vol. 352, 52-54, p. 5633-5641, 8 pp. ISSN 0022-3093.
      More: https://is.muni.cz/publication/712430/en
    2. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
      BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Petr KLAPETEK, Olga BLÁHOVÁ, Vratislav PEŘINA and Vladislav NAVRÁTIL. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1st ed. Constanta, Romania: Ovidius University, 2006, p. 101-102, 1 pp. ISBN 978-80-214-3460-8.
      More: https://is.muni.cz/publication/699216/en
    3. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
      ŠÍRA, Martin, David TRUNEC, Pavel SŤAHEL, Vilma BURŠÍKOVÁ and Daniel FRANTA. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge. Czechoslovak Journal of Physics. Praha: Academia Praha, 2006, vol. 56, B, p. 1377-1382. ISSN 0011-4626.
      More: https://is.muni.cz/publication/707318/en
    4. Deposition of protective couatings in RF organosilicon discharges
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Zuzana KUČEROVÁ, Angelique BOUSQUET, Antoine GOULLET and Agnes GRANIER. Deposition of protective couatings in RF organosilicon discharges. In In Abstracts of Invited Lectures and Contributed Papers, 18th Europhysics Conference on Atomic and Molecular Physics of Ionized Gases. Piacenza, Italy: European Physical Society, 2006, p. 51-54. ISBN 2-914771-38-X.
      More: https://is.muni.cz/publication/708986/en
    5. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge
      TRUNEC, David, Martin ŠÍRA, Pavel SŤAHEL, Vilma BURŠÍKOVÁ and Daniel FRANTA. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge. In 10th International Symposium on High Pressure Low Temperature Plasma Chemistry. Saga, Japan: Saga University, 2006, p. 331-334.
      More: https://is.muni.cz/publication/707510/en
    6. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX (Nanocrystalline diamond films deposition by PECVD in ASTEX type microwave reactor)
      JAŠEK, Ondřej, Monika KARÁSKOVÁ, Vilma BURŠÍKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Zdeněk FRGALA, Jiřina MATĚJKOVÁ, Antonín REK, Petr KLAPETEK and Jiří BURŠÍK. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX (Nanocrystalline diamond films deposition by PECVD in ASTEX type microwave reactor). In Moderní trendy ve fyzice plazmatu a pevných látek II. 1st ed. Brno: Masarykova univerzita, 2006, p. 133-138. ISBN 80-210-4195-1.
      More: https://is.muni.cz/publication/705269/en
    7. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ and Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, vol. 38, No 4, p. 842-846. ISSN 0142-2421.
      More: https://is.muni.cz/publication/711185/en
    8. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
      FRANTA, Daniel and Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, vol. 8, No 9, p. 763-774. ISSN 1464-4258.
      More: https://is.muni.cz/publication/711191/en
    9. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias
      BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Jiří BURŠÍK, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Jiřina MATĚJKOVÁ, Antonín REK, Daniel FRANTA and Petr KLAPETEK. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias. In E-MRS 2006 Fall meeting. 1st ed. Warsaw: EMRS, 2006, p. 14-14. ISBN 83-89-585-09-X.
      More: https://is.muni.cz/publication/699195/en
    10. Mechanické vlastnosti nanokrystalických diamantových vrstev (Mechanical properties of nanocrystaline diamond films)
      BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jiří BURŠÍK, Olga BLÁHOVÁ, Petr KLAPETEK and Jiřina MATĚJKOVÁ. Mechanické vlastnosti nanokrystalických diamantových vrstev (Mechanical properties of nanocrystaline diamond films). In Vrstvy a povlaky 2006. 1st ed. Rožnov pod Radhoštěm: Liss a.s., 2006, p. 1-6. ISBN 80-969310-2-4.
      More: https://is.muni.cz/publication/699236/en
    11. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation
      FRGALA, Zdeněk, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ, Antonin REK, Petr KLAPETEK and Jiří BURŠÍK. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation. Czechoslovak Journal of Physics B. Praha: Institute of Physics, AV ČR, 2006, vol. 56, No 1, p. B1218-B1223, 6 pp. ISSN 0011-4626.
      More: https://is.muni.cz/publication/698650/en
    12. Modeling of DLC Optical Properties Based on Parameterization of Density of States
      FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ and Vilma BURŠÍKOVÁ. Modeling of DLC Optical Properties Based on Parameterization of Density of States. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 39-50.
      More: https://is.muni.cz/publication/708573/en
    13. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Thomas BEGOU, Angelique BOUSQUET, Agnes GRANIER, Bruno BECHE and Antoine GOULLET. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states. In 4th Workshop Ellipsometry. 2006th ed. Berlin: Uwe Beck, 2006, p. 110-111, 1 pp. ISBN 3-00-018751-0.
      More: https://is.muni.cz/publication/710460/en
    14. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
      VALTR, Miroslav, Ivan OHLÍDAL and Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, 56/2006, Suppl. B, p. 1103 - 1109. ISSN 0011-4626.
      More: https://is.muni.cz/publication/694025/en
    15. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
      BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, O. BLÁHOVÁ, V. PEŘINA and P. KLAPETEK. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 311-315.
      More: https://is.muni.cz/publication/708581/en
    16. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
      BURŠÍKOVÁ, Vilma, Nihar Ranjan RAY, O. BLÁHOVÁ, J. JAŠEK, Z. FRGALA, L. ZAJÍČKOVÁ, D. FRANTA, J. BURŠÍK and P. KLAPETEK. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006, p. 27-37.
      More: https://is.muni.cz/publication/708564/en

    2005

    1. AFM Study of Hydrocarbon Thin Films
      VALTR, Miroslav, Ivan OHLÍDAL and Petr KLAPETEK. AFM Study of Hydrocarbon Thin Films. In WDS'05 Proceedings of Contributed Papers: Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha: Matfyzpress, 2005, p. 391-396. ISBN 80-86732-59-2.
      More: https://is.muni.cz/publication/589066/en
    2. Application of the wavelet transformation in AFM data analysis
      KLAPETEK, Petr and Ivan OHLÍDAL. Application of the wavelet transformation in AFM data analysis. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 295-303. ISSN 0323-0465.
      More: https://is.muni.cz/publication/630336/en
    3. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
      KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces. In Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range. Weinheim 2005: Wiley-VCH Verlag GmbH and Co. KGaA, 2005, p. 452-462. ISBN 3-527-40502-X.
      More: https://is.muni.cz/publication/630345/en
    4. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
      KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI and Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 53-57. ISSN 0042-207X.
      More: https://is.muni.cz/publication/630333/en
    5. Combination of optical methods and atomic force microscopy at characterization of thin film systems
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 271-294. ISSN 0323-0465.
      More: https://is.muni.cz/publication/621521/en
    6. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
      FRANTA, Daniel and Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, vol. 248, No 1, p. 459-467. ISSN 0030-4018.
      More: https://is.muni.cz/publication/621520/en
    7. Digital two-wavelength holographic interference microscopy for surface roughness measurement
      OHLÍDAL, Miloslav, L. ŠÍR, M. JÁKL and Ivan OHLÍDAL. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In Proceedings of SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59450I-1-59450I-8, 8 pp. ISBN 0-8194-5958-8.
      More: https://is.muni.cz/publication/630443/en
    8. Ellipsometry in characterization of thin films
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005, p. 81-111. ISBN 80-223-2099-4.
      More: https://is.muni.cz/publication/630449/en
    9. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films
      JAN, Mistrík, Ivan OHLÍDAL, Roman ANTOŠ, Mitsuru AOYAMA and Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 51-54. ISSN 0169-4332.
      More: https://is.muni.cz/publication/630338/en
    10. Characterization of optical thin films exhibiting defects
      FRANTA, Daniel and Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59632H-1-59632H-12, 12 pp. ISBN 0-8194-5981-X.
      More: https://is.muni.cz/publication/621764/en
    11. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating
      BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Pavel DVOŘÁK, Daniel FRANTA, Vratislav PEŘINA and Jan JANČA. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating. In International Conference ELMECO-5, Book of Abstracts. Lublin, Poland: Lublin University of Technology, 2005, p. 18. ISBN 83-89868-23-7.
      More: https://is.muni.cz/publication/575941/en
    12. Influence of technological conditions on mechanical stresses inside diamond-like carbon films
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ, Petr KLAPETEK and Kateřina PÁLENÍKOVÁ. Influence of technological conditions on mechanical stresses inside diamond-like carbon films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, vol. 14, 11-12, p. 1835-1838. ISSN 0925-9635.
      More: https://is.muni.cz/publication/593787/en
    13. Influence of the temperature on properties of plasma polymerised organosilicon coatings
      KUČEROVÁ, Zuzana, Vilma BURŠÍKOVÁ, Vratislav PEŘINA, Daniel FRANTA, Lenka ZAJÍČKOVÁ, Jan ČECH and Jana FRANCLOVÁ. Influence of the temperature on properties of plasma polymerised organosilicon coatings. In 15th Symposium on applications of plasma processes. Bratislava: Univerzita Komenského, 2005, p. 197-198. ISBN 80-223-2018-8.
      More: https://is.muni.cz/publication/568106/en
    14. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody (Measurement of mechanical stress in thin films using combined optical method)
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ and Martin ŠILER. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody (Measurement of mechanical stress in thin films using combined optical method). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, No 3, p. 72-75. ISSN 0447-6441.
      More: https://is.muni.cz/publication/588304/en
    15. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (Measurement of nanoroughness using optical methods and atomic force microscopy)
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (Measurement of nanoroughness using optical methods and atomic force microscopy). In Kvalita a GPS 2005. Brno: Subkomise metrologie při TNK 7, 2005, p. 131-139. ISBN 80-214-3033-8.
      More: https://is.muni.cz/publication/630447/en
    16. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
      ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, vol. 52, No 4, p. 583-602. ISSN 0950-0340.
      More: https://is.muni.cz/publication/605344/en
    17. Optical characterization of non-uniform thin films using imaging spectrophotometry
      OHLÍDAL, Miloslav, Vladimír ČUDEK, Ivan OHLÍDAL and Petr KLAPETEK. Optical characterization of non-uniform thin films using imaging spectrophotometry. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 596329-1-596329-9, 9 pp. ISBN 0-8194-5981-X.
      More: https://is.muni.cz/publication/630337/en
    18. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
      FRANTA, Daniel, Ivan OHLÍDAL, Jan MISTÍK, Tomuo YAMAGUCHI, Gu Jin HU and Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 338-342. ISSN 0169-4332.
      More: https://is.muni.cz/publication/621464/en
    19. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
      FRANTA, Daniel, Ivan OHLÍDAL and David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 159-162. ISSN 0042-207X.
      More: https://is.muni.cz/publication/621749/en
    20. Optical measurement of mechanical stresses in diamond-like carbon films
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ and Petr KLAPETEK. Optical measurement of mechanical stresses in diamond-like carbon films. In 8-th International Symposium on Laser Metrology. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 717-728. ISBN 0-8194-5757-4.
      More: https://is.muni.cz/publication/605326/en
    21. Optical properties of NiO thin films prepared by pulsed laser deposition technique
      FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK and Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 426-430. ISSN 0169-4332.
      More: https://is.muni.cz/publication/621484/en
    22. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
      MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU and Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 431-434. ISSN 0169-4332.
      More: https://is.muni.cz/publication/621519/en
    23. Scanning thermal microscopy - theory and applications
      KLAPETEK, Petr, Ivan OHLÍDAL and Jiří BURŠÍK. Scanning thermal microscopy - theory and applications. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, 11-12, p. 327-329. ISSN 0447-6441.
      More: https://is.muni.cz/publication/630344/en
    24. Spectroscopic ellipsometry of sinusoidal surface-relief gratings
      ANTOŠ, Roman, Ivan OHLÍDAL, Daniel FRANTA, Petr KLAPETEK, Jan MISTÍK, Tomuo YAMAGUCHI and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry of sinusoidal surface-relief gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 221-224. ISSN 0169-4332.
      More: https://is.muni.cz/publication/621445/en
    25. Spectroscopic ellipsometry on lamellar gratings
      ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 225-229. ISSN 0169-4332.
      More: https://is.muni.cz/publication/630341/en
    26. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
      ANTOŠ, Roman, Jaromír PIŠTORA, Ivan OHLÍDAL, Kamil POSTAVA, Jan MISTRÍK, Tomuo YAMAGUCHI and Štefan VIŠŇOVSKÝ. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate. Journal of Applied Physics. USA: American Institute of Physics, 2005, vol. 97, No 5, p. 053107-1-053107-7, 7 pp. ISSN 0021-8979.
      More: https://is.muni.cz/publication/630309/en
    27. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
      FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Lenka ZAJÍČKOVÁ and Pavel SŤAHEL. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, vol. 14, 11-12, p. 1795-1798. ISSN 0925-9635.
      More: https://is.muni.cz/publication/593764/en

    2004

    1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
      KLAPETEK, Petr, Ivan OHLÍDAL and Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, vol. 147, No 3, p. 175-180. ISSN 0026-3672.
      More: https://is.muni.cz/publication/562896/en
    2. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 399-403. ISSN 0040-6090.
      More: https://is.muni.cz/publication/555840/en
    3. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, vol. 36, No 8, p. 1203-1206. ISSN 0142-2421.
      More: https://is.muni.cz/publication/562878/en
    4. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films
      OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, vol. 6, No 1, p. 139-148. ISSN 1454-4164.
      More: https://is.muni.cz/publication/555827/en
    5. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
      KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.
      More: https://is.muni.cz/publication/574146/en
    6. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ and Martin ŠILER. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O. In SPIE's 49th Annual Meeting. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2004, p. 139-147. ISBN 0-8194-5465-6.
      More: https://is.muni.cz/publication/565712/en
    7. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
      FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 393-398. ISSN 0040-6090.
      More: https://is.muni.cz/publication/555829/en
    8. Optical properties of ZnTe films prepared by molecular beam epitaxy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, vol. 468, 1-2, p. 193-202. ISSN 0040-6090.
      More: https://is.muni.cz/publication/562879/en

    2003

    1. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films)
      OHLÍDAL, Ivan, Petr KLAPETEK and Daniel FRANTA. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 97-100. ISSN 0009-0700.
      More: https://is.muni.cz/publication/487577/en
    2. Atomic force microscopy characterization of ZnTe epitaxial films
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.
      More: https://is.muni.cz/publication/489711/en
    3. Atomic force microscopy characterization of ZnTe epitaxial thin films
      KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, vol. 42, 7B, p. 4706-4709, 5 pp. ISSN 0021-4922.
      More: https://is.muni.cz/publication/490021/en
    4. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model
      FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2003, 212-213, No 1, p. 116-121. ISSN 0169-4332.
      More: https://is.muni.cz/publication/487590/en
    5. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Petr KLAPETEK, Vladimír ČUDEK and Miloš JÁKL. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry. Proceedings of SPIE. Bellingham: SPIE, 2003, vol. 5182, No 2, p. 260-271, 11 pp. ISSN 0277-786X.
      More: https://is.muni.cz/publication/493197/en
    6. Mikroskopie magnetické síly: Aplikace při studiu pevných disků (Magnetic Force Microscopy: Application at study of hard disks)
      ŠILER, Martin, Ivan OHLÍDAL and Petr KLAPETEK. Mikroskopie magnetické síly: Aplikace při studiu pevných disků (Magnetic Force Microscopy: Application at study of hard disks). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 124-127. ISSN 0009-0700.
      More: https://is.muni.cz/publication/489945/en
    7. New Dispersion Model of the Optical Constants of the DLC Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 5, p. 373-384. ISSN 0323-0465.
      More: https://is.muni.cz/publication/489710/en
    8. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, Miloš JÁKL, Vladimír ČUDEK and Marek ELIÁŠ. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, vol. 42, 7B, p. 4760-4765, 5 pp. ISSN 0021-4922.
      More: https://is.muni.cz/publication/490025/en
    9. Optical constants of ZnTe and ZnSe epitaxial thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465.
      More: https://is.muni.cz/publication/487588/en
    10. Optical characterization of ZnSe thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003, p. 831-832. ISBN 0-8194-4596-7.
      More: https://is.muni.cz/publication/491338/en
    11. Optical properties of diamond-like carbon films containing SiOx
      FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, vol. 12, No 9, p. 1532-1538. ISSN 0925-9635.
      More: https://is.muni.cz/publication/489708/en
    12. Srovnání snímků NSOM a AFM při studiu vybraných objektů (Comparison of NSOM and AFM images of chosen samples)
      KLAPETEK, Petr and Ivan OHLÍDAL. Srovnání snímků NSOM a AFM při studiu vybraných objektů (Comparison of NSOM and AFM images of chosen samples). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 47, 6-7s, p. 79-81. ISSN 0009-0700.
      More: https://is.muni.cz/publication/488940/en
    13. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
      KLAPETEK, Petr and Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy. Amsterdam: Elsevier, 2003, vol. 94, No 1, p. 19-29. ISSN 0304-3991.
      More: https://is.muni.cz/publication/485221/en

    2002

    1. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA and Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 559-564. ISSN 0142-2421.
      More: https://is.muni.cz/publication/404727/en
    2. Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků (Applications of magnetic force microscopy for studying hard disk storage media)
      ŠILER, Martin, Petr KLAPETEK and Ivan OHLÍDAL. Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků (Applications of magnetic force microscopy for studying hard disk storage media). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 216-219. ISSN 0447-6441.
      More: https://is.muni.cz/publication/404729/en
    3. Applications of atomic force microscopy for thin film boundary measurements
      KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 195-199. ISSN 0447-6441.
      More: https://is.muni.cz/publication/404728/en
    4. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 759-762. ISSN 0142-2421.
      More: https://is.muni.cz/publication/407667/en
    5. Influence of overlayers on determination of the optical constants of ZnSe thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, vol. 92, No 4, p. 1873-1880. ISSN 0021-8979.
      More: https://is.muni.cz/publication/407666/en
    6. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jan JANČA and Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, vol. 11, No 1, p. 105-117. ISSN 0925-9635.
      More: https://is.muni.cz/publication/392491/en
    7. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Daniel FRANTA, Tomáš KRÁLÍK, Miloš JÁKL and Marek ELIÁŠ. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 660-663. ISSN 0142-2421.
      More: https://is.muni.cz/publication/407704/en

    2001

    1. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ and Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2001, vol. 32, No 1, p. 91-94. ISSN 0142-2421.
      More: https://is.muni.cz/publication/367252/en
    2. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
      FRANTA, Daniel and Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001, p. 207-212. ISBN 0-8194-4047-7.
      More: https://is.muni.cz/publication/360731/en
    3. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
      OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, vol. 3, No 4, p. 873-878. ISSN 1454-4164.
      More: https://is.muni.cz/publication/387372/en
    4. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, No 1, p. 285-289. ISSN 0042-207X.
      More: https://is.muni.cz/publication/366094/en
    5. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly (Measurement of Basic Statistical Quantities of Statistical Roughness by Atomic Force Microscopy)
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly (Measurement of Basic Statistical Quantities of Statistical Roughness by Atomic Force Microscopy). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, vol. 51, No 1, p. 16-21. ISSN 0009-0700.
      More: https://is.muni.cz/publication/366173/en
    6. Optical Characterization of Diamond-like Carbon Films
      FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 279-283. ISSN 0042-207X.
      More: https://is.muni.cz/publication/366093/en
    7. Optical characterization of DLC:Si films prepared by PECVD
      FRANTA, Daniel, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical characterization of DLC:Si films prepared by PECVD. In Proceedings of 13th Symposium on Application of Plasma Processes. Bratislava (Slovakia): Dept. of Plasma Physics & Inst. of Physics, Comenius University Bratislava (Slovakia), 2001, p. 87-88. ISBN 80-223-157.
      More: https://is.muni.cz/publication/374773/en
    8. Optical Characterization of Chalcogenide Thin Films
      FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, 175-176, No 1, p. 555-561. ISSN 0169-4332.
      More: https://is.muni.cz/publication/366091/en
    9. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. USA: Optical Society of America, 2001, vol. 40, No 31, p. 5711-5717. ISSN 0003-6935.
      More: https://is.muni.cz/publication/378151/en
    10. Study of Thin Film Defects by Atomic Force Microscopy
      KLAPETEK, Petr, Daniel FRANTA and Ivan OHLÍDAL. Study of Thin Film Defects by Atomic Force Microscopy. In Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. Braunschweig: Physikalisch-Technische Bundesanstalt, 2001, p. 107-117. ISBN 3-89701-840-3.
      More: https://is.muni.cz/publication/401791/en
    11. Vliv diskrétní Fourierovy transformace na zpracování AFM dat (Influence of the Discrete Fourier Transform on the Treatment of AFM Data)
      KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Vliv diskrétní Fourierovy transformace na zpracování AFM dat (Influence of the Discrete Fourier Transform on the Treatment of AFM Data). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, vol. 51, No 1, p. 49-51. ISSN 0009-0700.
      More: https://is.muni.cz/publication/366226/en
    12. XPS and Ellipsometric Study of DLC/Silicon Interface
      ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD and Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 269-273. ISSN 0042-207X.
      More: https://is.muni.cz/publication/366095/en

    2000

    1. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
      FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.
      More: https://is.muni.cz/publication/313891/en
    2. Analysis of thin films by optical multi-sample methods
      FRANTA, Daniel and Ivan OHLÍDAL. Analysis of thin films by optical multi-sample methods. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 411-421. ISSN 0323-0465.
      More: https://is.muni.cz/publication/329671/en
    3. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films
      OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films. In Proceedings of the 4th Seminar on Quantitative Microscopy. Braunschweig: Physikalisch-Technische Bundesanstalt, 2000, p. 124-131. ISBN 3-89701-503-X.
      More: https://is.muni.cz/publication/321011/en
    4. Ellipsometry of Thin Film Systems
      OHLÍDAL, Ivan and Daniel FRANTA. Ellipsometry of Thin Film Systems. In Progress in Optics, Vol. 41 (Ed. E. Wolf). 1st ed. Amsterdam: Elsevier, 2000, p. 181-282. ISBN 0-444-568-7.
      More: https://is.muni.cz/publication/345405/en
    5. Matrix formalism for imperfect thin films
      OHLÍDAL, Ivan and Daniel FRANTA. Matrix formalism for imperfect thin films. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 489-500. ISSN 0323-0465.
      More: https://is.muni.cz/publication/329651/en
    6. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
      FRANTA, Daniel and Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, vol. 30, No 1, p. 574-579. ISSN 0142-2421.
      More: https://is.muni.cz/publication/334911/en
    7. Optical characterization of thin films with randomly rough boundaries using the photovoltage method
      PAVELKA, Radek, Ivan OHLÍDAL, Jan HLÁVKA, Daniel FRANTA and Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films. UK Oxford: Elsevier science, 2000, vol. 366, No 1, p. 43-50. ISSN 0040-6090.
      More: https://is.muni.cz/publication/329691/en

    1999

    1. Comparison of optical and non-optical methods for measuring surface roughness
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA and Miroslav TYKAL. Comparison of optical and non-optical methods for measuring surface roughness. In Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 456-467. ISBN 0-8194-3306-3.
      More: https://is.muni.cz/publication/207571/en
    2. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
      OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK and Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, vol. 28, No 1, p. 240-244. ISSN 0142-2421.
      More: https://is.muni.cz/publication/208731/en
    3. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
      OHLÍDAL, Miloslav, Marek UNČOVSKÝ, Ivan OHLÍDAL and Daniel FRANTA. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, vol. 46, No 2, p. 279-293. ISSN 0950-0340.
      More: https://is.muni.cz/publication/206064/en
    4. Characterisation of DLC Films Prepared by PECVD
      FRANTA, Daniel and Lenka ZAJÍČKOVÁ. Characterisation of DLC Films Prepared by PECVD. In Proceedings of 12th Symposium on Application of Plasma Processes. Bratislava: Comenius University, Bratislava, Slovakia, 1999, p. 158-159. ISBN 80-223-1370-X.
      More: https://is.muni.cz/publication/234131/en
    5. Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky (Measuring the Surface Roughness in Mechanical Engineering by Selected Methods of Coherence Optics)
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miroslav TYKAL, Dominik PRAŽÁK and Marek UNČOVSKÝ. Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky (Measuring the Surface Roughness in Mechanical Engineering by Selected Methods of Coherence Optics). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 44, No 9, p. 259-267. ISSN 0447-6441.
      More: https://is.muni.cz/publication/209133/en
    6. New Ways od Observing Optical Inhomogeneities in Glass
      OHLÍDAL, Miloslav, Josef VRÁNA, Aleš MICHÁLEK, Dominik PRAŽÁK, Miloš JÁKL and Ivan OHLÍDAL. New Ways od Observing Optical Inhomogeneities in Glass. In Proceedings of the 5th ESG Conference: Glass Science and Technology for the 21st Century. Prague, Czech Republic: The Czech Glass Society, 1999, p. 107-111. ISBN 80-238-3861-x.
      More: https://is.muni.cz/publication/209091/en
    7. Optical characterization of multilayer systems with randomly rough boundaries
      OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In 18th Congress of the International Commision for Optics: Optics for the Next Millennium. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 150-151. SPIE Volume 3749. ISBN 0-8194-3234-2.
      More: https://is.muni.cz/publication/207732/en
    8. Optical methods for surface characterization
      OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.
      More: https://is.muni.cz/publication/207572/en
    9. Optical quantities of multilayer systems with correlated randomly rough boundaries
      OHLÍDAL, Ivan and František VIŽĎA. Optical quantities of multilayer systems with correlated randomly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, vol. 46, No 14, p. 2043-2062. ISSN 0950-0340.
      More: https://is.muni.cz/publication/217471/en
    10. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness
      OHLÍDAL, Ivan, Daniel FRANTA, Petr KLAPETEK and Martin VIČAR. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 44, No 10, p. 307-311. ISSN 0447-6441.
      More: https://is.muni.cz/publication/211391/en
    11. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films
      ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ and Daniel FRANTA. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films. Czechoslovak Journal of Physics. Praha, 1999, vol. 49, No 8, p. 1213-1228. ISSN 0011-4626.
      More: https://is.muni.cz/publication/207851/en
    12. Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie (Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry)
      OHLÍDAL, Ivan. Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie (Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, vol. 1999, No 2, p. 53-57. ISSN 0447-6441.
      More: https://is.muni.cz/publication/217531/en

    1998

    1. Analysis of thin films with slightly rough boundaries
      OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER and Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, No 1, p. 177-180. ISSN 0026-3672.
      More: https://is.muni.cz/publication/200406/en
    2. Comparison of AFM and optical methods at measuring nanometric surface roughness
      OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR and Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, p. 123-129. ISBN 3-89701-280-4.
      More: https://is.muni.cz/publication/206012/en
    3. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1998, vol. 45, No 5, p. 903-934. ISSN 0950-0340.
      More: https://is.muni.cz/publication/206016/en
    4. Ellipsometry of thin films
      OHLÍDAL, Ivan and Daniel FRANTA. Ellipsometry of thin films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 1998, vol. 48, No 4, p. 459-468. ISSN 0323-0465.
      More: https://is.muni.cz/publication/200399/en
    5. Optical parameter analysis of thin absorbing films measured by the photovoltage method
      PAVELKA, Radek, Jan HLÁVKA, Ivan OHLÍDAL and Helmut SITTER. Optical parameter analysis of thin absorbing films measured by the photovoltage method. Acta physica polonica A. Jaszowiec, Polsko: Intern.School on Physics of Semicond.Com, 1998, vol. 94, No 3, p. 468-472.
      More: https://is.muni.cz/publication/200286/en
    6. Rubidium Bromide (RbBr)
      OHLÍDAL, Ivan and Miloslav OHLÍDAL. Rubidium Bromide (RbBr). In Handbook of Optical Constants of Solids III. San Diego: Academic Press, 1998, p. 845-855. ISBN 0-12-544423-0.
      More: https://is.muni.cz/publication/197820/en
    7. Rubidium lodide (RbI)
      OHLÍDAL, Ivan and Daniel FRANTA. Rubidium lodide (RbI). In Handbook of Optical Constants of Solids III. San Diego, USA: Academic Press, 1998, p. 857-870. ISBN 0-12-544423-0.
      More: https://is.muni.cz/publication/197819/en
    8. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou (Comparing the results of measuring surface the roughness which have been achieved by optical methods and by profilometric method)
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Miroslav TYKAL, Dominik PRAŽÁK and Aleš MICHÁLEK. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou (Comparing the results of measuring surface the roughness which have been achieved by optical methods and by profilometric method). Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1998, vol. 43, No 4, p. 130-136. ISSN 0447-6441.
      More: https://is.muni.cz/publication/200581/en
    9. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, vol. 147, No 1, p. 349-358. ISSN 0030-4018.
      More: https://is.muni.cz/publication/206015/en

    1997

    1. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
      OHLÍDAL, Ivan, Daniel FRANTA, Bohuslav REZEK and Miloslav OHLÍDAL. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy. In ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1997, p. 1051-1054. ISBN 0-471-97827-2.
      More: https://is.muni.cz/publication/197818/en
    2. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1997, vol. 42, No 3, p. 76-79. ISSN 0447-6441.
      More: https://is.muni.cz/publication/197822/en

    1996

    1. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces
      OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA and Aleš MICHÁLEK. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces. In Specification, Production, and Testing of Optical Components and Systems. USA: SPIE - The International Society for Optical Engineering, 1996, p. 442-451. ISBN 0-8194-2160-X.
      More: https://is.muni.cz/publication/197821/en
    2. New Technique of Measurement of Optical Parameters of thin Films
      HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films. Oxford, UK: Elsevier science, 1996, vol. 279, p. 209-212. ISSN 0040-6090.
      More: https://is.muni.cz/publication/197459/en
    3. Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses
      ZAJÍČKOVÁ, Lenka, Ivan OHLÍDAL and Jan JANČA. Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses. Thin Solid Films. UK Oxford: Elsevier science, 1996, vol. 1996, No 280, p. 26-36. ISSN 0040-6090.
      More: https://is.muni.cz/publication/197508/en
    4. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers
      OHLÍDAL, Ivan, Daniel FRANTA and Jaroslav HORA. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers. In ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1996, p. 823-826. ISBN 0-471-95899-9.
      More: https://is.muni.cz/publication/197476/en
    5. Spektroskopická elipsometrie slabě drsných povrchů (Spectroscopic Ellipsometry of Slightly Rough Surfaces)
      FRANTA, Daniel, Ivan OHLÍDAL, Jaroslav HORA and Karel NAVRÁTIL. Spektroskopická elipsometrie slabě drsných povrchů (Spectroscopic Ellipsometry of Slightly Rough Surfaces). In 12. konference českých a slovenských fyziků. Ostrava: Fyzikální vědecká sekce Jednoty českých matematiků a fyziků, 1996, p. 482-485.
      More: https://is.muni.cz/publication/484630/en

    1995

    1. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER and Daniel FRANTA. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids. Pure Appl. Opt. UK: Publishing Ltd, 1995, vol. 4, No 5, p. 599-616. ISSN 0963-9659.
      More: https://is.muni.cz/publication/197252/en
    2. Interferometry of Randomly Rough Surfaces
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER and Daniel FRANTA. Interferometry of Randomly Rough Surfaces. In Photonics '95. Czech Republic: European Optical Society, 1995, p. 109-111.
      More: https://is.muni.cz/publication/206281/en
    3. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries
      OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries. Optical Engineering. 1995, vol. 34, No 6, p. 1761-1768. ISSN 0091-3286.
      More: https://is.muni.cz/publication/849999/en
    4. Scattering of Light from Multilayer Systems with Rough Boundaries
      OHLÍDAL, Ivan, Karel NAVRÁTIL and Miloslav OHLÍDAL. Scattering of Light from Multilayer Systems with Rough Boundaries. In Progress in Optics, Vol. 34 (Ed. E. Wolf). Amsterdam: Elsevier, 1995, p. 249-331. ISBN 0 444 82140 6.
      More: https://is.muni.cz/publication/197253/en

    1994

    1. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry. Applied Optics. USA: Optical Society of America, 1994, 33(1994), No 34, p. 7838-7945. ISSN 0003-6935.
      More: https://is.muni.cz/publication/197045/en
    2. Optical characterization of single and double layers with correlated randomly rough boundaries
      OHLÍDAL, Ivan and František VIŽĎA. Optical characterization of single and double layers with correlated randomly rough boundaries. In Optical Interference Coatings. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1994, p. 1143-1151. SPIE Proceedings Series, Volume 2253. ISBN 0-8194-1562-6.
      More: https://is.muni.cz/publication/197046/en

    1993

    1. Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries
      OHLÍDAL, Ivan. Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries. J. Opt. Soc. Am. A. USA: Optical Society of America, 1993, 10(1993), No 1, p. 158-171. ISSN 0740-3233.
      More: https://is.muni.cz/publication/196783/en
    2. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference)
      MUSILOVÁ, Jana and Ivan OHLÍDAL. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference). J. Phys. D: Appl. Phys. 1993, 25(1992), No 1, p. 1131-1138. ISSN 0022-3727.
      More: https://is.muni.cz/publication/196781/en
    3. The diffuse x-ray scattering in real periodical superlatices
      HOLÝ, Václav, Josef KUBĚNA and Ivan OHLÍDAL. The diffuse x-ray scattering in real periodical superlatices. Superlattices and Microstructures. 1993, vol. 12, No 1, p. 25-35. ISSN 0749-6036.
      More: https://is.muni.cz/publication/196768/en
    4. X-ray reflection from rough layered systems
      HOLÝ, Václav, Josef KUBĚNA and Ivan OHLÍDAL. X-ray reflection from rough layered systems. Phys. Rev. B. 1993, vol. 47, No 23, p. 15896-16798. ISSN 0163-1829.
      More: https://is.muni.cz/publication/196766/en

    1991

    1. Sodium Fluoride (NaF)
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Sodium Fluoride (NaF). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991, p. 1021-1034. ISBN 0-12-544422-2.
      More: https://is.muni.cz/publication/378243/en
    2. Thorium Fluoride (ThF4)
      OHLÍDAL, Ivan and Karel NAVRÁTIL. Thorium Fluoride (ThF4). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991, p. 1049-1058. ISBN 0-12-544422-2.
      More: https://is.muni.cz/publication/378244/en
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