Vyhledávání publikací

Vybrané publikace/výsledky

X-ray reflection from rough layered systems (1993)
The diffuse x-ray scattering in real periodical superlatices (1993)
Influence of defects of thin films on determining their thickness by the method based on white light interference (1993)
Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries (1993)
Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry (1994)
Optical characterization of single and double layers with correlated randomly rough boundaries (1994)
A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids (1995)
Scattering of Light from Multilayer Systems with Rough Boundaries (1995)
New Technique of Measurement of Optical Parameters of thin Films (1996)
Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers (1996)
Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses (1996)
Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy (1997)
Rubidium lodide (RbI) (1998)
Rubidium Bromide (RbBr) (1998)
Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces (1996)
Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry (1997)
Optical parameter analysis of thin absorbing films measured by the photovoltage method (1998)
Ellipsometry of thin films (1998)
Analysis of thin films with slightly rough boundaries (1998)
Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou (1998)
Comparison of AFM and optical methods at measuring nanometric surface roughness (1998)
Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries (1998)
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries (1998)
Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering (1999)
Interferometry of Randomly Rough Surfaces (1995)
Comparison of optical and non-optical methods for measuring surface roughness (1999)
Optical methods for surface characterization (1999)
Optical characterization of multilayer systems with randomly rough boundaries (1999)
The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films (1999)
Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy (1999)
New Ways od Observing Optical Inhomogeneities in Glass (1999)
Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky (1999)
Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness (1999)
Optical quantities of multilayer systems with correlated randomly rough boundaries (1999)
Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie (1999)
Characterisation of DLC Films Prepared by PECVD (1999)
Analysis of Slightly Rough Thin Films by Optical Methods and AFM (2000)
Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films (2000)
Matrix formalism for imperfect thin films (2000)
Analysis of thin films by optical multi-sample methods (2000)
Optical characterization of thin films with randomly rough boundaries using the photovoltage method (2000)
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry (2000)
Ellipsometry of Thin Film Systems (2000)
Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation (2001)
Optical Characterization of Chalcogenide Thin Films (2001)
Optical Characterization of Diamond-like Carbon Films (2001)
Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances (2001)
XPS and Ellipsometric Study of DLC/Silicon Interface (2001)
Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly (2001)
Vliv diskrétní Fourierovy transformace na zpracování AFM dat (2001)
Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy (2001)
Optical characterization of DLC:Si films prepared by PECVD (2001)
Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances (2001)
Sodium Fluoride (NaF) (1991)
Thorium Fluoride (ThF4) (1991)
Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method (2001)
Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry (2002)
Study of Thin Film Defects by Atomic Force Microscopy (2001)
Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method (2002)
Applications of atomic force microscopy for thin film boundary measurements (2002)
Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků (2002)
Influence of overlayers on determination of the optical constants of ZnSe thin films (2002)
Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods (2002)
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method (2002)
Spektroskopická elipsometrie slabě drsných povrchů (1996)
Theoretical analysis of the atomic force microscopy characterization of columnar thin films (2003)
Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (2003)
Optical constants of ZnTe and ZnSe epitaxial thin films (2003)
Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model (2003)
Srovnání snímků NSOM a AFM při studiu vybraných objektů (2003)
Optical properties of diamond-like carbon films containing SiOx (2003)
New Dispersion Model of the Optical Constants of the DLC Films (2003)
Atomic force microscopy characterization of ZnTe epitaxial films (2003)
Mikroskopie magnetické síly: Aplikace při studiu pevných disků (2003)
Atomic force microscopy characterization of ZnTe epitaxial thin films (2003)
New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters (2003)
Optical characterization of ZnSe thin films (2003)
Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry (2003)
Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films (2004)
Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry (2004)
Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry (2004)
Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy (2004)
Optical properties of ZnTe films prepared by molecular beam epitaxy (2004)
Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation (2004)
Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O (2004)
Influence of the temperature on properties of plasma polymerised organosilicon coatings (2005)
Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces (2004)
Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating (2005)
Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody (2005)
AFM Study of Hydrocarbon Thin Films (2005)
Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films (2005)
Influence of technological conditions on mechanical stresses inside diamond-like carbon films (2005)
Optical measurement of mechanical stresses in diamond-like carbon films (2005)
Optical characterization of double layers containing epitaxial ZnSe and ZnTe films (2005)
Spectroscopic ellipsometry of sinusoidal surface-relief gratings (2005)
Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions (2005)
Optical properties of NiO thin films prepared by pulsed laser deposition technique (2005)
Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry (2005)
Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces (2005)
Combination of optical methods and atomic force microscopy at characterization of thin film systems (2005)
Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry (2005)
Characterization of optical thin films exhibiting defects (2005)
Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate (2005)
Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD (2005)
Application of the wavelet transformation in AFM data analysis (2005)
Optical characterization of non-uniform thin films using imaging spectrophotometry (2005)
Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films (2005)
Spectroscopic ellipsometry on lamellar gratings (2005)
Scanning thermal microscopy - theory and applications (2005)
Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces (2005)
Digital two-wavelength holographic interference microscopy for surface roughness measurement (2005)
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (2005)
Ellipsometry in characterization of thin films (2005)
Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry (2006)
Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation (2006)
Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias (2006)
Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings (2006)
Mechanické vlastnosti nanokrystalických diamantových vrstev (2006)
Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX (2006)
Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge (2006)
Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge (2006)
Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques (2006)
Modeling of DLC Optical Properties Based on Parameterization of Density of States (2006)
Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition (2006)
Deposition of protective couatings in RF organosilicon discharges (2006)
Modeling of optical constants of organosilicon thin films by parameterization of denstity of states (2006)
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy (2006)
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces (2006)
Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films (2006)
Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges (2007)
Deposition of protective coatings in rf organosilicon discharges (2007)
Study of thickness reduction of a-C:H thin film under UV light irradiation (2007)
Deposition and analysis of thin films produced in atmospheric pressure glow discharge (2007)
Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou (2007)
UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction (2007)
Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films (2007)
Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties (2007)
Models of dielectric response in disordered solids (2007)
Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings (2007)
Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers (2007)
Atomic force microscopy studies of cross-sections of columnar films (2007)
Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films (2007)
Studium DLC vrstev na plastových substrátech (2007)
Study of Mechanical Properties of NCD Coatings (2007)
Studying an influence of a nucleation phase on nanocrystalline diamond film properties (2007)
Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films (2008)
Optical characterization of non-stoichiometric silicon nitride films (2008)
Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge (2008)
Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge (2008)
Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films (2008)
Optical quantities of rough films calculated by Rayleigh-Rice theory (2008)
Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies (2008)
Optical Characterization of Ultrananocrystalline Diamond Films (2008)
Modeling of optical constants of diamond-like carbon (2008)
Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry (2008)
Influence of cross-correlation effects on the optical quantities of rough films (2008)
Studying an influence of a nucleation phase on nanocrystalline diamond film properties (2007)
NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES (2008)
Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states (2009)
Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD (2008)
Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition (2008)
Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry (2009)
Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges (2008)
Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge (2008)
Reflectance of non-uniform thin films (2009)
Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films (2009)
Optical Characterization of Ultra-Thin Iron and Iron Oxide Films (2009)
Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane (2008)
Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries (1995)
Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry (2009)
Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films (2009)
Modeling of dielectric response of GexSbyTez (GST) materials (2009)
Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge (2010)
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges (2010)
Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range (2010)
Development of transparent protective coatings on polycarbonate substrates using PECVD (2010)
Preparation of multifunctional layered materials (2010)
Multilayered transparent polymer protective coatings using PECVD (2010)
Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD (2010)
Study on the properties of modified amorphous carbon thin films deposited by PECVD. (2010)
OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS (2010)
PREPARATION AND CHARACTERIZATION OF DLC:N FILMS (2010)
Effect of Nitrogen Incorporation on Optical Properties of DLC Layers (2010)
Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates (2010)
Diamond-Like Carbon film for protective use on glass and polymer surfaces (2010)
Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films (2011)
Anisotropy-enhanced depolarization on transparent film/substrate system (2011)
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry (2011)
Ellipsometric characterisation of thin films non-uniform in thickness (2011)
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture (2011)
Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel (2011)
INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC (2011)
Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges (2011)
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films (2011)
Optical characterization of HfO2 thin films (2011)
Measurement of the thickness distribution and optical constants of non-uniform thin films (2011)
MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD (2012)
Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode (2012)
Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films (2013)
Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models (2013)
Application of sum rule to the dispersion model of hydrogenated amorphous silicon (2013)
Advanced modeling for optical characterization of amorphous hydrogenated silicon films (2013)
Consolidated series for efficient calculation of the reflection and transmission in rough multilayers (2014)
Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces (2014)
Dispersion model of two-phonon absorption: application to c-Si (2014)
Broadening of dielectric response and sum rule conservation (2014)
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen (2014)
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films (2014)
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry (2014)
Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (2014)
Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm (2014)
Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (2014)
Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45° (2014)
Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (2014)
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia (2015)
Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm (2015)
Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6° (2015)
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry (2015)
Optická charakterizace povrchů skel SML3103/3/15 (2015)
Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry (2016)
Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range (2016)
Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers (2017)
Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range (2016)
Dispersion model for optical thin films applicable in wide spectral range (2015)
Wide spectral range characterization of antireflective coatings and their optimization (2015)
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry (2015)
Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films (2015)
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry (2017)
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness (2017)
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride (2017)
Temperature-dependent dispersion model of float zone crystalline silicon (2017)
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model (2017)
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory (2017)
Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution (2017)
Amorphous gallium oxide grown by low-temperature PECVD (2018)
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory (2018)
Ellipsometry of Layered Systems (2018)
Optical Characterization of Thin Films Exhibiting Defects (2018)
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range (2018)
Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization (2018)
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers (2018)
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region (2018)
Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence (2018)
Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory (2019)
Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects (2019)
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers (2019)
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films (2019)
Temperature dependent dispersion models applicable in solid state physics (2019)
Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model (2019)
Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions (2019)
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model (2019)
Optical properties of the crystalline silicon wafers described using the universal dispersion model (2019)
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers (2020)
Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates (2009)
Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions (2020)
A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas (2020)
Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge (2020)
Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (2020)
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials (2020)
Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry (2020)
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films (2020)
Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization (2021)
Constitutive equations describing optical activity in theory of dispersion (2021)
On the transition of reaction pathway during microwave plasma gas-phase synthesis of graphene nanosheets: From amorphous to highly crystalline structure (2021)
Higher harmonic frequencies in a capacitively coupled plasma (2021)
Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model (2021)
Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy (2021)
Optical characterization of inhomogeneous thin films with randomly rough boundaries (2022)
Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies (2022)
Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm. (2020)
Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45. (2021)
Soubor dělicích vrstev ve specifikaci s parametry prvního děliče Rp = 50 % ± 3 % @248 nm; druhého děliče Rp = <0,4; 0,75> a Rs < 1 % na vlnové délce 248 nm a zvýšenou propustností v oblasti od 630 nm do 670 nm. (2022)
Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates (2023)
Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model (2023)
Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data (2023)
Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory (2023)
Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems (2023)
Dispersion models exhibiting natural optical activity: application to tartaric acid solutions (2023)
FV0343AR – optický prvek s AR pokrytím pro λ = 343 nm, R < 0,2 %, AOI = 0° - 5°, LIDT fluence > 0,3 J/cm2 pro pulsy 900 fs (2023)
Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition (2024)
Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model (2024)
Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model (2025)
Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory (2024)
Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries (2024)

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