PřF:F7840 Electron microscopy of solids - Course Information

F7840 Electron microscopy and its applications in materials research

Extent and Intensity

2/0/0. 3 credit(s). Type of Completion: k (colloquium).

Teacher(s)

RNDr. Jiří Buršík, DSc. (lecturer)
RNDr. Alena Orlová, CSc. (lecturer), prof. RNDr. Josef Humlíček, CSc. (deputy)

Guaranteed by

prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: RNDr. Alena Orlová, CSc.

Timetable

Fri 11:00–12:50 FUA

Course Enrolment Limitations

The course is also offered to the students of the fields other than those the course is directly associated with.

fields of study / plans the course is directly associated with

• Physics (programme PřF, M-FY)
• Physics (programme PřF, N-FY)

Course objectives

Interaction of electrons with solids, types of electron microscopes. Imaging in a transmission electron microscope (TEM), specimens for the microscopy. Electron diffraction (scattering on an atom and a lattice, point diffraction pattern, Ewald construction, deviation from the exact reflection condition). TEM diffraction contrast (extinction contours, contrast of crystal defects). Kinematical and dynamical theory of contrast. Kikuchi lines. Practical tasks of electron diffraction and TEM. Application of stereology. High resolution electron microscopy HVEM (ideal imaging, influence of the real microscope, thin phase object, transmission function). Microdiffraction, CBED. Scanning electron microscopy (SEM), X-ray microanalysis.

Language of instruction

Czech

Further comments (probably available only in Czech)

The course can also be completed outside the examination period.
The course is taught once in two years.
General note: S.

• Enrolment Statistics (Autumn 2004, recent)
  
• Permalink: https://is.muni.cz/course/sci/autumn2004/F7840