PřF:F6530 Spectroscopy techniques - Course Information
F6530 Spectroscopy techniques
Faculty of ScienceAutumn 2014
- Extent and Intensity
- 2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: z (credit).
- Teacher(s)
- doc. Mgr. Adam Dubroka, Ph.D. (lecturer)
doc. Mgr. Adam Dubroka, Ph.D. (seminar tutor) - Guaranteed by
- prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Adam Dubroka, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science - Timetable
- Mon 14:00–15:50 F1 6/1014
- Timetable of Seminar Groups:
- Prerequisites (in Czech)
- F3060 Oscillations, waves, optics || F3100 Oscillations, waves, optics
- Course Enrolment Limitations
- The course is offered to students of any study field.
- Course objectives
- The main objective of the course is to explain to students the construction of spectroscopic systems, principles of measurements and basics of data analysis. The main focus is on optical spectroscopy from infrared to ultraviolet range, the lecture includes the X-ray spectroscopy and nuclear magnetic resonance as well.
- Syllabus
- Spectroscopic units and conversions
Sources of radiation: broadband, calibration, lasers
Detectors: photomultiplier, photoconducting, CCD, photon counting. Lock in amplifier.
Optical components: lenses, mirrors (spherical, parabolic, toroidal, elliptical), optical fibers, polarizers, retarders, filters
Dispersion spectrometers (prism, grating), construction, resolution
Fourier spectrometer
Propagation of electromagnetic wave in medium and the incidence on boundary, Lorentz oscillator
Techniques of optical spectroscopy:
Transmission (Beer-Lambert law, vibration in IR
Reflection (normals, phonons, Kramers-Kronig relations)
basics of data analysis
ellipsometry (principle, configuration PSA, PSCA, sensitivity, surface roughness, determination of thickness and optical constants of a layer on substrate, multiangle ellipsometry, inversion problem)
IR microscopy (objectives, single element and focal plane array)
grazing incidence spectroscopy (TO, LO frequency, Berreman effect)
Attenuate total reflection - ATR, surface plasma resonance
Specromicroscopy: far field, near field techniques (with aperture and apertureless)
Luminescence
Time resolved spectroscopy, pump-probe spectroscopy, THz time domain spectroscopy
Profiles of spectral lines (Lorentz, asymmetric Lorentz, Gauss, Gauss-Lorentz) Raman spectroscopy
Group theory, symmetry and vibration
X-ray spectroscopy 1: X-ray sources, monochromatisation, index of refraction, absorption, imaging
X-ray spectroscopy 2: fluorescence spectroscopy, X-ray detectors, photoemission spectroscopy, X-ray absorption spectroscopy, fine structure of absorption edge
Nuclear magnetic resonance
Excursion to laboratories
- Spectroscopic units and conversions
- Literature
- KUZMANY, Hans. Solid-state spectroscopy : an introduction. Berlin: Springer-Verlag, 1998, xv, 450. ISBN 3540639136. info
- Teaching methods
- lecture, seminary
- Assessment methods
- active attendance at the seminars
- Language of instruction
- Czech
- Further Comments
- Study Materials
The course is taught annually.
- Enrolment Statistics (Autumn 2014, recent)
- Permalink: https://is.muni.cz/course/sci/autumn2014/F6530