F7030 X-ray scattering from thin layers

Faculty of Science
Autumn 2022
Extent and Intensity
2/0/0. 1 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
doc. Mgr. Ondřej Caha, Ph.D. (lecturer)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Ondřej Caha, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Prerequisites
A basic knowledge of solid state physics and optics
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The goal of this course is to allow the students to
- list and describe basic properties of x-ray diffraction and x-ray reflection at thin films
- apply the knowledge to a study of defects in semiconductor heterostructures and their interfaces
Learning outcomes
Student will be able to: - select optimal experimental conditions for a given structural analysis - evaluate experimental data
Syllabus
  • 1. Basic description of an x-ray wavefield: x-ray wave in vacuum; the Green function of a free particle, its plane-wave representation; Wave scattering, scattering cross-section; Directions of the scattered waves; Classification of the scattering theories.
  • 2. Kinematical scattering from ideal structures: scattering from an atom; scattering from a small crystal; scattering from a thin layer, x-ray diffraction, x-ray reflection; Absorption and refraction corrections.
  • 3. Kinematical x-ray diffraction from disturbed thin layers: Homogeneous deformation, pseudomorph and relaxed structures; periodic superlattices; random deformation, coherent and incoherent scattering scattering from lateral structures.
  • 4. Dynamical scattering theory: Wave equation for a crystal; dispersion surface; boundary conditions at the crystal surface; one-wave approximation, x-ray reflection; two-waves approximation, x-ray diffraction; non-coplanar arrangement.
  • 5. X-ray reflection from rough interfaces: statistical description of the roughness; fractal roughness; self- assembled structures; coherent and diffuse scattering from rough interfaces.
  • 6. Experimental aspects: x-ray sources; x-ray monochromators, diffractometers; resolution function in reciprocal space; x-ray detectors.
Literature
  • HOLÝ, Václav, U. PIETSCH and T. BAUMBACH. High-resolution x-ray scattering from thin films and multilayers. Germany Berlin: High-resolution x-ray scattering from thin films and multilayers, 1998, 256 pp. Springer Tracts in Modern Physics. ISBN 3-540-62029-X. info
Teaching methods
lectures with class discussion
Assessment methods
colloquium
Language of instruction
Czech
Further Comments
The course can also be completed outside the examination period.
The course is taught annually.
The course is taught: every week.
The course is also listed under the following terms Autumn 2007 - for the purpose of the accreditation, Autumn 2010 - only for the accreditation, Autumn 2000, Autumn 2001, Autumn 2002, Autumn 2003, Autumn 2004, Autumn 2005, Autumn 2006, Autumn 2007, Autumn 2008, Autumn 2009, Autumn 2010, Autumn 2011, Autumn 2011 - acreditation, spring 2012 - acreditation, Autumn 2012, Autumn 2013, Autumn 2014, Autumn 2015, Autumn 2016, autumn 2017, Autumn 2018, Autumn 2019, Autumn 2020, autumn 2021, Autumn 2023, Autumn 2024.
  • Enrolment Statistics (Autumn 2022, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2022/F7030