F6380 X-ray diffraction methods

Faculty of Science
Spring 2005
Extent and Intensity
0/2/0. 2 credit(s). Type of Completion: z (credit).
Teacher(s)
doc. RNDr. Josef Kuběna, CSc. (seminar tutor)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Josef Kuběna, CSc.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The experimental works in X-ray laboratory: 1. Experimental study of the properties double crystal set in (+,+) and (+,-) arrangement. 2. Determinations of the thin layer thicknies from X-ray reflectivity. 3. Determinations of the multilayer period by measurement X-ray reflectivity 4. Diffuse X-ray scattering measurement by position sensitive detector. 5. Study of the properties of X-ray monochromator realised by X-ray mirros.
Language of instruction
Czech
Further Comments
The course is taught once in two years.
The course is taught every week.
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010.
  • Enrolment Statistics (Spring 2005, recent)
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