F8572 Experimental methods and special laboratory B 2

Faculty of Science
Spring 2011
Extent and Intensity
2/4/0. 8 credit(s) (plus extra credits for completion). Type of Completion: graded credit.
Teacher(s)
prof. RNDr. Josef Humlíček, CSc. (lecturer)
RNDr. Luděk Bočánek, CSc. (seminar tutor)
doc. Mgr. Ondřej Caha, Ph.D. (seminar tutor)
Mgr. Dušan Hemzal, Ph.D. (seminar tutor)
doc. Mgr. Jiří Chaloupka, Ph.D. (seminar tutor)
doc. RNDr. Petr Mikulík, Ph.D. (seminar tutor)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: RNDr. Luděk Bočánek, CSc.
Timetable
Wed 8:00–9:50 Kontaktujte učitele, Thu 8:00–11:50 Fpk,04013
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The course offers laboratory excercises on advanced experimental techniques in solid state physics with the emphasis on semiconductors.
During the course the students will acquire necessary theoretical background of the selected experimental techniques, perform the experiments in the laboratories, and analyze and physically interpret the experimental data obtained.

Using individually carried out laboratory excersizes, the main objective of the course is to provide the students with the ability to
- list and describe the theoretical background of the selected experimental techniques
- apply the advanced experimental techniques in solid state physics
- process the measured data and analyze physically the obtained results.
Syllabus
  • Current - voltage characteristics of p-n junctions 1
  • Drift mobility of carriers
  • Electric conductivity, Hall coefficient and magnetoresistance of semiconductor
  • Recombination of excess carriers in semiconductor, lifetime of carriers
  • Temperature dependence of mobility
  • Thermoelectric force in semiconductor
  • Infrared vibrations in SiO2
  • Current - voltage characteristics of p-n junctions 2
  • Determination of refractive index and thickness of thin layer from reflection spectra
  • Raman spectra of GaAs
  • Technology of preparation of resistor and capacitor on silicon wafer
  • Analysis of powder diffraction spectra
Literature
  • HLÁVKA, Jan and Luděk BOČÁNEK. Praktikum z fyziky pevných látek. Vyd. 1. Praha: Státní pedagogické nakladatelství, 1990, 103 s. ISBN 8021001127. info
Teaching methods
individual laboratory practice
Assessment methods
Graded credit based after eleven laboratory reports approved and graded by the respective teachers.
Language of instruction
Czech
Further Comments
Study Materials
The course is taught annually.
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2005, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010, Spring 2012, spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, Spring 2017, spring 2018, Spring 2019, Spring 2020, Spring 2021, Spring 2022, Spring 2023, Spring 2024, Spring 2025.
  • Enrolment Statistics (Spring 2011, recent)
  • Permalink: https://is.muni.cz/course/sci/spring2011/F8572