Passing the study plan

A – Exam in physical optics. During the exam, the applicant must demonstrate an understanding of the physical principles of electron and light optics, namely the physical foundations of the theories and of the application methods as well as components of optical devices. The exam proves that the student has mastered the theoretical skills needed for profession as a physicist. To prepare for the exam, students need to overview several broad ranges of questions covering physical principles of optics of electromagnetic radiation, particle optics, physics of sources and detectors, physical principles of imaging methods. The exam is oral.

B – Microscopy test. During the exam, the candidate must demonstrate an understanding of electron and light microscopy methods, their physical nature and practical applications for instrument research and development, as well as the principles of related devices and their components. The exam proves that the student has mastered the practical skills and basic knowledge required for physicists in research and production, which are necessary for the development of microscopic techniques or as an application specialist in the future profession. The exam is oral.

C – Thesis defense. During the defense, the student demonstrates an understanding of the chosen issue, the ability to report on the the obtained results and argue in a discussion.

The student prepares properly in the field of theoretical and practical teaching, pays attention to the understanding of experimental methods and their correct processing and analysis of data obtained during practical teaching.

Proposals for the topics of future diploma theses will be similar to topics that have been recently defended in the area of interest of this degree program, for example:

– Structure determination of proteins with flexible domains using cryo-electron microscopy
– Characterization of Flavivir neutralization by antibodies using cryo-electron microscopy
– Implementation of advanced methods for correcting the movement of the specimen in the electron microscope
– Fabrication and characterization of a thin film electron biprism
– Thermally assisted photoemission at 405 nm
– Study of hydrogel structure using cryo-SEM
- Development and characterization of carrier films for quantitative imaging in scanning transmission electron microscopy