F7840 Transmission electron microscopy

Faculty of Science
Spring 2025
Extent and Intensity
2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
Ing. Ivo Kuběna, Ph.D. (lecturer)
RNDr. Naděžda Pizúrová, Ph.D. (lecturer)
Mgr. Jiří Nováček, Ph.D. (lecturer)
Guaranteed by
doc. RNDr. Petr Mikulík, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Timetable
Mon 17. 2. to Sat 24. 5. Mon 9:00–10:50 Kontaktujte učitele
Prerequisites
Basic knowledge of scanning electron microscopy including its practical use, e.g. by passing F7850 Selected chapters of electron microscopy and by practical works on SEM instruments.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Studenti will get familiar with principles of transmission electron microscopy and its applications in material and life sciences. The theory of image formation and diffraction in electron miscopes will be discussed. Analytical methods and news in electron microscopy will be discussed as well. The lectures will be correlated with practical work in the Microscopy practical works II.
Learning outcomes
After successful passing of the course the students will be able to:
- describe principles and physics of TEM,
- know about TEM applications in material and life sciences,
- describe sample preparation for TEM.
Syllabus
  • Interaction of electrons with matter. Types of transmission electron microscopes and their working modes. Sample preparation for TEM. Theory of electron diffraction (scattering of electrons, electron diffraction on crystal and amorphous objects, point and circular diffractogram, Bragg equation, Ewald construction). Kinematical and dynamical theory of contrast formation. Kikuchi lines. Practical tasks of TEM. High-resolution electron microscopy (HREM). Simulation of image formation in HREM. Advanced methods of electron diffraction: microdiffraction, diffraction in convergent beam (CBED). Modern trends and methods. Analytical electron microscopy.
Teaching methods
lectures, may be accompanied by practical demonstrations
Assessment methods
Final discussion or individual tasks (colloquium)
Language of instruction
Czech
Further Comments
Study Materials
The course can also be completed outside the examination period.
The course is taught annually.
The course is also listed under the following terms Autumn 1999, Autumn 2010 - only for the accreditation, Autumn 2001, Autumn 2003, Autumn 2004, Autumn 2006, Autumn 2008, Autumn 2010, Autumn 2011 - acreditation, Autumn 2012, Autumn 2014, Autumn 2016, Autumn 2018, Autumn 2019, Autumn 2020, Autumn 2022.
  • Enrolment Statistics (recent)
  • Permalink: https://is.muni.cz/course/sci/spring2025/F7840