PřF NMICP Microscopy
Name in Czech: Mikroskopie
master's full-time single-subject, language of instruction: Czech
Included in the programme: PřF N-MIC Microscopy
master's full-time single-subject, language of instruction: Czech
Included in the programme: PřF N-MIC Microscopy
Semester 1
Code | Name | Type of Completion | Credits | Profile Cat. | Requirement |
PřF:Bi1700 | Cell Biology | zk | 2+2 | - | PV |
PřF:C9530 | Structure of biomacromolecules | zk | 2+2 | P | P |
PřF:F5330 | Basic numerical methods | z | 3 | - | PV |
PřF:F7800 | Theory and construction of optical systems | zk | 3+2 | Z | P |
PřF:F7810 | Microscopy lab I | z | 3 | P | P |
PřF:F7811 | Electron optics and Microscopy 1 | zk | 3+2 | Z | P |
PřF:F7815 | Practise in microscopy I | k | 4 | P | P |
PřF:F7850 | Selected topics in electron microscopy | k | 2+1 | Z | P |
31 credits |
Semester 2
Code | Name | Type of Completion | Credits | Profile Cat. | Requirement |
PřF:C3002 | Nanobiotechnology | zk | 2+2 | - | PV |
PřF:F4160 | Vacuum physics | zk | 2+2 | - | PV |
PřF:F5090 | Electronics | zk | 2+2 | - | PV |
PřF:F5900 | Physics in business | z | 2 | - | PV |
PřF:F7360 | Characterization of Surfaces and Thin Films | k | 2+1 | - | PV |
PřF:F7840 | Transmission electron microscopy | k | 2+1 | Z | P |
PřF:F8370 | Present-day methods in physical modelling | k | 3+1 | - | PV |
PřF:F8810 | Microscopy lab II | z | 6 | P | P |
PřF:F8811 | Electron optics and Microscopy 2 | zk | 3+2 | P | P |
PřF:F8815 | Practise in microscopy II | k | 8 | P | P |
PřF:F8850 | Diploma thesis I | z | 5 | - | - |
48 credits |
Semester 3
Code | Name | Type of Completion | Credits | Profile Cat. | Requirement |
PřF:C9940 | 3-Dimensional Transmission Electron Microscopy (3DEM) | zk | 2+2 | P | P |
PřF:F6530 | Spectroscopy techniques | k | 3+1 | - | PV |
PřF:F6540 | Basics of semiconductor technology | k | 3+1 | - | PV |
PřF:F7320 | Atomic force microscopy and other methods of scanning probe microscopy | k | 2+1 | - | V |
PřF:F7560 | Simulation using Monte Carlo method | z | 2 | - | PV |
PřF:F9810 | Microscopy lab III | z | 6 | P | P |
PřF:F9850 | Diploma thesis II | z | 10 | - | - |
PřF:F9851 | Seminary for Diploma thesis II | z | 1 | - | P |
PřF:FB820 | Structural electron microscopy | zk | 2+2 | - | PV |
FI:PB130 | Introduction to Digital Image Processing | zk | 3+2 | P | P |
43 credits |
Semester 4
Any semester
Code | Name | Type of Completion | Credits | Profile Cat. | Requirement |
PřF:JA002 | Advanced Examination in English for Specific Purposes - Science | zk | 2 | - | PV |
PřF:JF002 | Advanced Examination in French for Specific Purposes - Science | zk | 2 | - | PV |
PřF:JN002 | Advanced Examination in German for Specific Purposes - Science | zk | 2 | - | PV |
PřF:JS002 | Advanced Examination in Spanish for Specific Purposes - Science | zk | 2 | - | PV |
8 credits |