F8811 Electron optics and Microscopy 2

Faculty of Science
Spring 2025
Extent and Intensity
2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: zk (examination).
Teacher(s)
Mgr. Tomáš Radlička, Ph.D. (lecturer)
Mgr. Jan Stopka, Ph.D. (lecturer)
Guaranteed by
prof. Mgr. Tomáš Tyc, Ph.D.
Department of Theoretical Physics and Astrophysics – Physics Section – Faculty of Science
Contact Person: Mgr. Tomáš Radlička, Ph.D.
Supplier department: Department of Theoretical Physics and Astrophysics – Physics Section – Faculty of Science
Prerequisites
F7811
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The student gets to know in detail the construction of electron microscopes and the microscopical imaging methods. We will focus on scanning electron microscopes, transmission electron microscopes, and energy loss spectrometers.
Learning outcomes
After completing the course, the student will be able to: Quantitatively describe imaging in a scanning and transmission electron microscope Understand the information that can be obtained from the sample using imaging methods and know the limits of using individual electron microscopes He will understand image formation in scanning and transmission electron microscopes Quantitatively describe the principle of the energy loss spectrometer
Syllabus
  • Electron sources that are used in electron microscopes Scanning electron microscope: condenser system, objective lens, resolution, energy filtering, interaction of electrons with the sample Transmission electron microscope: condenser system, objective lens, imaging system, imaging mode, diffraction mode, scanning mode. Principle of image formation in transmission electron microscopes: TEM, STEM, 4D STEM Energy filters and energy loss spectrometers.
Literature
  • REIMER, Ludwig and Helmut KOHL. Transmission electron microscopy : physics of image formation. Fifth edition. New York: Springer, 2008, xvi, 587. ISBN 9780387400938. info
  • REIMER, Ludwig. Scanning electron microscopy : physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998, xiv, 527. ISBN 3540639764. info
  • HAWKES, Peter W and Erwin KASPER. Principles of Electron Optics: Applied Geometrical Optics. Academic Press, 1989. ISBN 0123333520. info
Teaching methods
Lecture and seminar
Assessment methods
oral exam
Language of instruction
Czech
Further Comments
The course can also be completed outside the examination period.
The course is taught annually.
The course is taught: every week.
  • Enrolment Statistics (recent)
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