PřF:F7030 X-ray scatt. from thin layers - Course Information
F7030 X-ray scattering from thin layers
Faculty of ScienceAutumn 2006
- Extent and Intensity
- 2/0/0. 1 credit(s). Type of Completion: k (colloquium).
- Teacher(s)
- prof. RNDr. Václav Holý, CSc. (lecturer)
- Guaranteed by
- prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: prof. RNDr. Václav Holý, CSc. - Timetable
- Mon 13:00–14:50 Kontaktujte učitele
- Prerequisites
- A good knowledge of solid state physics and optics is necessary
- Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Course objectives
- The subject of the course is x-ray diffraction and small-angle scattering from thin layers, as well as its application for the investigation of real structure of semiconductor heterostructures and their interfaces
- Syllabus
- 1. Basic description of an x-ray wavefield x-ray wave in vacuum the Green function of a free particle, its plane-wave representation Wave scattering, scattering cross-section Directions of the scattered waves Classification of the scattering theories 2. Kinematical scattering from ideal structures scattering from an atom scattering from a small crystal scattering from a thin layer, x-ray diffraction, x-ray reflection Absorption and refraction corrections 3. Kinematical x-ray diffraction from disturbed thin layers Homogeneous deformation, pseudomorph and relaxed structures periodic superlattices random deformation, coherent and incoherent scattering scattering from lateral structures 4. Dynamical scattering theory Wave equation for a crystal dispersion surface boundary conditions at the crystal surface one-wave approximation , x-ray reflection two-waves approximation, x-ray diffraction non-coplanar arrangement 5. X-ray reflection from rough interfaces statistical description of the roughness fractal roughness self- assembled structures coherent and diffuse scattering from rough interfaces 6. Experimental aspects x-ray sources x-ray monochromators, diffractometers resolution function in reciprocal space x-ray detectors
- Literature
- HOLÝ, Václav, U. PIETSCH and T. BAUMBACH. High-resolution x-ray scattering from thin films and multilayers. Germany Berlin: High-resolution x-ray scattering from thin films and multilayers, 1998, 256 pp. Springer Tracts in Modern Physics. ISBN 3-540-62029-X. info
- Assessment methods (in Czech)
- přednáška ukončená kolokviem
- Language of instruction
- Czech
- Further Comments
- The course can also be completed outside the examination period.
The course is taught annually.
- Enrolment Statistics (Autumn 2006, recent)
- Permalink: https://is.muni.cz/course/sci/autumn2006/F7030