F6390 Solid state physics laboratory

Faculty of Science
spring 2018
Extent and Intensity
0/3/0. 5 credit(s) (plus extra credits for completion). Type of Completion: z (credit).
Teacher(s)
RNDr. Luděk Bočánek, CSc. (seminar tutor)
doc. Mgr. Ondřej Caha, Ph.D. (seminar tutor)
doc. RNDr. Jan Celý, CSc. (seminar tutor)
doc. RNDr. Petr Mikulík, Ph.D. (seminar tutor)
Mgr. Jiří Novák, Ph.D. (seminar tutor)
Mgr. Mojmír Meduňa, Ph.D. (alternate examiner)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Ondřej Caha, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Timetable
Thu 13:00–15:50 Fpk,04013
Prerequisites (in Czech)
F2180 Physical laboratory 1 && F3240 Physical laboratory 2 && F4210 Physical laboratory 3
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
The course introduces the students into basic experimental methods in solid state physics (texts for individual tasks are on the lecture web site). Mainly methods of x-ray diffraction and reflection, optical reflectometry and ellipsometry, electron microscopy, Hall effect and work in clean rooms are studied.
Learning outcomes
The main objective of the course is to provide the students with the ability to
- list and describe selected fundamental experimental techniques in condensed matter physics
- individually apply these techniques during measurement of important solid state quantities.
Syllabus
  • List of tasks:
    A. Analysis of thin metallic layer: thickness measurement by x-ray reflectometry, Hall effect, optical response by ellipsometry.
    B. Analysis of powder sample: crystalline structure using x-ray diffraction and chemical composition using x-ray fluorescence.
    C. Analysis of silicon oxide layer: ellipsometry and optical reflectivity.
    D. Analysis of silicon sample: optical reflectivity and orientation of monocrystal using x-ray diffraction
    E. Surface studies using SEM.
    F. Temperature dependence of superconductor electrical conductivity.
    G. Microelectronics in a clean room and principles of photolithography.
Literature
  • ASHCROFT, Neil W. and N. David MERMIN. Solid state physics. South Melbourne: Brooks/Cole, 1976, xxi, 826 s. ISBN 0-03-083993-9. info
  • KITTEL, Charles. Úvod do fyziky pevných látek. 1. vyd. Praha: Academia, 1985, 598 s. URL info
Teaching methods
Laboratory practice
Assessment methods
Course attendance is mandatory. Student has to present 7 tested protocols. Overall classification is determined by the grades of individual protocols. Oral testing of protocols is by the agreement with the lecturer of appropriate task.
Language of instruction
Czech
Further comments (probably available only in Czech)
Study Materials
The course is taught annually.
Teacher's information
http://www.physics.muni.cz/kfpf/Vyuka/
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2011 - only for the accreditation, Spring 2000, Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010, Spring 2011, Spring 2012, spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, Spring 2017, Spring 2019, Spring 2020, Spring 2021, Spring 2022, Spring 2023, Spring 2024, Spring 2025.
  • Enrolment Statistics (spring 2018, recent)
  • Permalink: https://is.muni.cz/course/sci/spring2018/F6390