PřF:F6390 Solid state physics laboratory - Course Information
F6390 Solid state physics laboratory
Faculty of ScienceSpring 2002
- Extent and Intensity
- 0/3/0. 5 credit(s). Type of Completion: graded credit.
- Teacher(s)
- RNDr. Luděk Bočánek, CSc. (seminar tutor)
prof. RNDr. Václav Holý, CSc. (seminar tutor)
RNDr. Pavel Konečný, CSc. (seminar tutor)
Mgr. Mojmír Meduňa, Ph.D. (seminar tutor)
RNDr. Alois Nebojsa (seminar tutor)
doc. Mgr. Lenka Zajíčková, Ph.D. (seminar tutor) - Guaranteed by
- prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics – Physics Section – Faculty of Science - Timetable of Seminar Groups
- F6390/01: No timetable has been entered into IS. L. Bočánek, V. Holý, P. Konečný, M. Meduňa, A. Nebojsa, L. Zajíčková
F6390/02: No timetable has been entered into IS. L. Bočánek, V. Holý, P. Konečný, M. Meduňa, A. Nebojsa, L. Zajíčková - Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Course objectives
- The Laue method of the determination of crystallografic orientation. Powder diffractography of a cubic material.Precise determination of the lattice parameter of a polycrystalline sample by the ratio method. Semi-focusation method. Investigation of the emission and absorption spectrum. Determination of parameters of thin films. Mass spectroscopy of gases. Methods for determinimg of some mechanical properties of solids. The Hall effect in a metal and semiconductor. Work with a tunnelling microscope.
- Syllabus
- 1.The Laue method of the determination of crystallographic orientation. 1A. Test exposure. 1B. Check exposure. 2. Powder diffractography of a cubic material. 3. Precise determination of the lattice parameter of a polycrystalline sample by the ratio method. 4. Semi-focusation method. 5. Investigation of an emission and absorption spectrum. 6. Work with a tunnelling microscope. 7. Determination of the refractive index and the thickness of a thin layer by the ellipsometer. 8. Mass spectroscopy of gases. 9. The Hall effect in a metal and semiconductor.
- Literature
- Písemné návody k jednotlivým úlohám obdrží studenti na začáthu semestru.
- KITTEL, Charles. Úvod do fyziky pevných látek. 1. vyd. Praha: Academia, 1985, 598 s. URL info
- DEKKER, Adrianus J. Fyzika pevných látek. Translated by Martin Černohorský. Praha: Academia, nakladatelství Československé akademie věd, 1966, 543 s. info
- Language of instruction
- Czech
- Further comments (probably available only in Czech)
- The course is taught annually.
- Enrolment Statistics (Spring 2002, recent)
- Permalink: https://is.muni.cz/course/sci/spring2002/F6390